Atomic force microscopy, scanning tunneling microscopy: Proceedings of the First US Army Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM,STM) Symposium,held June 8 - 10, 1993, in Natick, Massachusetts
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Bibliographic Details
Corporate Author: Atomic Force Microscopy, Scanning Tunneling Microscopy Symposium Natick, Mass (Author)
Other Authors: Cohen, Samuel H. (Editor)
Format: Conference Proceeding Book
Language:English
Published: New York [u.a.] Plenum Press 1994
Series:Atomic force microscopy, scanning tunneling microscopy [1]
Subjects:
Physical Description:X, 453 S. Ill., graph. Darst.
ISBN:0306448904

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