Proceedings of the 21st International Conference on Defects in Semiconductors: ICDS-21; held in Giessen, Germany, 16 - 20 July 2001
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Bibliographic Details
Corporate Author: International Conference on Defects in Semiconductors Gießen (Author)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] Elsevier 2001
Series:Physica / B 308/310
Subjects:
Item Description:Einzelaufnahme eines Zeitschr.-Bd.
Physical Description:XXIX, 1241 S. Ill., graph. Darst.

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