Analysis of sampled imaging systems:

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Vollmerhausen, Richard H. (VerfasserIn), Driggers, Ronald G. (VerfasserIn)
Format: Buch
Sprache:English
Veröffentlicht: Bellingham, Wash. SPIE Press 2000
Schriftenreihe:Tutorial texts in optical engineering 39
Schlagworte:
Zusammenfassung:Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.
Beschreibung:XV, 176 S. Ill., graph. Darst.
ISBN:0819434892