Microelectronics reliability:
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Bibliographic Details
Format: Electronic Journal
Language:English
Published: Amsterdam [u.a.] Elsevier 1962-
Oxford [u.a.] Pergamon Press
Subjects:
Online Access:Volltext
Volltext
Published:1.1962 -
Item Description:Gesehen am 16.05.2023
Physical Description:Online-Ressource
ISSN:0026-2714
0367-0902