Goodhew, P. J., Humphreys, J. F., & Beanland, R. (2001). Electron microscopy and analysis (3. ed.). Taylor & Francis.
Chicago Style (17th ed.) CitationGoodhew, Peter J., John F. Humphreys, and Richard Beanland. Electron Microscopy and Analysis. 3. ed. London [u.a.]: Taylor & Francis, 2001.
MLA (9th ed.) CitationGoodhew, Peter J., et al. Electron Microscopy and Analysis. 3. ed. Taylor & Francis, 2001.
Warning: These citations may not always be 100% accurate.