Ordered III-V semiconductors: electro-optical characterization & device applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English German |
| Veröffentlicht: |
Erlangen
Lehrstuhl für Mikrocharakterisierung
2000
|
| Schriftenreihe: | Physik mikrostrukturierter Halbleiter
18 |
| Schlagworte: | |
| Beschreibung: | Zugl.: Erlangen-Nürnberg, Univ., Diss., 2000. - Enth. Zsfassung in dt. Sprache |
| Beschreibung: | II, 182 S. Ill., graph. Darst. |
| ISBN: | 3932392264 |
Internformat
MARC
| LEADER | 00000nam a22000008cb4500 | ||
|---|---|---|---|
| 001 | BV013411428 | ||
| 003 | DE-604 | ||
| 005 | 20010914 | ||
| 007 | t | ||
| 008 | 001024s2000 gw ad|| m||| 00||| eng d | ||
| 016 | 7 | |a 959954856 |2 DE-101 | |
| 020 | |a 3932392264 |9 3-932392-26-4 | ||
| 035 | |a (OCoLC)50206978 | ||
| 035 | |a (DE-599)BVBBV013411428 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng |a ger | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-703 |a DE-29 |a DE-29T |a DE-12 |a DE-91 | ||
| 084 | |a UP 3050 |0 (DE-625)146370: |2 rvk | ||
| 084 | |a PHY 693d |2 stub | ||
| 084 | |a PHY 772d |2 stub | ||
| 084 | |a PHY 393d |2 stub | ||
| 100 | 1 | |a Kippenberg, Thomas |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Ordered III-V semiconductors |b electro-optical characterization & device applications |c Thomas Kippenberg |
| 264 | 1 | |a Erlangen |b Lehrstuhl für Mikrocharakterisierung |c 2000 | |
| 300 | |a II, 182 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Physik mikrostrukturierter Halbleiter |v 18 | |
| 500 | |a Zugl.: Erlangen-Nürnberg, Univ., Diss., 2000. - Enth. Zsfassung in dt. Sprache | ||
| 650 | 0 | 7 | |a MOCVD-Verfahren |0 (DE-588)4314628-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Drei-Fünf-Halbleiter |0 (DE-588)4150649-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optische Anisotropie |0 (DE-588)4375511-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optisches Bauelement |0 (DE-588)4172681-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektroabsorption |0 (DE-588)4381348-3 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Drei-Fünf-Halbleiter |0 (DE-588)4150649-2 |D s |
| 689 | 0 | 1 | |a MOCVD-Verfahren |0 (DE-588)4314628-4 |D s |
| 689 | 0 | 2 | |a Elektroabsorption |0 (DE-588)4381348-3 |D s |
| 689 | 0 | 3 | |a Optische Anisotropie |0 (DE-588)4375511-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Drei-Fünf-Halbleiter |0 (DE-588)4150649-2 |D s |
| 689 | 1 | 1 | |a Optische Anisotropie |0 (DE-588)4375511-2 |D s |
| 689 | 1 | 2 | |a Optisches Bauelement |0 (DE-588)4172681-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 830 | 0 | |a Physik mikrostrukturierter Halbleiter |v 18 |w (DE-604)BV011600531 |9 18 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-009152136 | ||
Datensatz im Suchindex
| _version_ | 1804128198772916224 |
|---|---|
| any_adam_object | |
| author | Kippenberg, Thomas |
| author_facet | Kippenberg, Thomas |
| author_role | aut |
| author_sort | Kippenberg, Thomas |
| author_variant | t k tk |
| building | Verbundindex |
| bvnumber | BV013411428 |
| classification_rvk | UP 3050 |
| classification_tum | PHY 693d PHY 772d PHY 393d |
| ctrlnum | (OCoLC)50206978 (DE-599)BVBBV013411428 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02123nam a22005418cb4500</leader><controlfield tag="001">BV013411428</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010914 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">001024s2000 gw ad|| m||| 00||| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">959954856</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3932392264</subfield><subfield code="9">3-932392-26-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)50206978</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013411428</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield><subfield code="a">ger</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3050</subfield><subfield code="0">(DE-625)146370:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 693d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 772d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 393d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kippenberg, Thomas</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Ordered III-V semiconductors</subfield><subfield code="b">electro-optical characterization & device applications</subfield><subfield code="c">Thomas Kippenberg</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Erlangen</subfield><subfield code="b">Lehrstuhl für Mikrocharakterisierung</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">II, 182 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Physik mikrostrukturierter Halbleiter</subfield><subfield code="v">18</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Zugl.: Erlangen-Nürnberg, Univ., Diss., 2000. - Enth. Zsfassung in dt. Sprache</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">MOCVD-Verfahren</subfield><subfield code="0">(DE-588)4314628-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Drei-Fünf-Halbleiter</subfield><subfield code="0">(DE-588)4150649-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Anisotropie</subfield><subfield code="0">(DE-588)4375511-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optisches Bauelement</subfield><subfield code="0">(DE-588)4172681-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektroabsorption</subfield><subfield code="0">(DE-588)4381348-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Drei-Fünf-Halbleiter</subfield><subfield code="0">(DE-588)4150649-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">MOCVD-Verfahren</subfield><subfield code="0">(DE-588)4314628-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Elektroabsorption</subfield><subfield code="0">(DE-588)4381348-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Optische Anisotropie</subfield><subfield code="0">(DE-588)4375511-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Drei-Fünf-Halbleiter</subfield><subfield code="0">(DE-588)4150649-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Optische Anisotropie</subfield><subfield code="0">(DE-588)4375511-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Optisches Bauelement</subfield><subfield code="0">(DE-588)4172681-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Physik mikrostrukturierter Halbleiter</subfield><subfield code="v">18</subfield><subfield code="w">(DE-604)BV011600531</subfield><subfield code="9">18</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-009152136</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV013411428 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:45:26Z |
| institution | BVB |
| isbn | 3932392264 |
| language | English German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009152136 |
| oclc_num | 50206978 |
| open_access_boolean | |
| owner | DE-703 DE-29 DE-29T DE-12 DE-91 DE-BY-TUM |
| owner_facet | DE-703 DE-29 DE-29T DE-12 DE-91 DE-BY-TUM |
| physical | II, 182 S. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Lehrstuhl für Mikrocharakterisierung |
| record_format | marc |
| series | Physik mikrostrukturierter Halbleiter |
| series2 | Physik mikrostrukturierter Halbleiter |
| spelling | Kippenberg, Thomas Verfasser aut Ordered III-V semiconductors electro-optical characterization & device applications Thomas Kippenberg Erlangen Lehrstuhl für Mikrocharakterisierung 2000 II, 182 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Physik mikrostrukturierter Halbleiter 18 Zugl.: Erlangen-Nürnberg, Univ., Diss., 2000. - Enth. Zsfassung in dt. Sprache MOCVD-Verfahren (DE-588)4314628-4 gnd rswk-swf Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd rswk-swf Optische Anisotropie (DE-588)4375511-2 gnd rswk-swf Optisches Bauelement (DE-588)4172681-9 gnd rswk-swf Elektroabsorption (DE-588)4381348-3 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Drei-Fünf-Halbleiter (DE-588)4150649-2 s MOCVD-Verfahren (DE-588)4314628-4 s Elektroabsorption (DE-588)4381348-3 s Optische Anisotropie (DE-588)4375511-2 s DE-604 Optisches Bauelement (DE-588)4172681-9 s Physik mikrostrukturierter Halbleiter 18 (DE-604)BV011600531 18 |
| spellingShingle | Kippenberg, Thomas Ordered III-V semiconductors electro-optical characterization & device applications Physik mikrostrukturierter Halbleiter MOCVD-Verfahren (DE-588)4314628-4 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd Optische Anisotropie (DE-588)4375511-2 gnd Optisches Bauelement (DE-588)4172681-9 gnd Elektroabsorption (DE-588)4381348-3 gnd |
| subject_GND | (DE-588)4314628-4 (DE-588)4150649-2 (DE-588)4375511-2 (DE-588)4172681-9 (DE-588)4381348-3 (DE-588)4113937-9 |
| title | Ordered III-V semiconductors electro-optical characterization & device applications |
| title_auth | Ordered III-V semiconductors electro-optical characterization & device applications |
| title_exact_search | Ordered III-V semiconductors electro-optical characterization & device applications |
| title_full | Ordered III-V semiconductors electro-optical characterization & device applications Thomas Kippenberg |
| title_fullStr | Ordered III-V semiconductors electro-optical characterization & device applications Thomas Kippenberg |
| title_full_unstemmed | Ordered III-V semiconductors electro-optical characterization & device applications Thomas Kippenberg |
| title_short | Ordered III-V semiconductors |
| title_sort | ordered iii v semiconductors electro optical characterization device applications |
| title_sub | electro-optical characterization & device applications |
| topic | MOCVD-Verfahren (DE-588)4314628-4 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd Optische Anisotropie (DE-588)4375511-2 gnd Optisches Bauelement (DE-588)4172681-9 gnd Elektroabsorption (DE-588)4381348-3 gnd |
| topic_facet | MOCVD-Verfahren Drei-Fünf-Halbleiter Optische Anisotropie Optisches Bauelement Elektroabsorption Hochschulschrift |
| volume_link | (DE-604)BV011600531 |
| work_keys_str_mv | AT kippenbergthomas orderediiivsemiconductorselectroopticalcharacterizationdeviceapplications |