Holdings: Progress in transmission electron microscopy

Progress in transmission electron microscopy: 1 Concepts and techniques

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Bibliographic Details
Other Authors:	Zhang, Xiao-Feng 1963- (Editor)
Format:	Book
Language:	English
Published:	Berlin [u.a.] Springer 2001 [Beijing] Tsinghua Univ. Press 2001
Series:	Springer series in surface sciences 38
Subjects:	Microscopie électronique en transmission - Technologie Transmission electron microscopy Transmission electron microscopy > Technique
Online Access:	Inhaltsverzeichnis
Physical Description:	XVI, 365 S. Ill., graph. Darst.
ISBN:	3540676805

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adam_text	XIAO-FENG ZHANG ZE ZHANG (EDS.) PROGRESS IN TRANSMISSION ELECTRON MICROSCOPY 1 CONCEPTS AND TECHNIQUES WITH 169 FIGURES AND 13 TABLES SPRINGER CONTENTS 1 THE MODERN MICROSCOPE TODAY.... 1 1.1 INTRODUCTION 1 1.2 MICROSCOPE DEVELOPMENT 1 1.3 THE MODERN MICROSCOPE 2 1.3.1 INTRODUCTION 3 1.3.2 ELECTRON OPTICS: LENSES 5 1.3.3 ELECTRON OPTICS: MICROSCOPE 10 1.3.4 VACUUM SYSTEM 17 1.3.5 IMAGE ACQUISITION 21 1.3.6 ENERGY FILTERING 27 1.4 MICROSCOPES IN THE FUTURE 30 1.4.1 MONOCHROMATORS: IMPROVING THE ENERGY SPREAD 31 1.4.2 C S CORRECTORS: IMPROVING THE SPHERICAL ABERRATION COEFFICIENT 32 1.4.3 COMPUTER CONTROL: AUTOMATED AND REMOTE OPERATION 32 REFERENCES 34 2 THE QUEST FOR ULTRA-HIGH RESOLUTION 35 2.1 INTRODUCTION 35 2.2 IMAGING CONCEPTS 39 2.3 TEM, STEM AND DIFFRACTION MODES 47 2.3.1 TEM MODE 47 2.3.2 STEM MODE 48 2.3.3 DIFFRACTION MODES 52 2.4 THE USE OF ULTRA-HIGH VOLTAGES 53 2.5 THE CORRECTION OF ABERRATIONS 55 2.6 ELECTRON HOLOGRAPHY 58 2.6.1 IN-LINE STEM AND TEM ELECTRON HOLOGRAPHY 58 2.6.2 OFF-AXIS ELECTRON HOLOGRAPHY 62 2.7 COMBINATIONS OF ELECTRON DIFFRACTION AND IMAGING: PTYCHOGRAPHY 65 2.8 ATOMIC FOCUSERS 69 2.9 DISCUSSION 74 REFERENCES 77 VIII 3 Z-CONTRAST IMAGING IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE 81 3.1 INTRODUCTION 81 3.2 PRINCIPLES OF THE METHOD 84 3.2.1 FORMATION OF AN INCOHERENT IMAGE 84 3.2.2 PROBE FORMATION 86 3.2.3 INCOHERENT SCATTERING 89 3.2.4 DYNAMICAL DIFFRACTION 92 3.3 ADVANTAGES OF Z-CONTRAST IMAGING 96 3.3.1 IMPROVED RESOLUTION 96 3.3.2 DIRECTLY INTERPRETABLE IMAGE 99 3.3.3 HIGH COMPOSITIONAL SENSITIVITY 100 3.3.4 SIMULTANEOUS CONVENTIONAL HREM IMAGE 103 3.3.5 ATOMIC RESOLUTION SPECTROSCOPY 105 3.4 PROBLEMS 107 APPENDIX: INCOHERENT IMAGING OF WEAKLY SCATTERING OBJECTS 108 REFERENCES 109 4 INELASTIC SCATTERING IN ELECTRON MICROSCOPY-EFFECTS, SPECTROMETRY AND IMAGING 113 4.1 INELASTIC EXCITATION PROCESSES IN ELECTRON SCATTERING 113 4.2 PHONON SCATTERING 117 4.3 EFFECTS OF INELASTIC EXCITATIONS ON ELASTIC WAVE 119 4.3.1 THE DEBYE-WALLER FACTOR 119 4.3.2 THE ABSORPTION POTENTIAL 120 4.4 SIGNAL FROM THERMAL DIFFUSE SCATTERING 120 4.4.1 FORMATION OF Z-CONTRAST IMAGING 120 4.4.2 THE FROZEN LATTICE MODEL FOR PHONON SCATTERING 122 4.4.3 EFFECTS ON ELECTRON HOLOGRAPHY 124 4.4.4 EFFECT ON ATOMIC-RESOLUTION LATTICE IMAGING 127 4.5 SIGNAL FROM PLASMON EXCITATION 130 4.5.1 VOLUME PLASMON EXCITATION 131 4.5.2 SURFACE EXCITATION IN NANOPARTICLES 132 4.6 ATOMIC INNER SHELL EXCITATION 134 4.6.1 COMPOSITION MICROANALYSIS 134 4.6.2 NEAR EDGE FINE STRUCTURE AND BONDING IN CRYSTALS 135 4.6.3 WHITE LINES AND THE OCCUPATION NUMBER OF THE D-BAND ELECTRONS 136 4.6.4 QUANTIFYING OXYGEN DEFICIENCY IN OXIDES 139 4.7 ENERGY FILTERED ELECTRON IMAGING 140 4.7.1 COMPOSITION-SENSITIVE IMAGING USING VALENCE-LOSS ELECTRONS 142 IX 4.7.2 COMPOSITION-SENSITIVE IMAGING USING INNER-SHELL - LONIZATION EDGES 144 4.7.3 MAPPING THE BONDING AND VALENCE STATE USING FINE EDGE STRUCTURES 146 4.8 DYNAMIC DIFFRACTION THEORY OF DIFFUSELY SCATTERED ELECTRONS 148 4.8.1 THE FIRST ORDER DIFFUSE SCATTERING THEORY 149 4.8.2 HIGH ORDER DIFFUSE SCATTERING THEORY 151 4.8.3 WHAT IS 1 MISSING IN CONVENTIONAL CALCULATION? 154 4.9 SUMMARY 156 REFERENCES 157 5 QUANTITATIVE ANALYSIS OF HIGH-RESOLUTION ATOMIC IMAGES 161 5.1 INTRODUCTION 161 5.2 QUANTITATIVE GEOMETRY ANALYSES OF HREM IMAGES 164 5.2.1 ATOMIC IMAGE SEGMENTATION 165 5.2.2 METHODS FOR BRIGHT SPOTS LOCALIZATION IN AN ATOMIC IMAGE 169 5.2.3 LATTICE DISPLACEMENT MEASUREMENT 170 5.3 QUANTITATIVE CONTRAST ANALYSIS OF HREM IMAGES 171 5.3.1 R-FACTOR 172 5.3.2 CORRELATION COEFFICIENT 172 5.3.3 NORMALIZED EUCLIDEAN DISTANCE (NED) 172 5.3.4 CROSS-CORRELATION FACTOR (XCF) 173 5.3.5 NORMALIZED INNER PRODUCT (NIP) 173 5.3.6 NORMALIZED QUADRATIC DIFFERENCE (NQD) 173 5.3.7 NORMALIZED IMAGE CROSS CORRELATION FUNCTION 173 5.3.8 VECTOR PATTERN CORRELATION 174 5.3.9 ^-CRITERION 174 5.4 DEFECTIVE STRUCTURE DETERMINATION BY THE QUANTITATIVE ANALYSIS OF ATOMIC IMAGES 174 5.4.1 INTRODUCTION 174 5.4.2 NON-LINEAR LEAST-SQUARE ALGORITHM 175 5.4.3 THE J 2 FITTING ALGORITHM 176 5.4.4 GENERAL STRATEGIES 177 5.5 DETECTING CHANGES IN THE CHEMICAL COMPOSITION BY QUANTITATIVE ATOMIC IMAGE ANALYSIS 178 5.5.1 CHEMICAL LATTICE IMAGING OF MATERIALS 178 5.5.2 VECTOR PATTERN CORRELATION METHOD 180 5.5.3 THE DE-CONVOLUTION AND DIFFERENCE-CONVOLUTION METHODS 181 5.5.4 T-C METHOD 183 5.5.5 FOURIER COEFFICIENT METHOD 183 5.5.6 QUANTITEM METHOD 185 5.6 LIMITATION AND FUTURE DEVELOPMENT 187 REFERENCES : 189 6 ELECTRON CRYSTALLOGRAPHY-STRUCTURE DETERMINATION BY COMBINING HREM, CRYSTALLOGRAPHIC IMAGE PROCESSING AND ELECTRON DIFFRACTION 191 6.1 INTRODUCTION 191 6.2 FUNDAMENTAL ELECTRON CRYSTALLOGRAPHY 192 6.2.1 CRYSTAL STRUCTURE, CRYSTAL POTENTIAL AND STRUCTURE FACTORS 193 6.2.2 CRYSTALLOGRAPHIC STRUCTURE FACTOR PHASES = ATOM POSITIONS 196 6.3 SOLVING CRYSTAL STRUCTURES FROM HREM IMAGES BY CRYSTALLOGRAPHIC IMAGE PROCESSING 200 6.3.1 RELATION BETWEEN HREM IMAGES AND THE PROJECTED CRYSTAL POTENTIAL FOR WEAK-PHASE-OBJECTS 200 6.3.2 RECORDING AND QUANTIFYING HREM IMAGES FOR STRUCTURE DETERMINATION 202 6.3.3 EXTRACTING CRYSTALLOGRAPHIC AMPLITUDES AND PHASES 203 6.3.4 DETERMINING AND COMPENSATING FOR DEFOCUS AND ASTIGMATISM 205 6.3.5 DETERMINING THE PROJECTED SYMMETRY 208 6.3.6 COMPENSATING FOR CRYSTAL TILT 210 6.4 SOLVING CRYSTAL STRUCTURES FROM SAED PATTERNS BY DIRECT METHODS 212 6.4.1 INTRODUCTION TO DIRECT METHODS 212 6.4.2 RECORDING AND DIGITIZING SAED PATTERNS FOR STRUCTURE DETERMINATION 213 6.4.3 APPLICATION OF DIRECT METHODS ON ELECTRON DIFFRACTION DATA 214 6.5 REFINING CRYSTAL STRUCTURES 216 6.5.1 INTRODUCTION TO STRUCTURE REFINEMENT 216 6.5.2 REFINING STRUCTURE AGAINST SAED INTENSITIES 216 6.5.3 REFINING STRUCTURE AGAINST X-RAY POWDER DIFFRACTION INTENSITIES 219 6.6 3D ELECTRON CRYSTALLOGRAPHY 219 6.7 CONCLUSIONS 220 REFERENCES 220 XI 7 ELECTRON AMORPHOGRAPHY 223 7.1 INTRODUCTION 223 7.2 THEORETICAL BACKGROUND 225 7.2.1 RADIAL DISTRIBUTION FUNCTIONS 225 7.2.2 DEBYE FORMULA 227 7.2.3 EXPERIMENTAL RDFS 228 7.2.4 MODIFICATION FUNCTIONS 231 7.3 EXAMPLES OF APPLICATION 232 7.3.1 SHORT-RANGE ORDER IN APERIODIC SILICAS 233 7.3.2 FIRST SHARP DIFFRACTION PEAK AND MEDIUM-RANGE ORDER 236 7.4 DISCUSSION 239 7.4.1 PARTIAL RDFS 239 7.4.2 TRUNCATION EFFECT 240 7.5 CONCLUDING REMARKS 242 REFERENCES 242 8 WEAK-BEAM ELECTRON MICROSCOPY 245 8.1 INTRODUCTION 245 8.2 PRINCIPLES OF THE WEAK-BEAM TECHNIQUE 246 8.2.1 PENDOLLOSUNG 248 8.2.2 THE AMPLITUDE-PHASE DIAGRAM 249 8.2.3 WEAK-BEAM IMAGE OF A DISLOCATION 250 8.2.4 THE COUPLED-PENDULUM AS AN ANALOGUE OF WEAK-BEAM LMAGING(COCKAYNE, 1972) 250 8.2.5 THE AMPLITUDE-PHASE DIAGRAM FOR WEAK-BEAM IMAGING 251 8.3 PRACTICAL WEAK-BEAM MICROSCOPY 254 8.3.1 CONDITIONS IMPOSED BY THEORY 254 8.3.2 EXPERIMENTAL PROCEDURES 256 8.4 APPLICATIONS 258 8.4.1 DISLOCATION DISSOCIATION 258 8.4.2 DETERMINATION OF STACKING FAULT ENERGIES 260 8.4.3 INVISIBILITY CRITERIA 263 8.4.4 WEAK-BEAM MICROSCOPY AS THE PREFERRED TOOL FOR STUDYING COMPLEX DEFECT GEOMETRIES 263 8.4.5 STACKING FAULTS 265 8.4.6 SUPERLATTICE DISLOCATIONS A TRAP FOR THE UNWARY 267 8.5 OTHER WEAK-BEAM STUDIES 269 8.6 CONCLUSIONS 269 REFERENCES 269 XII 9 POINT GROUP AND SPACE GROUP IDENTIFICATION BY CONVERGENT BEAM ELECTRON DIFFRACTION 273 9.1 INTRODUCTION 273 9.1.1 WHY POINT GROUP AND SPACE GROUP IDENTIFICATION 273 9.1.2 WHYUSECBED 274 9.1.3 HOW TO OBTAIN CBED PATTERNS 275 9.2 POINT GROUP IDENTIFICATION 277 9.3 SPACE GROUP IDENTIFICATION 287 9.4 EXAMPLES OF POINT GROUP AND SPACE GROUP IDENTIFICATION 293 9.5 SPECIAL TECHNIQUES AND OTHER APPLICATIONS 297 9.6 EPILOGUE 298 REFERENCES 299 10 ADVANCED TECHNIQUES IN TEM SPECIMEN PREPARATION 301 10.1 ABSTRACT 301 10.2 INITIAL PREPARATION 302 10.2.1 DIAMOND WHEEL SAWING 303 10.2.2 WIRE SAWING 304 10.2.3 SPARK MACHINING 305 10.3 PRETHINNING 305 10.4 DISC CUTTING 306 10.4.1 DISCS FROM SHEET 307 10.5 FINAL THINNING 307 10.5.1 DIMPLING 309 10.5.2 ELECTROPOLISHING 311 10.6 ION BEAM MILLING 313 10.6.1 ION MILLING PARAMETERS 314 10.6.2 SPECIAL PREPARATION TECHNIQUES 318 10.7 TRIPOD POLISHING 321 10.7.1 PREPARATION OF SPECIMENS 322 10.7.2 IRREGULAR SPECIMENS 324 10.8 SMALL ANGLE CLEAVAGE TECHNIQUE 324 10.8.1 CLEAVING CONSIDERATIONS 325 10.8.2 PREPARATION OF SPECIMENS 327 10.8.3 OTHER APPLICATIONS 331 10.9 ULTRAMICROTOMY 332 10.10 DIRECT PREPARATION METHODS 334 10.11 FOCUSED ION BEAM 336 10.11.1 THE FOCUSED ION BEAM (FIB) INSTRUMENT 336 10.11.2 CONVENTIONAL FIB TEM SPECIMEN PREPARATION 338 10.11.3 THE LIFT-OUT TECHNIQUE 339 XIII 10.11.4 FIB PREPARATION TRICKS OF THE TRADE 341 10.11.5 SPECIMEN PREPARATION INDUCED DAMAGE 341 10.11.6 ADVANTAGES AND DISADVANTAGES OF THE FIB METHODS 342 10.11.7 ADVANCES IN FIB INSTRUMENTATION 342 10.11.8 FINAL COMMENTS 343 10.12 PLASMA CLEANING 343 10.12.1 BACKGROUND 344 10.12.2 PLASMA BASICS 345 10.12.3 PLASMA PROCESSING: VOLATILIZATION OF HYDROCARBONS 347 10.12.4 EXPERIMENTAL DETAILS 348 10.12.5 PLASMA CONDITIONS AND THE EFFECTS ON THE SPECIMEN/STAGE 350 10.13 CONCLUSION 351 REFERENCES 352 INDEX 363
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spelling	Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.) Berlin [u.a.] Springer 2001 [Beijing] Tsinghua Univ. Press 2001 XVI, 365 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in surface sciences 38 Springer series in surface sciences ... Physics and astronomy online library Microscopie électronique en transmission - Technologie ram Transmission electron microscopy Transmission electron microscopy Technique Zhang, Xiao-Feng 1963- (DE-588)122270371 edt (DE-604)BV013360702 1 Springer series in surface sciences 38 (DE-604)BV000600785 38 HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009114014&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis
spellingShingle	Progress in transmission electron microscopy Springer series in surface sciences Microscopie électronique en transmission - Technologie ram Transmission electron microscopy Transmission electron microscopy Technique
title	Progress in transmission electron microscopy
title_auth	Progress in transmission electron microscopy
title_exact_search	Progress in transmission electron microscopy
title_full	Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.)
title_fullStr	Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.)
title_full_unstemmed	Progress in transmission electron microscopy 1 Concepts and techniques Xiao-Feng Zhang ... (ed.)
title_short	Progress in transmission electron microscopy
title_sort	progress in transmission electron microscopy concepts and techniques
topic	Microscopie électronique en transmission - Technologie ram Transmission electron microscopy Transmission electron microscopy Technique
topic_facet	Microscopie électronique en transmission - Technologie Transmission electron microscopy Transmission electron microscopy Technique
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=009114014&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
volume_link	(DE-604)BV013360702 (DE-604)BV000600785
work_keys_str_mv	AT zhangxiaofeng progressintransmissionelectronmicroscopy1

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