Scattering and surface roughness II: 21 - 23 July 1998, San Diego, California
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 1998
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3426
Subjects:
Physical Description:VII, 382 S. Ill., graph. Darst.
ISBN:0819428817

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