Microelectronic manufacturing yield, reliability, and failure analysis IV: 23 - 24 September, 1998, Santa Clara, California
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1998
|
| Schriftenreihe: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
3510 |
| Schlagworte: | |
| Beschreibung: | VII, 240 S. Ill., graph. Darst. |
| ISBN: | 0819429694 |
Internformat
MARC
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| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1998 | |
| 300 | |a VII, 240 S. |b Ill., graph. Darst. | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 3510 | |
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| 650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |v Congresses | |
| 650 | 4 | |a Microelectronics |v Congresses | |
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Datensatz im Suchindex
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| ctrlnum | (OCoLC)39876779 (DE-599)BVBBV013261273 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1998 Santa Clara Calif. gnd-content |
| genre_facet | Konferenzschrift 1998 Santa Clara Calif. |
| id | DE-604.BV013261273 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:42:41Z |
| institution | BVB |
| isbn | 0819429694 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-009039702 |
| oclc_num | 39876779 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | VII, 240 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | SPIE |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California Sharad Prasad ... chairs Bellingham, Wash. SPIE 1998 VII, 240 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3510 Integrated circuits Defects Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Integrated circuits Very large scale integration Congresses Microelectronics Congresses Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 Santa Clara Calif. gnd-content Integrierte Schaltung (DE-588)4027242-4 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Prasad, Sharad Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3510 (DE-604)BV000010887 3510 |
| spellingShingle | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE Integrated circuits Defects Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Integrated circuits Very large scale integration Congresses Microelectronics Congresses Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4059245-5 (DE-588)1071861417 |
| title | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California |
| title_auth | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California |
| title_exact_search | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California |
| title_full | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California Sharad Prasad ... chairs |
| title_fullStr | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California Sharad Prasad ... chairs |
| title_full_unstemmed | Microelectronic manufacturing yield, reliability, and failure analysis IV 23 - 24 September, 1998, Santa Clara, California Sharad Prasad ... chairs |
| title_short | Microelectronic manufacturing yield, reliability, and failure analysis IV |
| title_sort | microelectronic manufacturing yield reliability and failure analysis iv 23 24 september 1998 santa clara california |
| title_sub | 23 - 24 September, 1998, Santa Clara, California |
| topic | Integrated circuits Defects Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Integrated circuits Very large scale integration Congresses Microelectronics Congresses Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Integrated circuits Defects Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Integrated circuits Very large scale integration Congresses Microelectronics Congresses Integrierte Schaltung Zuverlässigkeit Konferenzschrift 1998 Santa Clara Calif. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT prasadsharad microelectronicmanufacturingyieldreliabilityandfailureanalysisiv2324september1998santaclaracalifornia |