Characterization and metrology for ULSI technology: 1998 international conference ; Gaithersburg, Maryland, March 1998
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Woodbury, NY American Inst. of Physics 1998
Series:American Institute of Physics: AIP conference proceedings 449
Subjects:
Physical Description:XV, 960 S. Ill., graph. Darst. 1 CD-ROM (12 cm)
ISBN:1563968681
1563967537
1563968673

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