Proceedings of the Third International Symposium on Defects in Silicon:
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Pennington, NJ
Electrochemical Soc.
1999
|
| Series: | Electrochemical Society: Proceedings
1999,1 |
| Subjects: | |
| Physical Description: | IX, 530 S. Ill., graph. Darst. |
| ISBN: | 1566772230 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013156257 | ||
| 003 | DE-604 | ||
| 005 | 20010213 | ||
| 007 | t | ||
| 008 | 000517s1999 ad|| |||| 10||| eng d | ||
| 020 | |a 1566772230 |9 1-56677-223-0 | ||
| 035 | |a (OCoLC)41885870 | ||
| 035 | |a (DE-599)BVBBV013156257 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 | ||
| 050 | 0 | |a QC611.8.S5 | |
| 082 | 0 | |a 621.3815/2 |2 21 | |
| 084 | |a UQ 2400 |0 (DE-625)146493: |2 rvk | ||
| 111 | 2 | |a International Symposium on Defects in Silicon |n 3 |d 1999 |c Seattle, Wash. |j Verfasser |0 (DE-588)5342562-5 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Third International Symposium on Defects in Silicon |c ed. T. Abe ... |
| 246 | 1 | 3 | |a Defects in silicon |
| 246 | 1 | 3 | |a Defects in silicon III |
| 264 | 1 | |a Pennington, NJ |b Electrochemical Soc. |c 1999 | |
| 300 | |a IX, 530 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Electrochemical Society: Proceedings |v 1999,1 | |
| 650 | 7 | |a Semiconducteurs - Défauts |2 ram | |
| 650 | 7 | |a Silicium - Défauts |2 ram | |
| 650 | 4 | |a Semiconductors |x Defects |v Congresses | |
| 650 | 4 | |a Silicon |x Defects |v Congresses | |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Seattle Wash. |2 gnd-content | |
| 689 | 0 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Abe, Takao |e Sonstige |4 oth | |
| 830 | 0 | |a Electrochemical Society: Proceedings |v 1999,1 |w (DE-604)BV001900941 |9 1999,1 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008963837 | ||
Record in the Search Index
| _version_ | 1804127856281780224 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium on Defects in Silicon Seattle, Wash |
| author_corporate_role | aut |
| author_facet | International Symposium on Defects in Silicon Seattle, Wash |
| author_sort | International Symposium on Defects in Silicon Seattle, Wash |
| building | Verbundindex |
| bvnumber | BV013156257 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.8.S5 |
| callnumber-search | QC611.8.S5 |
| callnumber-sort | QC 3611.8 S5 |
| callnumber-subject | QC - Physics |
| classification_rvk | UQ 2400 |
| ctrlnum | (OCoLC)41885870 (DE-599)BVBBV013156257 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01725nam a2200469 cb4500</leader><controlfield tag="001">BV013156257</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010213 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000517s1999 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1566772230</subfield><subfield code="9">1-56677-223-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)41885870</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013156257</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC611.8.S5</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 2400</subfield><subfield code="0">(DE-625)146493:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium on Defects in Silicon</subfield><subfield code="n">3</subfield><subfield code="d">1999</subfield><subfield code="c">Seattle, Wash.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5342562-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Third International Symposium on Defects in Silicon</subfield><subfield code="c">ed. T. Abe ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Defects in silicon</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Defects in silicon III</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pennington, NJ</subfield><subfield code="b">Electrochemical Soc.</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 530 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1999,1</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Défauts</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Silicium - Défauts</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield><subfield code="x">Defects</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Seattle Wash.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Abe, Takao</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1999,1</subfield><subfield code="w">(DE-604)BV001900941</subfield><subfield code="9">1999,1</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008963837</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1999 Seattle Wash. gnd-content |
| genre_facet | Konferenzschrift 1999 Seattle Wash. |
| id | DE-604.BV013156257 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:40:00Z |
| institution | BVB |
| institution_GND | (DE-588)5342562-5 |
| isbn | 1566772230 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008963837 |
| oclc_num | 41885870 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | IX, 530 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Electrochemical Soc. |
| record_format | marc |
| series | Electrochemical Society: Proceedings |
| series2 | Electrochemical Society: Proceedings |
| spelling | International Symposium on Defects in Silicon 3 1999 Seattle, Wash. Verfasser (DE-588)5342562-5 aut Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... Defects in silicon Defects in silicon III Pennington, NJ Electrochemical Soc. 1999 IX, 530 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrochemical Society: Proceedings 1999,1 Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Seattle Wash. gnd-content Silicium (DE-588)4077445-4 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Abe, Takao Sonstige oth Electrochemical Society: Proceedings 1999,1 (DE-604)BV001900941 1999,1 |
| spellingShingle | Proceedings of the Third International Symposium on Defects in Silicon Electrochemical Society: Proceedings Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4077445-4 (DE-588)1071861417 |
| title | Proceedings of the Third International Symposium on Defects in Silicon |
| title_alt | Defects in silicon Defects in silicon III |
| title_auth | Proceedings of the Third International Symposium on Defects in Silicon |
| title_exact_search | Proceedings of the Third International Symposium on Defects in Silicon |
| title_full | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_fullStr | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_full_unstemmed | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_short | Proceedings of the Third International Symposium on Defects in Silicon |
| title_sort | proceedings of the third international symposium on defects in silicon |
| topic | Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Semiconducteurs - Défauts Silicium - Défauts Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler Silicium Konferenzschrift 1999 Seattle Wash. |
| volume_link | (DE-604)BV001900941 |
| work_keys_str_mv | AT internationalsymposiumondefectsinsiliconseattlewash proceedingsofthethirdinternationalsymposiumondefectsinsilicon AT abetakao proceedingsofthethirdinternationalsymposiumondefectsinsilicon AT internationalsymposiumondefectsinsiliconseattlewash defectsinsilicon AT abetakao defectsinsilicon AT internationalsymposiumondefectsinsiliconseattlewash defectsinsiliconiii AT abetakao defectsinsiliconiii |