Proceedings of the Third International Symposium on Defects in Silicon:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Pennington, NJ
Electrochemical Soc.
1999
|
| Schriftenreihe: | Electrochemical Society: Proceedings
1999,1 |
| Schlagworte: | |
| Beschreibung: | IX, 530 S. Ill., graph. Darst. |
| ISBN: | 1566772230 |
Internformat
MARC
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| 111 | 2 | |a International Symposium on Defects in Silicon |n 3 |d 1999 |c Seattle, Wash. |j Verfasser |0 (DE-588)5342562-5 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Third International Symposium on Defects in Silicon |c ed. T. Abe ... |
| 246 | 1 | 3 | |a Defects in silicon |
| 246 | 1 | 3 | |a Defects in silicon III |
| 264 | 1 | |a Pennington, NJ |b Electrochemical Soc. |c 1999 | |
| 300 | |a IX, 530 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Electrochemical Society: Proceedings |v 1999,1 | |
| 650 | 7 | |a Semiconducteurs - Défauts |2 ram | |
| 650 | 7 | |a Silicium - Défauts |2 ram | |
| 650 | 4 | |a Semiconductors |x Defects |v Congresses | |
| 650 | 4 | |a Silicon |x Defects |v Congresses | |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Seattle Wash. |2 gnd-content | |
| 689 | 0 | 0 | |a Silicium |0 (DE-588)4077445-4 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Abe, Takao |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| bvnumber | BV013156257 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
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| classification_rvk | UQ 2400 |
| ctrlnum | (OCoLC)41885870 (DE-599)BVBBV013156257 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift 1999 Seattle Wash. |
| id | DE-604.BV013156257 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:40:00Z |
| institution | BVB |
| institution_GND | (DE-588)5342562-5 |
| isbn | 1566772230 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008963837 |
| oclc_num | 41885870 |
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| owner | DE-703 |
| owner_facet | DE-703 |
| physical | IX, 530 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Electrochemical Soc. |
| record_format | marc |
| series | Electrochemical Society: Proceedings |
| series2 | Electrochemical Society: Proceedings |
| spelling | International Symposium on Defects in Silicon 3 1999 Seattle, Wash. Verfasser (DE-588)5342562-5 aut Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... Defects in silicon Defects in silicon III Pennington, NJ Electrochemical Soc. 1999 IX, 530 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrochemical Society: Proceedings 1999,1 Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Seattle Wash. gnd-content Silicium (DE-588)4077445-4 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Abe, Takao Sonstige oth Electrochemical Society: Proceedings 1999,1 (DE-604)BV001900941 1999,1 |
| spellingShingle | Proceedings of the Third International Symposium on Defects in Silicon Electrochemical Society: Proceedings Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4077445-4 (DE-588)1071861417 |
| title | Proceedings of the Third International Symposium on Defects in Silicon |
| title_alt | Defects in silicon Defects in silicon III |
| title_auth | Proceedings of the Third International Symposium on Defects in Silicon |
| title_exact_search | Proceedings of the Third International Symposium on Defects in Silicon |
| title_full | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_fullStr | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_full_unstemmed | Proceedings of the Third International Symposium on Defects in Silicon ed. T. Abe ... |
| title_short | Proceedings of the Third International Symposium on Defects in Silicon |
| title_sort | proceedings of the third international symposium on defects in silicon |
| topic | Semiconducteurs - Défauts ram Silicium - Défauts ram Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler (DE-588)4125030-8 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Semiconducteurs - Défauts Silicium - Défauts Semiconductors Defects Congresses Silicon Defects Congresses Gitterbaufehler Silicium Konferenzschrift 1999 Seattle Wash. |
| volume_link | (DE-604)BV001900941 |
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