APA (7th ed.) Citation

Kuo, W., Chien, W. K., & Kim, T. (1998). Reliability, yield, and stress burn-in: A unified approach for microelectronics systems manufacturing & software development. Kluwer.

Chicago Style (17th ed.) Citation

Kuo, Way, Wei-Ting Kary Chien, and Taeho Kim. Reliability, Yield, and Stress Burn-in: A Unified Approach for Microelectronics Systems Manufacturing & Software Development. Boston [u.a.]: Kluwer, 1998.

MLA (9th ed.) Citation

Kuo, Way, et al. Reliability, Yield, and Stress Burn-in: A Unified Approach for Microelectronics Systems Manufacturing & Software Development. Kluwer, 1998.