Recent development of electron microscopy 1991: proceedings of the Sixth Chinese-Japanese Electron Microscopy Seminar held in Okayama from November 5 to November 9 in 1991
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Tokyo Japanese Soc. of Electron Microscopy 1992
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:261 S. Ill., graph. Darst.
ISBN:4930813204

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