Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | German |
| Published: |
Aachen
Mainz
1999
|
| Edition: | 1. Aufl. |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | Zugl.: Aachen, Techn. Hochsch., Diss., 1999 |
| Physical Description: | III, 147 S. Ill., graph. Darst. |
| ISBN: | 3896534777 |
Staff View
MARC
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Record in the Search Index
| _version_ | 1804127573396946944 |
|---|---|
| any_adam_object | 1 |
| author | Xu, Jun |
| author_facet | Xu, Jun |
| author_role | aut |
| author_sort | Xu, Jun |
| author_variant | j x jx |
| building | Verbundindex |
| bvnumber | BV012886950 |
| classification_rvk | UP 7570 |
| classification_tum | PHY 692d PHY 697d PHY 606d |
| ctrlnum | (OCoLC)76036848 (DE-599)BVBBV012886950 |
| discipline | Physik |
| edition | 1. Aufl. |
| format | Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV012886950 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:35:30Z |
| institution | BVB |
| isbn | 3896534777 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008772017 |
| oclc_num | 76036848 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T |
| owner_facet | DE-91 DE-BY-TUM DE-29T |
| physical | III, 147 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Mainz |
| record_format | marc |
| spelling | Xu, Jun Verfasser aut Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie vorgelegt von Jun Xu 1. Aufl. Aachen Mainz 1999 III, 147 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Zugl.: Aachen, Techn. Hochsch., Diss., 1999 Zinkselenid (DE-588)4190874-0 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Magnesiumselenid (DE-588)4414649-8 gnd rswk-swf Epitaxieschicht (DE-588)4152546-2 gnd rswk-swf Mischkristall (DE-588)4170112-4 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Magnesiumsulfid (DE-588)4414648-6 gnd rswk-swf Zinksulfid (DE-588)4190877-6 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Zinkselenid (DE-588)4190874-0 s Zinksulfid (DE-588)4190877-6 s Magnesiumsulfid (DE-588)4414648-6 s Magnesiumselenid (DE-588)4414649-8 s Mischkristall (DE-588)4170112-4 s Epitaxieschicht (DE-588)4152546-2 s Röntgendiffraktometrie (DE-588)4336833-5 s DE-604 Halbleiterschicht (DE-588)4158812-5 s 1\p DE-604 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008772017&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Xu, Jun Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie Zinkselenid (DE-588)4190874-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Magnesiumselenid (DE-588)4414649-8 gnd Epitaxieschicht (DE-588)4152546-2 gnd Mischkristall (DE-588)4170112-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Magnesiumsulfid (DE-588)4414648-6 gnd Zinksulfid (DE-588)4190877-6 gnd |
| subject_GND | (DE-588)4190874-0 (DE-588)4336833-5 (DE-588)4414649-8 (DE-588)4152546-2 (DE-588)4170112-4 (DE-588)4158812-5 (DE-588)4414648-6 (DE-588)4190877-6 (DE-588)4113937-9 |
| title | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_auth | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_exact_search | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_full | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie vorgelegt von Jun Xu |
| title_fullStr | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie vorgelegt von Jun Xu |
| title_full_unstemmed | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie vorgelegt von Jun Xu |
| title_short | Charakterisierung von MOVPE-II-VI-Halbleiter-Schichten mittels Röntgendiffraktometrie |
| title_sort | charakterisierung von movpe ii vi halbleiter schichten mittels rontgendiffraktometrie |
| topic | Zinkselenid (DE-588)4190874-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Magnesiumselenid (DE-588)4414649-8 gnd Epitaxieschicht (DE-588)4152546-2 gnd Mischkristall (DE-588)4170112-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Magnesiumsulfid (DE-588)4414648-6 gnd Zinksulfid (DE-588)4190877-6 gnd |
| topic_facet | Zinkselenid Röntgendiffraktometrie Magnesiumselenid Epitaxieschicht Mischkristall Halbleiterschicht Magnesiumsulfid Zinksulfid Hochschulschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008772017&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT xujun charakterisierungvonmovpeiivihalbleiterschichtenmittelsrontgendiffraktometrie |