ESD protection devices for CMOS technologies: processing impact, modeling and testing issues:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Aachen
Shaker
1999
|
| Ausgabe: | Als Ms. gedr. |
| Schriftenreihe: | Berichte aus der Halbleitertechnik
|
| Schlagworte: | |
| Beschreibung: | Zugl.: München, Techn. Univ., Diss., 1999 |
| Beschreibung: | 316 S. Ill. : graph. Darst. |
| ISBN: | 3826566645 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV012828483 | ||
| 003 | DE-604 | ||
| 005 | 20000517 | ||
| 007 | t | ||
| 008 | 991019s1999 gw ad|| m||| 00||| ger d | ||
| 016 | 7 | |a 957664711 |2 DE-101 | |
| 020 | |a 3826566645 |c Pb. : DM 109.00, sfr 109.00, S 759.00 |9 3-8265-6664-5 | ||
| 035 | |a (OCoLC)231839055 | ||
| 035 | |a (DE-599)BVBBV012828483 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a ger | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-12 |a DE-91 | ||
| 084 | |a ELT 240d |2 stub | ||
| 100 | 1 | |a Russ, Christian |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ESD protection devices for CMOS technologies: processing impact, modeling and testing issues |c Christian Russ |
| 250 | |a Als Ms. gedr. | ||
| 264 | 1 | |a Aachen |b Shaker |c 1999 | |
| 300 | |a 316 S. |b Ill. : graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Berichte aus der Halbleitertechnik | |
| 500 | |a Zugl.: München, Techn. Univ., Diss., 1999 | ||
| 650 | 0 | 7 | |a Elektrostatische Entladung |0 (DE-588)4401020-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Schutz |g Elektrotechnik |0 (DE-588)4128586-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a CMOS |0 (DE-588)4010319-5 |D s |
| 689 | 0 | 1 | |a Elektrostatische Entladung |0 (DE-588)4401020-5 |D s |
| 689 | 0 | 2 | |a Schutz |g Elektrotechnik |0 (DE-588)4128586-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008728088 | ||
Datensatz im Suchindex
| _version_ | 1804127505906401280 |
|---|---|
| any_adam_object | |
| author | Russ, Christian |
| author_facet | Russ, Christian |
| author_role | aut |
| author_sort | Russ, Christian |
| author_variant | c r cr |
| building | Verbundindex |
| bvnumber | BV012828483 |
| classification_tum | ELT 240d |
| ctrlnum | (OCoLC)231839055 (DE-599)BVBBV012828483 |
| discipline | Elektrotechnik |
| edition | Als Ms. gedr. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01491nam a2200421 c 4500</leader><controlfield tag="001">BV012828483</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20000517 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">991019s1999 gw ad|| m||| 00||| ger d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">957664711</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3826566645</subfield><subfield code="c">Pb. : DM 109.00, sfr 109.00, S 759.00</subfield><subfield code="9">3-8265-6664-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)231839055</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012828483</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">ger</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 240d</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Russ, Christian</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ESD protection devices for CMOS technologies: processing impact, modeling and testing issues</subfield><subfield code="c">Christian Russ</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Als Ms. gedr.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Aachen</subfield><subfield code="b">Shaker</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">316 S.</subfield><subfield code="b">Ill. : graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Berichte aus der Halbleitertechnik</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Zugl.: München, Techn. Univ., Diss., 1999</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrostatische Entladung</subfield><subfield code="0">(DE-588)4401020-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schutz</subfield><subfield code="g">Elektrotechnik</subfield><subfield code="0">(DE-588)4128586-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektrostatische Entladung</subfield><subfield code="0">(DE-588)4401020-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Schutz</subfield><subfield code="g">Elektrotechnik</subfield><subfield code="0">(DE-588)4128586-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008728088</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV012828483 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:34:25Z |
| institution | BVB |
| isbn | 3826566645 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008728088 |
| oclc_num | 231839055 |
| open_access_boolean | |
| owner | DE-12 DE-91 DE-BY-TUM |
| owner_facet | DE-12 DE-91 DE-BY-TUM |
| physical | 316 S. Ill. : graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Shaker |
| record_format | marc |
| series2 | Berichte aus der Halbleitertechnik |
| spelling | Russ, Christian Verfasser aut ESD protection devices for CMOS technologies: processing impact, modeling and testing issues Christian Russ Als Ms. gedr. Aachen Shaker 1999 316 S. Ill. : graph. Darst. txt rdacontent n rdamedia nc rdacarrier Berichte aus der Halbleitertechnik Zugl.: München, Techn. Univ., Diss., 1999 Elektrostatische Entladung (DE-588)4401020-5 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf Schutz Elektrotechnik (DE-588)4128586-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content CMOS (DE-588)4010319-5 s Elektrostatische Entladung (DE-588)4401020-5 s Schutz Elektrotechnik (DE-588)4128586-4 s DE-604 |
| spellingShingle | Russ, Christian ESD protection devices for CMOS technologies: processing impact, modeling and testing issues Elektrostatische Entladung (DE-588)4401020-5 gnd CMOS (DE-588)4010319-5 gnd Schutz Elektrotechnik (DE-588)4128586-4 gnd |
| subject_GND | (DE-588)4401020-5 (DE-588)4010319-5 (DE-588)4128586-4 (DE-588)4113937-9 |
| title | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues |
| title_auth | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues |
| title_exact_search | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues |
| title_full | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues Christian Russ |
| title_fullStr | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues Christian Russ |
| title_full_unstemmed | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues Christian Russ |
| title_short | ESD protection devices for CMOS technologies: processing impact, modeling and testing issues |
| title_sort | esd protection devices for cmos technologies processing impact modeling and testing issues |
| topic | Elektrostatische Entladung (DE-588)4401020-5 gnd CMOS (DE-588)4010319-5 gnd Schutz Elektrotechnik (DE-588)4128586-4 gnd |
| topic_facet | Elektrostatische Entladung CMOS Schutz Elektrotechnik Hochschulschrift |
| work_keys_str_mv | AT russchristian esdprotectiondevicesforcmostechnologiesprocessingimpactmodelingandtestingissues |