Photomechanics:
Gespeichert in:
Format: | Buch |
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Sprache: | English |
Veröffentlicht: |
Berlin [u.a.]
Springer
2000
|
Schriftenreihe: | Topics in applied physics
77 |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | XV, 471 S. Ill., graph. Darst |
ISBN: | 3540659900 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV012806641 | ||
003 | DE-604 | ||
005 | 20061130 | ||
007 | t | ||
008 | 991005s2000 gw ad|| |||| 00||| eng d | ||
020 | |a 3540659900 |c Pp. : DM 279.00 |9 3-540-65990-0 | ||
035 | |a (OCoLC)42682796 | ||
035 | |a (DE-599)BVBBV012806641 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
044 | |a gw |c DE | ||
049 | |a DE-355 |a DE-29T |a DE-703 |a DE-92 |a DE-522 |a DE-83 |a DE-11 |a DE-188 | ||
050 | 0 | |a TA417.2 | |
082 | 0 | |a 620.1/127 |2 21 | |
084 | |a UH 5000 |0 (DE-625)145647: |2 rvk | ||
084 | |a UH 5400 |0 (DE-625)145660: |2 rvk | ||
084 | |a UH 5450 |0 (DE-625)145662: |2 rvk | ||
084 | |a UH 5760 |0 (DE-625)145707: |2 rvk | ||
084 | |a UH 5790 |0 (DE-625)145711: |2 rvk | ||
084 | |a ZM 3700 |0 (DE-625)157028: |2 rvk | ||
245 | 1 | 0 | |a Photomechanics |c Pramod K. Rastogi (ed.) |
264 | 1 | |a Berlin [u.a.] |b Springer |c 2000 | |
300 | |a XV, 471 S. |b Ill., graph. Darst | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Topics in applied physics |v 77 | |
650 | 7 | |a Contrôle non destructif |2 ram | |
650 | 7 | |a Dispositifs optoélectroniques |2 ram | |
650 | 7 | |a Interférométrie holographique |2 ram | |
650 | 7 | |a Moiré, Méthode de |2 ram | |
650 | 4 | |a Holographic interferometry | |
650 | 4 | |a Moiré method | |
650 | 4 | |a Nondestructive testing | |
650 | 4 | |a Optoelectronic devices | |
650 | 4 | |a Photonics | |
650 | 0 | 7 | |a Holographische Interferometrie |0 (DE-588)4123390-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Photonik |0 (DE-588)4243979-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Optoelektronisches Bauelement |0 (DE-588)4043689-5 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
689 | 0 | 1 | |a Holographische Interferometrie |0 (DE-588)4123390-6 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Photonik |0 (DE-588)4243979-6 |D s |
689 | 1 | 1 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Optoelektronisches Bauelement |0 (DE-588)4043689-5 |D s |
689 | 2 | |5 DE-604 | |
700 | 1 | |a Rastogi, Pramod K. |d 1951- |e Sonstige |0 (DE-588)12143639X |4 oth | |
830 | 0 | |a Topics in applied physics |v 77 |w (DE-604)BV008007504 |9 77 | |
856 | 4 | 2 | |m GBV Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008710483&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-008710483 |
Datensatz im Suchindex
_version_ | 1804127479244259328 |
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adam_text | PRAMOD K. RASTOGI (ED.) PHOTOMECHANICS WITH 314 FIGURES SPRINGER
CONTENTS OPTICS FOR ENGINEERS DANIEL MALACARA-HERNAENDEZ 1 1.
INTRODUCTION 1 2. GEOMETRICAL OPTICS PRINCIPLES 1 2.1. FERMAT S
PRINCIPLE AND THE LAW OF REFRACTION 1 2.2. FIRST-ORDER OPTICS 3 2.3.
ABERRATIONS 7 3. WAVE-OPTICS FUNDAMENTALS 12 3.1. YOUNG S DOUBLE SLIT 12
3.2. MICHELSON INTERFEROMETER 13 3.3. COHERENCE AND LIGHT SOURCES 14 4.
MAIN INTERFEROMETERS USED IN OPTICAL ENGINEERING 15 4.1. FIZCAU
INTERFEROMETER AND NEWTONS RINGS 16 4.2. TWYMAN-GREEN INTERFEROMETER 19
4.3. RONCHI AND LATERAL-SHEAR INTERFEROMETERS 22 4.4. TALBOT
INTERFEROMETCR AND MOIRE DENECTOMETRY 26 4.5. FOUCAULT TEST AND
SCHLIEREN TECHNIQUES 27 4.6. TWO-WAVELENGTH INTERFEROMCTRY 28 4.7.
HOLOGRAPHIE PRINCIPLES 29 5. SUMMARY 31 REFERENCES 31 INTRODUCTION TO
ENGINEERING MECHANICS ANAND ASUNDI 33 1. INTRODUCTION 33 2. BASIC
CONCEPTS 34 2.1. STRESS 34 2.2. STRESS TRANSFORMATION 35 2.3. STRESS
TRANSFORMATION USING MOHR S CIRCLE 36 2.4. DISPLACEMENT AND STRAIN 37
2.5. STRAIN TRANSFORMATION 39 2.6. STRESS-STRAIN RELATIONS 40 2.7.
BOUNDARY CONDITIONS 41 3. THEORY OF ELASTICITY APPROACH 42 3.1. PLANE
STRESS FORMULATION 44 3.2. PLANE STRAIN FORMULATION 45 X CONTENTS 4.
STRENGTH OF MATERIALS APPROACH 46 5. EXAMPLES 47 5.1. AXIAL LOADING 47
5.2. BENDING OF BEAMS 49 5.3. COMBINED BENDING AND AXIAL LOAD 52 6.
CONCLUSION 53 FURTHER READING 54 FRINGE ANALYSIS YVES SURREL 55 1.
INTRODUCTION 55 2. PHASE EVALUATION 57 2.1. LOCAL AND GLOBAL STRATEGIES
57 2.2. LOCAL PHASE DETECTION 58 2.3. GLOBAL PHASE DETECTION 77 2.4.
RESIDUAL PHASE ERRORS 81 2.5. EFFECT OF ADDITIVE NOISE 84 3. PHASE
UNWRAPPING 86 3.1. SPATIAL APPROACH 87 3.2. TEMPORAL APPROACH 89 4.
CONCLUSION 94 REFERENCCS 99 PRINCIPLES OF HOLOGRAPHIE INTERFEROMETRY AND
SPECKLE METROLOGY PRAMOD K. RASTOGI 103 1. HOLOGRAPHIE INTERFEROMETRY
103 1.1. TYPES OF HOLOGRAPHIE INTERFEROMETRY 104 1.2. THERMOPLASTIC
CAMERA 107 1.3. MAPPING OF THE RESOLVED PART OF DISPLACEINENT 109 1.4.
DETERMINATION OF THE WAVEFRONT PHASE USING PHASE-SHIFTING INTERFEROMETRY
110 1.5. OUT-OF-PLANE DISPLACEMENT MEASUREMENT 111 1.6. IN-PLANE
DISPLACEMENT MEASUREMENT 112 1.7. HOLOGRAPHIE SHEARING INTERFEROMETRY
115 1.8. COMPARATIVE HOLOGRAPHIE INTERFEROMETRY 117 1.9. VIBRATION
ANALYSIS 119 2. SPECKLE METROLOGY 124 2.1. FOCUSED SPECKLE PHOTOGRAPHY
125 2.2. DCFOCUSED SPECKLE PHOTOGRAPHY 128 2.3. SPECKLE SHEARING
PHOTOGRAPHY 129 2.4. SPECKLE INTERFEROMETRY 131 2.5. SPECKLE SHEARING
INTERFEROMETRY 140 CONTENTS XI 3. CONCLUSIONS 145 REFERENCES 145 MOIRE
METHODS FOR ENGINEERING AND SCIENCE MOIRE INTERFEROMETRY AND SHADOW
MOIRE DANIEL POST, BONGTAE HAN, AND PETER G. IFJU 151 1. INTRODUCTION
151 2. MOIRE INTERFEROMETRY 152 2.1. BASIC CONCEPTS 152 2.2. EQUIPMCNT
156 2.3. SPECIMEN GRAETINGS 157 2.4. BITHERMAL LOADING (ISOTHERMAL
LOADING) 158 2.5. FRMGE COUNTING 158 2.6. STRAIN ANALYSIS 160 2.7.
CARRIER FRINGES 160 2.8. OUT-OF-PLANE DEFORMATION 162 3. ADVANCED
TECHNIQUES IN MOIRE INTERFEROMETRY 164 3.1. MICROSCOPIC MOIRE
INTERFEROMETRY 164 3.2. CURVED SURFACES 166 3.3. REPLICATION OF DEFORMED
GRAETINGS 170 4. DIVERSE APPLICATIONS OF MOIRE INTERFEROMETRY 171 4.1.
THERMAL DEFORNIATIONS OF MICROELECTRONICS DEVICES 171 4.2. TEXTILE
COMPOSITES 173 4.3. FRACTURE MECHANICS 176 4.4. MICROMECHAIUECS: GRAIN
DEFORMATIONS 177 5. SHADOW MOIRE 180 5.1. BASIC CONCEPTS 180 5.2.
ADDITIONAL CONSIDERATIONS 183 6. INCREASED SENSITIVITY, SHADOW MOIRE 184
6.1. PHASE STEPPING (OR QUASI-HETERODYNE) METHOD 184 6.2.
OPTICAL/DIGITAL FRINGE MULTIPLICATION (O/DFM) 185 7. APPLICATIONS OF
SHADOW MOIRE 185 7.1. POST-BUCKLING BEHAVIOR OF A COMPOSITE COLUMN 185
7.2. PRE-BUCKLING BEHAVIOR OF AN ALUMINUM CHANNEL 189 7.3. WARPAGE OF
ELECTRONIC DEVICES 191 REFERENCES 194 DIGITAL PHOTOELASTICITY TERRY Y.
CHEN 197 1. BASIC PRINCIPLES OF PHOTOELASTICITY 197 1.1. LIGHT AND
COMPLEX NOTATION 197 1.2. POLARIZATION OF LIGHT 198 1.3. RETARDATION 200
1.4. OPTICAL MEDIA 200 1.5. THE STRESS-OPTIC LAW 202 XII CONTENTS 1.6.
PLANE POLARISCOPE 204 1.7. CIRCULAR POLARISCOPE 207 2. COMPUTER
EVALUATION OF PHOTOELASTIC FRINGC PATTERNS 210 2.1. DIGITAL IMAGE
PROCESSING 211 2.2. EXTRACTION OF FRINGE POINT 213 2.3. FRINGE
MULTIPLICATION 213 2.4. DETERMINATION OF THE ISOCHROMATIC FRINGE ORDER
215 2.5. DETERMINATION OF PRINCIPAL STRESS DIRECTION 222 3. APPLICATIONS
OF EVALUATED DATA 226 3.1. STRESS ANALYSIS 226 3.2. EXAMPLES 227 4.
SYSTEM AND ERROR ASSESSMENT 227 5. CONCLUSIONS 230 REFERENCCS 230
OPTICAL FIBER STRAIN SENSING IN ENGINEERING MECHANICS JAMES S. SIRKIS
233 1. INTRINSIC FABRY-PEROT SENSOR 234 1.1. OPTICAL ARRANGEMENT 234
1.2. RESPONSE TO STRAIN AND TEMPERATURE 236 1.3. SENSOR MULTIPLEXING 239
2. EXTRINSIC FABRY-PEROT STRAIN SENSOR 239 2.1. OPTICAL ARRANGEMENT 241
2.2. RESPONSE TO STRAIN AND TEMPERATURE 242 2.3. SELF-TEMPERATURE
COMPENSATION 243 2.4. EFP SENSOR VARIANTS 244 2.5. SENSOR MULTIPLEXING
246 3. BRAGG GRAETING STRAIN SENSOR 246 3.1. BRAGG GRAETING FABRICATION
247 3.2. STRAIN AND TEMPERATURE RESPONSE 250 3.3. EFFECTS OF GRADIENTS
250 3.4. BRAGG GRAETING RELIABILITY 251 3.5. SENSOR MULTIPLEXING 251 4.
FIBER-OPTIC COATINGS AND CABLES 253 5. COMMERCIAL PACKAGING 256 6.
SENSOR BONDING TCCHNIQUES 257 7. DEINODULATION 258 7.1. SERRODYNE FRINGE
COUNTING (IFP SENSORS) 259 7.2. WHITE LIGHT CROSS-CORRELATOR (EFP
SENSORS) 260 7.3. SCANNING FABRY-PEROT FILTER (BRAGG GRAETING SENSORS)
262 7.4. SPECTRAL INTERROGATION (EFP SENSORS) 263 7.5. OTHER
DEMODULATORS 266 8. SENSOR COMPARISON 266 REFERCNCES 269 CONTENTS XIII
LONG-GAGE FIBER-OPTIC SENSORS FOR STRUCTURAL MONITORING DANIELE INAUDI
273 1. INTRODUCTION: MONITORING VERSUS MEASURING STRUCTURES 273 2.
LONG-GAGE VERSUS SHORT-GAGE SENSORS 274 3. INTERFEROMETRIC SENSORS : 275
3.1. OPTICAL ARRANGEMENTS 276 3.2. STRAIN AND TEMPERATURE SENSITIVITY
276 3.3. DEMODULATION TECHNIQUES 277 3.4. SENSOR PACKAGING 280 3.5.
APPLICATION EXAMPLE: MONITORING THE VERSOIX BRIDGE 283 4.
INTENSITY-BASED SENSORS 284 5. BRILLOUIN-SCATTERING SENSORS 286 5.1.
PRINCIPLES 286 5.2. MEASUREMENT TECHNIQUES 287 5.3. SENSOR PACKAGING 289
5.4. APPLICATION EXAMPLE: TEMPERATURE MONITORING OF THE LUZZONE DAM 290
6. OUTLOOK 291 7. CONCLUSIONS 291 REFERENCES 292 TECHNIQUES FOR
NON-BIREFRINGENT OBJECTS: COHERENT SHEARING INTERFEROMETRY AND CAUSTICS
SRIDHAR KRISHNASWAMY 295 1. INTRODUCTION 295 2. ELASTO-OPTIC RELATIONS
297 2.1. OPTICAL PHASE SHIFT DUE TO TRANSMISSION THROUGH AN OPTICALLY
ISOTROPIE LINEAR ELASTIC MEDIUM 297 2.2. OPTICAL PHASE-SHIFT DUE TO
REFLECTION FROM A POLISHED SURFACE 298 3. SHEARING INTERFEROMETRY 299
3.1. A DUAL-GRATING SHEARING INTERFEROMETER - THE COHERENT GRADIENT
SENSOR (CGS) 300 3.2. A POLARIZATION-BASED SHEARING INTERFEROMETER:
COMPACT POLARISCOPE / SHEARING INTERFEROMETER (PSI) 304 4. OPTICAL
CAUSTICS 309 5. APPLICATIONS 311 5.1. COMPRESSIVE LINE LOAD ON THE EDGE
OF A PLATE 312 5.2. PRACTURE MECHANICS 315 6. CONCLUSION 319 REFERENCES
319 XIV CONTENTS ADVANCES IN TWO-DIMENSIONAL AND THREE-DIMENSIONAL
COMPUTER VISION MICHAEL A. SUTTON, STEPHEN R. MCNEILL, JEFFREY D. HELM,
AND YUH J. CHAO 323 1. INTRODUCTION 323 2. THEORY AND NUMERICAL
IMPLEMENTATION 326 2.1. TWO-DIMENSIONAL VIDEO IMAGE CORRELATION 326 2.2.
THREE-DIMENSIONAL VIDEO IMAGE CORRELATION 334 3. APPLICATIONS 343 3.1.
TWO-DIMENSIONAL VIDEO IMAGE CORRELATION 343 3.2. THREE-DIMENSIONAL VIDEO
IMAGE CORRELATION 354 4. DISCUSSION 366 5. SUMMARY 367 REFERENCES 368
LASER DOPPLER AND PULSED LASER VELOCIMETRY IN FLUID MECHANICS JEREMY M.
COUPLAND 373 1. INTRODUCTION 373 1.1. THE SCATTERING AND DYNAMIC
PROPERTIES OF SEEDING PARTICLES . 375 2. LASER DOPPLER VELOCIMETRY (LDV)
376 2.1. FUNDAMCNTALS OF LDV 376 2.2. FOURIER OPTICA MODEL OF LDV 381
2.3. THE DOPPLER SIGNAL AND SIGNAL PROCESSING 386 2.4. LDV MEASUREMENTS
IN PRACTICE 389 3. PLANAR DOPPLER VELOCIMETRY (PDV) 391 4. PULSED LASER
VELOCIMETRY 395 4.1. PARTICLE IMAGE VELOCIMETRY (PIV) 395 4.2. REINOVAL
OF DIRECTIONAL AMBIGUITY 399 4.3. PIV MEASUREMENTS IN PRACTICE 400 4.4.
THREE-DIMENSIONAL PIV 402 4.5. HOLOGRAPHIE PARTICLE IMAGE VELOCIMETRY
(HPIV) 402 5. CONCLUSIONS, DISCUSSION AND FUTURE DEVELOPMENT 408
REFERENCES 410 SURFACE CHARACTERIZATION AND ROUGHNESS MEASUREMENT IN
ENGINEERING DAVID J. WHITEHOUSE 413 1. GENERAL 413 1.1. HISTORICAL 413
1.2. NATURC AND IMPORTANCE OF SURFACES 414 1.3. TRENDS 416 2.
INSTRUMENTATION 419 2.1. GENERAL POINTS 419 CONTENTS XV 2.2. THE STYLUS
422 2.3. BASIC INSTRUMENT 425 2.4. THE STYLUS METHOD (MECHANICAL) 427
2.5. THE OPTICAL METHODS 428 2.6. OTHER CONVENTIONAL METHODS 433 2.7.
NON-CONVENTIONAL METHODS 433 3. PRE-PROCESSING AND FILTERING 433 3.1.
LEVCLLING 433 3.2. CURVE FITTING FOR FORM 433 3.3. FILTERING FOR
WAVINESS 434 4. PARAMETERS 439 4.1. GENERAL 439 4.2. HEIGHT PARAMETERS
(SEE [36] FOR EXAMPLE) 440 4.3. PEAK PARAMETERS 441 4.4. SPACING
PARAMETERS 442 4.5. PEAK PARAMETERS (STATISTICAL) 443 4.6. HYBRID
PARAMETERS 445 4.7. EFFECTS OF FILTERING ON PARAMETER VALUES 445 5.
RANDOM PROCESS ANALYSIS IN SURFACE METROLOGY 446 5.1. GENERAL 446 5.2.
HEIGHT INFORMATION 446 5.3. SPACING INFORMATION 447 6. AREAL (OR
THREE-DIMENSIONAL) PARAMETERS 453 6.1. GENERAL 453 6.2. COMMENTS ON
AREAL MCASUREMENT 454 7. CONCLUSIONS 458 REFERENCES 459 INDEX 463
|
any_adam_object | 1 |
author_GND | (DE-588)12143639X |
building | Verbundindex |
bvnumber | BV012806641 |
callnumber-first | T - Technology |
callnumber-label | TA417 |
callnumber-raw | TA417.2 |
callnumber-search | TA417.2 |
callnumber-sort | TA 3417.2 |
callnumber-subject | TA - General and Civil Engineering |
classification_rvk | UH 5000 UH 5400 UH 5450 UH 5760 UH 5790 ZM 3700 |
ctrlnum | (OCoLC)42682796 (DE-599)BVBBV012806641 |
dewey-full | 620.1/127 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.1/127 |
dewey-search | 620.1/127 |
dewey-sort | 3620.1 3127 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02586nam a2200649 cb4500</leader><controlfield tag="001">BV012806641</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20061130 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">991005s2000 gw ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540659900</subfield><subfield code="c">Pp. : DM 279.00</subfield><subfield code="9">3-540-65990-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)42682796</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012806641</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-522</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA417.2</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/127</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5000</subfield><subfield code="0">(DE-625)145647:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5400</subfield><subfield code="0">(DE-625)145660:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5450</subfield><subfield code="0">(DE-625)145662:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5760</subfield><subfield code="0">(DE-625)145707:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5790</subfield><subfield code="0">(DE-625)145711:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3700</subfield><subfield code="0">(DE-625)157028:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Photomechanics</subfield><subfield code="c">Pramod K. Rastogi (ed.)</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XV, 471 S.</subfield><subfield code="b">Ill., graph. Darst</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Topics in applied physics</subfield><subfield code="v">77</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Contrôle non destructif</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Dispositifs optoélectroniques</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Interférométrie holographique</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Moiré, Méthode de</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Holographic interferometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Moiré method</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nondestructive testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optoelectronic devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Photonics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Holographische Interferometrie</subfield><subfield code="0">(DE-588)4123390-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Photonik</subfield><subfield code="0">(DE-588)4243979-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optoelektronisches Bauelement</subfield><subfield code="0">(DE-588)4043689-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Holographische Interferometrie</subfield><subfield code="0">(DE-588)4123390-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Photonik</subfield><subfield code="0">(DE-588)4243979-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Optoelektronisches Bauelement</subfield><subfield code="0">(DE-588)4043689-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rastogi, Pramod K.</subfield><subfield code="d">1951-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)12143639X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Topics in applied physics</subfield><subfield code="v">77</subfield><subfield code="w">(DE-604)BV008007504</subfield><subfield code="9">77</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">GBV Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008710483&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008710483</subfield></datafield></record></collection> |
id | DE-604.BV012806641 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:34:00Z |
institution | BVB |
isbn | 3540659900 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008710483 |
oclc_num | 42682796 |
open_access_boolean | |
owner | DE-355 DE-BY-UBR DE-29T DE-703 DE-92 DE-522 DE-83 DE-11 DE-188 |
owner_facet | DE-355 DE-BY-UBR DE-29T DE-703 DE-92 DE-522 DE-83 DE-11 DE-188 |
physical | XV, 471 S. Ill., graph. Darst |
publishDate | 2000 |
publishDateSearch | 2000 |
publishDateSort | 2000 |
publisher | Springer |
record_format | marc |
series | Topics in applied physics |
series2 | Topics in applied physics |
spelling | Photomechanics Pramod K. Rastogi (ed.) Berlin [u.a.] Springer 2000 XV, 471 S. Ill., graph. Darst txt rdacontent n rdamedia nc rdacarrier Topics in applied physics 77 Contrôle non destructif ram Dispositifs optoélectroniques ram Interférométrie holographique ram Moiré, Méthode de ram Holographic interferometry Moiré method Nondestructive testing Optoelectronic devices Photonics Holographische Interferometrie (DE-588)4123390-6 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf Photonik (DE-588)4243979-6 gnd rswk-swf Optoelektronisches Bauelement (DE-588)4043689-5 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Holographische Interferometrie (DE-588)4123390-6 s DE-604 Photonik (DE-588)4243979-6 s Optoelektronisches Bauelement (DE-588)4043689-5 s Rastogi, Pramod K. 1951- Sonstige (DE-588)12143639X oth Topics in applied physics 77 (DE-604)BV008007504 77 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008710483&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Photomechanics Topics in applied physics Contrôle non destructif ram Dispositifs optoélectroniques ram Interférométrie holographique ram Moiré, Méthode de ram Holographic interferometry Moiré method Nondestructive testing Optoelectronic devices Photonics Holographische Interferometrie (DE-588)4123390-6 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Photonik (DE-588)4243979-6 gnd Optoelektronisches Bauelement (DE-588)4043689-5 gnd |
subject_GND | (DE-588)4123390-6 (DE-588)4067689-4 (DE-588)4243979-6 (DE-588)4043689-5 |
title | Photomechanics |
title_auth | Photomechanics |
title_exact_search | Photomechanics |
title_full | Photomechanics Pramod K. Rastogi (ed.) |
title_fullStr | Photomechanics Pramod K. Rastogi (ed.) |
title_full_unstemmed | Photomechanics Pramod K. Rastogi (ed.) |
title_short | Photomechanics |
title_sort | photomechanics |
topic | Contrôle non destructif ram Dispositifs optoélectroniques ram Interférométrie holographique ram Moiré, Méthode de ram Holographic interferometry Moiré method Nondestructive testing Optoelectronic devices Photonics Holographische Interferometrie (DE-588)4123390-6 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Photonik (DE-588)4243979-6 gnd Optoelektronisches Bauelement (DE-588)4043689-5 gnd |
topic_facet | Contrôle non destructif Dispositifs optoélectroniques Interférométrie holographique Moiré, Méthode de Holographic interferometry Moiré method Nondestructive testing Optoelectronic devices Photonics Holographische Interferometrie Zerstörungsfreie Werkstoffprüfung Photonik Optoelektronisches Bauelement |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008710483&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
volume_link | (DE-604)BV008007504 |
work_keys_str_mv | AT rastogipramodk photomechanics |