Advanced computing in electron microscopy:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York [u.a.]
Plenum Press
1998
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| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | IX, 250 S. Ill., graph. Darst. 1 CD-ROM (12 cm) |
| ISBN: | 0306459361 |
Staff View
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Record in the Search Index
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| adam_text | ADVANCED COMPUTING IN ELECTRON MICROSCOPY EARL J. KIRKLAND CORNELL
UNIVERSITY ITHACA, NEW YORK PLENUM PRESS * NEW YORK AND LONDON CONTENTS
PREFACE V 1 INTRODUCTION 1 2 THE TRANSMISSION ELECTRON MICROSCOPE 5 2.1
INTRODUCTION 5 2.2 MODELING THE ELECTRON MICROSCOPE 7 2.3
RELATIVISTICELECTRONS 9 2.4 ABERRATIONS 12 2.5 RECIPROCITY 14 2.6
FURTHER READING 17 3 LINEAR IMAGE APPROXIMATIONS 19 3.1 THE WEAK PHASE
OBJECT IN BRIGHT FIELD 20 3.2 PARTIAL COHERENCE IN BF-CTEM 24 3.3
INCOHERENT IMAGING OF THIN SPECIMENS (CTEM) 29 3.4 ANNULAR DARK FIELD
STEM 33 4 SAMPLING AND THE FAST FOURIER TRANSFORM 41 4.1 SAMPLING 41 4.2
DISCRETE FOURIER TRANSFORM 45 4.3 THE FAST FOURIER TRANSFORM OR FFT 46
4.4 WRAP AROUND ERROR AND REARRANGEMENT 48 4.5 FOURIER TRANSFORMING REAL
VALUED DATA . . . 50 4.6 DISPLAYING DIFFRACTION PATTERNS 51 4.7 FURTHER
READING 51 4.8 AN FFT SUBROUTINE IN C 53 4.9 AN FFT SUBROUTINE IN
FORTRAN 56 5 SIMULATING IMAGES OF THIN SPECIMENS 63 5.1 THE WEAK PHASE
OBJECT 63 5.2 SINGLE ATOM PROPERTIES 66 5.2.1 RADIAL CHARGE DISTRIBUTION
67 5.2.2 POTENTIAL 67 VII VIII CONTENTS 5.2.3 ATOMIC SIZE 70 5.2.4
SCATTERING FACTORS 70 5.3 TOTAL SPECIMEN POTENTIAL 73 5.4 BF PHASE
CONTRAST IMAGE CALCULATION 76 5.4.1 SINGLE ATOM IMAGES 78 5.4.2 THIN
SPECIMEN IMAGES 81 5.4.3 PARTIAL COHERENCE AND THE TRANSMISSION CROSS
COEFFICIENT ... 84 5.5 ADF STEM IMAGES OF THIN SPECIMENS 89 5.5.1 SINGLE
ATOM IMAGES 92 5.5.2 THIN SPECIMEN IMAGES 94 5.6 SUMMARY OF SAMPLING
SUGGESTIONS 94 6 SIMULATING IMAGES OF THICK SPECIMENS 99 6.1 THE WAVE
EQUATION FOR FAST ELECTRONS 101 6.2 A BLOCH WAVE SOLUTION 104 6.3 THE
MULTISLICE SOLUTION 106 6.3.1 A FORMAL OPERATOR SOLUTION 106 6.3.2 A
FINITE DIFFERENCE SOLUTION 109 6.3.3 FREE SPACE PROPAGATION 110 6.4
MULTISLICE INTERPRETATION ILL 6.5 THE MULTISLICE METHOD AND FFT S 113
6.6 SLICING THE SPECIMEN 114 6.7 ALIASING AND BANDWIDTH 118 6.8
INTERFACES AND DEFECTS 121 6.9 MULTISLICE IMPLEMENTATION 122 6.9.1 THE
PROPAGATOR FUNCTION AND SPECIMEN TILT 123 6.9.2 CONVERGENCE TESTS 125
6.9.3 PARTIAL COHERENCE IN BF-CTEM 127 6.10 MORE ACCURATE SLICE METHODS
128 6.10.1 OPERATOR SOLUTIONS 128 6.10.2 FINITE DIFFERENCE SOLUTIONS 129
7 MULTISLICE APPLICATIONS AND EXAMPLES 133 7.1 GALLIUM ARSENIDE 133
7.1.1 BF-CTEM SIMULATION 134 7.1.2 ADF-STEM SIMULATION 138 7.2 SILICON
NITRIDE 140 7.3 CBED SIMULATIONS 144 7.4 THERMAL VIBRATIONS OF THE ATOMS
IN THE SPECIMEN 150 7.5 QUANTITATIVE IMAGE MATCHING 153 8 THE PROGRAMS
ON THE CD-ROM 157 8.1 PROGRAM ORGANIZATION 157 8.2 IMAGE DISPLAY 158 8.3
PROGRAMMING LANGUAGE 159 8.3.1 DISK FILE FORMAT 160 CONTENTS IX 8.4
BF-CTEM SAMPLE CALCULATIONS 162 8.4.1 ATOMIC POTENTIALS 162 8.4.2
MULTISLICE 166 8.4.3 IMAGE FORMATION 168 8.4.4 PARTIAL COHERENCE 169 8.5
ADF-STEM SAMPLE CALCULATIONS 171 8.6 NON-PERIODIC SPECIMENS 175 8.7
USING THE DISPLAY PROGRAM 181 8.8 USING THE PROGRAM SLICVIEW 183 A
PLOTTING CTEM/STEM TRANSFER FUNCTIONS 185 B FILES ON THE CD-ROM 195 C
THE FOURIER PROJECTION THEOREM 197 D ATOMIC POTENTIALS AND SCATTERING
FACTORS 199 D.I ATOMIC CHARGE DISTRIBUTION 200 D.2 X-RAY SCATTERING
FACTORS 202 D.3 ELECTRON SCATTERING FACTORS 202 D.4 PARAMETERIZATION 203
E BILINEAR INTERPOLATION 221 F 3D PERSPECTIVE VIEW 223 INDEX 249
|
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| discipline | Allgemeine Naturwissenschaft Physik |
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| indexdate | 2024-07-09T18:32:44Z |
| institution | BVB |
| isbn | 0306459361 |
| language | English |
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| physical | IX, 250 S. Ill., graph. Darst. 1 CD-ROM (12 cm) |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Plenum Press |
| record_format | marc |
| spelling | Kirkland, Earl J. Verfasser aut Advanced computing in electron microscopy Earl J. Kirkland New York [u.a.] Plenum Press 1998 IX, 250 S. Ill., graph. Darst. 1 CD-ROM (12 cm) txt rdacontent n rdamedia nc rdacarrier Electron microscopy Computer simulation Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s DE-604 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008657658&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Kirkland, Earl J. Advanced computing in electron microscopy Electron microscopy Computer simulation Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
| title | Advanced computing in electron microscopy |
| title_auth | Advanced computing in electron microscopy |
| title_exact_search | Advanced computing in electron microscopy |
| title_full | Advanced computing in electron microscopy Earl J. Kirkland |
| title_fullStr | Advanced computing in electron microscopy Earl J. Kirkland |
| title_full_unstemmed | Advanced computing in electron microscopy Earl J. Kirkland |
| title_short | Advanced computing in electron microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Electron microscopy Computer simulation Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Computer simulation Computersimulation Elektronenmikroskopie |
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