Recent developments in thin film research: epitaxial growth and nanostructures, electron microscopy and x-ray diffraction: proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS spring conference Strasbourg, France, June 16 - 20, 1997
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Bibliographic Details
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] Elsevier 1997
Series:European Materials Research Society: European Materials Research Society symposia proceedings 69
Subjects:
Item Description:Aus: Thin solid films ; 318,1-2 und Thin solid films ; 319,1-2
Physical Description:Getr. Zählung zahlr. Ill. und graph. Darst.
ISBN:0444205136

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