Proceedings: [October 18 - 23, 1998, Marriott Wardman Park Hotel, Washington, D.C., USA]
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Bibliographic Details
Corporate Author: International Test Conference Washington, DC (Author)
Format: Conference Proceeding Book
Language:English
Published: Piscataway, NJ Inst. of Electrical and Electronic Engineers 1998
Subjects:
Physical Description:XVI, 1179 S. zahlr. Ill. u. graph. Darst.
ISBN:0780350928
0780350936

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