Quantitative x-ray spectrometry:

This thoroughly revised and updated Second Edition of an incomparable hands-on reference covers every important aspect of x-ray spectrometry - from basic principles to the selection of instrument parameters and sample preparation. With over 1100 equations, figures, tables and bibliographic citations...

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Bibliographic Details
Main Authors: Jenkins, Ron (Author), Gould, Robert W. (Author), Gedcke, Dale (Author)
Format: Book
Language:English
Published: New York [u.a.] Dekker 1995
Edition:2. ed.
Series:Practical spectroscopy 20
Subjects:
Summary:This thoroughly revised and updated Second Edition of an incomparable hands-on reference covers every important aspect of x-ray spectrometry - from basic principles to the selection of instrument parameters and sample preparation. With over 1100 equations, figures, tables and bibliographic citations, Quantitative X-ray Spectrometry, Second Edition is an invaluable resource for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists, and graduate-level and continuing-education students in these disciplines.
Physical Description:XI, 484 S. Ill., graph. Darst.
ISBN:0824795547

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