High resolution electron microscopy for materials science:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | German English Japanese |
| Published: |
Tokyo [u.a.]
Springer
1998
|
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | Translation is based on the Japanese original |
| Physical Description: | IX, 190 S. Ill., graph. Darst. |
| ISBN: | 4431702342 |
Staff View
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| 245 | 1 | 0 | |a High resolution electron microscopy for materials science |c D. Shindo ; K. Hiraga |
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| 650 | 4 | |a High resolution electron microscopy | |
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Record in the Search Index
| _version_ | 1826212322600812544 |
|---|---|
| adam_text |
D. SHINDO YY K. HIRAGA
HIGH-RESOLUTION
ELECTRON
MICROSCOPY
FOR
MATERIALS SCIENCE
WITH 203 FIGURES
SPRINGER
CONTENTS
PREFACE V
LIST OF SPECIMENS OBSERVED BY HIGH-RESOLUTION ELECTRON MICROSCOPY. IX
LIST
OF ELECTRON MICROSCOPES (EMS) USED IX
1.
BASIS OF HIGH-RESOLUTION ELECTRON MICROSCOPY
1.1
PRINCIPLES OF TRANSMISSION ELECTRON MICROSCOPY 1
1.2
ELECTRON SCATTERING AND FOURIER TRANSFORM
;~^.
3
1.3
FORMATION OF HIGH-RESOLUTION IMAGES 4
1.3.1 HIGH-RESOLUTION IMAGES OF THIN CRYSTALS 4
1.3.2 RESOLUTION OF ELECTRON MICROSCOPES 8
1.3.3 HIGH-RESOLUTION IMAGES OF THICK CRYSTALS 9
1.4 COMPUTER SIMULATION OF HIGH-RESOLUTION IMAGES 11
1.4.1
SIMULATION PROGRAM AND INPUT PARAMETERS 11
1.4.2 GENERALIZATION OF IMAGE SIMULATION 13
1.4.3 CHECKING PROGRAMS 14
REFERENCES 15
2.
PRACTICE OF HIGH-RESOLUTION ELECTRON MICROSCOPY
2.1
CLASSIFICATION OF HIGH-RESOLUTION IMAGES 17
2.1.1 LATTICE FRINGES 17
2.1.2 ONE-DIMENSIONAL STRUCTURE IMAGES \ 20
2.1.3 TWO-DIMENSIONAL LATTICE IMAGES 21
2.1.4 TWO-DIMENSIONAL STRUCTURE IMAGES 25
2.1.5 SPECIAL IMAGES 29
2.2 PRACTICE IN OBSERVING HIGH-RESOLUTION IMAGES 31
2.2.1 POINTS TO NOTE BEFORE OBSERVATION 31
2.2.2 POINTS TO NOTE DURING OBSERVATION : 33
2.2.3 SELECTION OF GOOD IMAGES 36
2.2.4 POINTS TO NOTE IN THE INTERPRETATION OF IMAGES 38
2.2.5
TRAINING FOR THE OBSERVATION OF
HIGH-RESOLUTION
IMAGES 39
REFERENCES 39
3. APPLICATION OF HIGH-RESOLUTION ELECTRON MICROSCOPY
3.1
HIGH-RESOLUTION IMAGES OF VARIOUS DEFECTS 41
3.1.1 DISLOCATIONS 41
3.1.2 GRAIN BOUNDARIES AND INTERFACES BETWEEN
DIFFERENT
PHASES 54
3.1.3 SURFACES 69
3.1.4 OTHER STRUCTURAL DEFECTS 75
3.2 HIGH-RESOLUTION IMAGES OF VARIOUS MATERIALS 83
3.2.1 CERAMICS 83
VI
CONTENTS
VII
3.2.2 SUPERCONDUCTING OXIDES 91
3.2.3 ORDERED ALLOYS 99
3.2.4 QUASICRYSTALS 113
REFERENCES 127
4. PERIPHERAL INSTRUMENTS
AND
TECHNIQUES
FOR
HIGH-RESOLUTION
ELECTRON MICROSCOPY
4.1
IMAGE PROCESSING 129
4.1.1 INPUT AND OUTPUT OF HIGH-RESOLUTION IMAGES 129
4.1.2
PRACTICE IN PROCESSING HIGH-RESOLUTION IMAGES 131
4.2
QUANTITATIVE ANALYSIS 138
4.2.1 PRINCIPLES OF NEW RECORDING SYSTEMS 138
4.2.2 CHARACTERISTICS OF NEW RECORDING SYSTEMS 139
4.2.3
QUANTITATIVE HIGH-RESOLUTION ELECTRON
MICROSCOPY
142
4.3 ELECTRON DIFFRACTION 147
4.3.1 BASIS OF ELECTRON DIFFRACTION 147
4.3.2 PRACTICE OF ELECTRON DIFFRACTION 149
4.3.3 ELECTRON DIFFRACTION PATTERNS OF VARIOUS STRUCTURES 152
4.4
WEAK-BEAM METHOD 156
4.4.1 PRINCIPLES OF THE WEAK-BEAM METHOD 156
4.4.2 WEAK-BEAM METHOD IN PRACTICE 158
4.5 EVALUATION OF THE PERFORMANCE OF ELECTRON
MICROSCOPES
159
4.5.1 EVALUATION OF BASIC PARAMETERS IN ELECTRON
MICROSCOPES
159
4.5.2 EVALUATION OF THE RESOLUTION OF ELECTRON
MICROSCOPES
163
4.6 SPECIMEN PREPARATION TECHNIQUES 164
4.6.1 CRUSHING 164
4.6.2 ELECTROPOLISHING 164
4.6.3 CHEMICAL POLISHING .
}YY
165
4.6.4 ULTRAMICROTOMY 165
4.6.5 ION MILLING 166
4.6.6 FOCUSED ION BEAM (FIB) 167
4.6.7 VACUUM EVAPORATION 167
REFERENCES 168
APPENDIXES
APPENDIX
A. PHYSICAL CONSTANTS, CONVERSION FACTORS
AND
ELECTRON WAVELENGTH 169
APPENDIX B. GEOMETRY OF CRYSTAL LATTICE 170
APPENDIX C. TYPICAL STRUCTURES IN MATERIALS AND
THEIR
ELECTRON DIFFRACTION PATTERNS 172
APPENDIX D. PROPERTIES OF FOURIER TRANSFORM 181
APPENDIX E. SIGN CONVENTIONS 185
SUBJECT INDEX 187 |
| any_adam_object | 1 |
| author | Shindo, Daisuke 1953- Hiraga, Kenji 1939- |
| author_GND | (DE-588)120559463 (DE-588)120559501 |
| author_facet | Shindo, Daisuke 1953- Hiraga, Kenji 1939- |
| author_role | aut aut |
| author_sort | Shindo, Daisuke 1953- |
| author_variant | d s ds k h kh |
| building | Verbundindex |
| bvnumber | BV012268339 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6300 ZM 3850 |
| ctrlnum | (OCoLC)39085372 (DE-599)BVBBV012268339 |
| dewey-full | 620.1/1299 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1299 |
| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| id | DE-604.BV012268339 |
| illustrated | Illustrated |
| indexdate | 2025-03-10T13:03:07Z |
| institution | BVB |
| isbn | 4431702342 |
| language | German English Japanese |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008314968 |
| oclc_num | 39085372 |
| open_access_boolean | |
| owner | DE-20 DE-703 DE-634 DE-83 DE-11 |
| owner_facet | DE-20 DE-703 DE-634 DE-83 DE-11 |
| physical | IX, 190 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Springer |
| record_format | marc |
| spelling | Shindo, Daisuke 1953- Verfasser (DE-588)120559463 aut Zairyo-hyoka-no-tameno-kobunkaino-denshi-kenbikyou-ho High resolution electron microscopy for materials science D. Shindo ; K. Hiraga Tokyo [u.a.] Springer 1998 IX, 190 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Translation is based on the Japanese original Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Hiraga, Kenji 1939- Verfasser (DE-588)120559501 aut DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008314968&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Shindo, Daisuke 1953- Hiraga, Kenji 1939- High resolution electron microscopy for materials science Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4287503-1 (DE-588)4014327-2 |
| title | High resolution electron microscopy for materials science |
| title_alt | Zairyo-hyoka-no-tameno-kobunkaino-denshi-kenbikyou-ho |
| title_auth | High resolution electron microscopy for materials science |
| title_exact_search | High resolution electron microscopy for materials science |
| title_full | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_fullStr | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_full_unstemmed | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_short | High resolution electron microscopy for materials science |
| title_sort | high resolution electron microscopy for materials science |
| topic | Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmicroscopie HREM High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008314968&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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