Multiple-beam interferometry of surfaces and films:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Clarendon Pr.
1948
|
| Schlagworte: | |
| Beschreibung: | VIII, 187 S. Ill., graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Tolansky, Samuel |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Multiple-beam interferometry of surfaces and films |
| 264 | 1 | |a Oxford |b Clarendon Pr. |c 1948 | |
| 300 | |a VIII, 187 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Interferometers | |
| 650 | 4 | |a Metallography | |
| 650 | 4 | |a Surfaces (Technology) | |
| 650 | 0 | 7 | |a Oberfläche |0 (DE-588)4042907-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Vielstrahlinterferenz |0 (DE-588)4336384-2 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
| _version_ | 1804126841805471744 |
|---|---|
| any_adam_object | |
| author | Tolansky, Samuel |
| author_facet | Tolansky, Samuel |
| author_role | aut |
| author_sort | Tolansky, Samuel |
| author_variant | s t st |
| building | Verbundindex |
| bvnumber | BV012225344 |
| callnumber-first | Q - Science |
| callnumber-label | QC411 |
| callnumber-raw | QC411 |
| callnumber-search | QC411 |
| callnumber-sort | QC 3411 |
| callnumber-subject | QC - Physics |
| classification_rvk | UH 5400 |
| ctrlnum | (OCoLC)1913371 (DE-599)BVBBV012225344 |
| dewey-full | 535.4 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 535 - Light and related radiation |
| dewey-raw | 535.4 |
| dewey-search | 535.4 |
| dewey-sort | 3535.4 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV012225344 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:23:52Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008283696 |
| oclc_num | 1913371 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 DE-11 DE-188 |
| owner_facet | DE-91 DE-BY-TUM DE-83 DE-11 DE-188 |
| physical | VIII, 187 S. Ill., graph. Darst. |
| publishDate | 1948 |
| publishDateSearch | 1948 |
| publishDateSort | 1948 |
| publisher | Clarendon Pr. |
| record_format | marc |
| spelling | Tolansky, Samuel Verfasser aut Multiple-beam interferometry of surfaces and films Oxford Clarendon Pr. 1948 VIII, 187 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Interferometers Metallography Surfaces (Technology) Oberfläche (DE-588)4042907-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Vielstrahlinterferenz (DE-588)4336384-2 gnd rswk-swf Oberfläche (DE-588)4042907-6 s Vielstrahlinterferenz (DE-588)4336384-2 s DE-604 Dünne Schicht (DE-588)4136925-7 s Oberflächenanalyse (DE-588)4172243-7 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Tolansky, Samuel Multiple-beam interferometry of surfaces and films Interferometers Metallography Surfaces (Technology) Oberfläche (DE-588)4042907-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Vielstrahlinterferenz (DE-588)4336384-2 gnd |
| subject_GND | (DE-588)4042907-6 (DE-588)4172243-7 (DE-588)4136925-7 (DE-588)4336384-2 |
| title | Multiple-beam interferometry of surfaces and films |
| title_auth | Multiple-beam interferometry of surfaces and films |
| title_exact_search | Multiple-beam interferometry of surfaces and films |
| title_full | Multiple-beam interferometry of surfaces and films |
| title_fullStr | Multiple-beam interferometry of surfaces and films |
| title_full_unstemmed | Multiple-beam interferometry of surfaces and films |
| title_short | Multiple-beam interferometry of surfaces and films |
| title_sort | multiple beam interferometry of surfaces and films |
| topic | Interferometers Metallography Surfaces (Technology) Oberfläche (DE-588)4042907-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Vielstrahlinterferenz (DE-588)4336384-2 gnd |
| topic_facet | Interferometers Metallography Surfaces (Technology) Oberfläche Oberflächenanalyse Dünne Schicht Vielstrahlinterferenz |
| work_keys_str_mv | AT tolanskysamuel multiplebeaminterferometryofsurfacesandfilms |