Defects and diffusion in semiconductors: an annual retrospective
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Bibliographic Details
Format: Book
Language:English
Published: Zuerich-Uetikon Scitec Publ. 1998
Series:[Diffusion and defect data / A] 162/163
Subjects:
Physical Description:V, 312 S. Ill., graph. Darst.
ISBN:3908450357

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!