Proceedings: August 24 - 25, 1998
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Bibliographic Details
Corporate Author: International Workshop on Memory Technology, Design and Testing San José, Calif (Author)
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1998
Subjects:
Physical Description:IX, 131 S. Ill., graph. Darst.
ISBN:0818684941
0818684968

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