Scanning probe microscopy and spectroscopy: methods and applications
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Cambridge [u.a.]
Cambridge Univ. Press
1998
|
| Edition: | 1. publ., repr. |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XXII, 637 S. Ill., graph. Darst. 23 cm |
| ISBN: | 0521428475 0521418100 |
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MARC
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| 245 | 1 | 0 | |a Scanning probe microscopy and spectroscopy |b methods and applications |c Roland Wiesendanger |
| 250 | |a 1. publ., repr. | ||
| 264 | 1 | |a Cambridge [u.a.] |b Cambridge Univ. Press |c 1998 | |
| 300 | |a XXII, 637 S. |b Ill., graph. Darst. |c 23 cm | ||
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Record in the Search Index
| _version_ | 1804126628625776640 |
|---|---|
| adam_text | Contents
Preface
page
xv
List of acronyms
xix
Introduction
1
Part one
Experimental methods and theoretical background of scanning
probe microscopy and spectroscopy
1
Scanning tunneling microscopy (STM)
11
1.1
Historical remarks on electron tunneling
11
1.2
Theoretical treatment of one-dimensional electron
tunneling
12
1.2.1
Elastic tunneling through a one-dimensional
rectangular potential barrier using the
time-independent approach
( wave-matching method )
15
1.2.2
Elastic tunneling through a one-dimensional
rectangular potential barrier using the
time-dependent approach
17
1.2.3
Elastic tunneling through a one-dimensional
potential barrier of arbitrary shape using
the WKB approximation
20
1.2.4
Elastic tunneling in planar metal-insulator-
metal junctions
21
1.2.5
Field emission or Fowler-Nordheim regime
and Gundlach oscillations
25
1.2.6
Tunneling including the image potential
25
1.2.7
Band structure effects in elastic tunneling
28
1.2.8
Resonant tunneling
30
1.2.9
Traversal time for tunneling
34
ix
Contents
1.3
Elastic
tunneling experiments with planar metal-
insulator-metal junctions
35
1.3.1
Giaever tunneling
36
1.3.2
Josephson
tunneling
44
1.3.3
Coulomb blockade and single-electron
tunneling
47
1.3.4
Spin-polarized tunneling
49
1.4
Inelastic electron tunneling in planar metal-
insulator-metal junctions
55
1.4.1
Inelastic tunneling involving excitation within
the insulating barrier
55
1.4.2
Inelastic tunneling involving excitation in the
metal electrodes or metal-insulator
interfaces
61
1.5
Semiconductor
(p
-η)
junctions: Esaki tunnel diodes
63
1.6
Metal-semiconductor junctions: Schottky barrier
tunneling
66
1.7
Point contact spectroscopy (PCS)
68
1.8
Vacuum tunneling before the invention of the STM
73
1.9
The birth of STM
81
1.10
STM design and instrumentation
83
1.10.1
Vibration isolation
84
1.10.2
Positioning devices
87
1.10.3
Scanning units
91
1.10.4
Electronics
97
1.10.5
Computer automation
98
1.10.6
Sensor tip preparation and characterization
99
1.10.7
Combined analysis instruments
106
1.11
Topographic imaging by STM
109
1.11.1
Constant current imaging
(CCI)
109
1.11.2
Constant height imaging (CHI) or variable
current mode
128
1.11.3
Differential tunneling microscopy (DTM)
130
1.11.4
Tracking tunneling microscopy (TTM)
130
1.11.5
Scanning noise microscopy
(SNM)
130
1.11.6
Nonlinear alternating-current tunneling
microscopy
131
1.12
Local tunneling barrier height
131
1.12.1
Local tunneling barrier height
measurements at fixed surface locations
134
1.12.2
Spatially resolved local tunneling barrier
height measurements
135
Contents
xi
1.12.3
Anomalous barrier heights
139
1.13
Tunneling spectroscopy (TS)
142
1.13.1
Voltage-dependent STM imaging
145
1.13.2
Scanning tunneling spectroscopy
(STS)
at
constant current
147
1.13.3
Local I-U measurements at constant
separation
148
1.13.4
Current imaging tunneling spectroscopy
(CITS)
149
1.13.5
Variable-separation spectroscopy
152
1.13.6
Assessment of tunneling spectroscopy
compared with other spectroscopical
techniques
153
1.14
Spin-polarized scanning tunneling microscopy
(SPSTM)
157
1.14.1
Concepts of SPSTM
158
1.14.2
Spin-polarized scanning tunneling
spectroscopy (SPSTS)
163
1.14.3
Other spin-sensitive STM experiments
164
1.15
Inelastic electron tunneling
(IET)
in STM
164
1.15.1
Phonon spectroscopy by
IET
165
1.15.2
Molecular vibrational spectroscopy by
IET
166
1.15.3
Photon emission by
IET
166
1.16
Tunneling-induced luminescence microscopy and
spectroscopy
171
1.17
STM with laser excitation
172
1.17.1
Thermal effects
172
1.17.2
Rectification, frequency mixing and
laser-driven STM
173
1.17.3
Generation and detection of surface
plasmons
176
1.17.4
Photovoltaic effects and photoassisted
tunneling spectroscopy
177
1.18
Scanning tunneling potentiometry (STP)
179
1.19
Ballistic electron emission microscopy
(ВЕЕМ)
and
spectroscopy (BEES)
183
1.20
Scanning field emission microscopy (SFEM) and
spectroscopy (SFES)
190
1.20.1
Field emission resonances
(FER)
and
electron
interferometry
at surfaces and
interfaces
190
1.20.2
FieJd emission scanning microscopy
193
xii Contents
1.20.3
Other field emission experiments
197
1.21
Transition to point contact
198
1.22
Forces in STM
204
2
Scanning force microscopy (SFM)
210
2.1
Historical remarks on surface force measurements
and surface profilometry
210
2.1.1
Surface force apparatus
(SFA)
210
2.1.2
Surface
profilometers
213
2.2
The birth of SFM
214
2.3
SFM design and instrumentation
216
2.3.1
Force sensors
216
2.3.2
Cantilever deflection measurement techniques
221
2.4
Topographic imaging by SFM in the contact mode
226
2.4.1
Constant force imaging (CFI)
226
2.4.2
Variable deflection imaging (VDI)
230
2.4.3
Differential force microscopy (DFM)
230
2.5
Frictional force microscopy (FFM)
231
2.6
Force spectroscopy (FS)
235
2.6.1
Local force spectroscopy (LFS)
236
2.6.2
Scanning force spectroscopy
(SFS)
239
2.7
Non-contact force microscopy
241
2.7.1
Van
der Waals
(VD
W)
force microscopy
245
2.7.2
Electrostatic force microscopy (EFM)
246
2.7.3
Magnetic force microscopy (MFM)
251
3
Related scanning probe methods
265
3.1
Scanning near-field optical microscopy
(SNOM)
267
3.1.1
SNOM
with nanometer-size aperture probes
268
3.1.2
Photon scannmg tunneling microscopy
(PSTM)
270
3.1.3
Scanning plasmon near-field microscopy
(SPNM)
272
3.2
Scanning near-field acoustic microscopy (SNAM)
273
3.3
Scanning near-field thermal microscopy (SNTM)
275
3.3.1
Scanning thermal profiler (STHP)
276
3.3.2
Tunneling thermometer (TT)
278
3.4
Scanning capacitance microscopy (SCAM)
279
3.5
Scanning electrochemical microscopy (SECM)
283
3.6
Scanning
micropipette
microscopy (SMM)
284
3.6.1
Scanning ion conductance microscopy (SICM)
284
3.6.2
Scanning
micropipette
molecule microscopy
(SMMM)
286
Contents xiii
Part two
Applications of scanning probe microscopy and spectroscopy
4
Condensed matter physics
291
4.1
Surface science
292
4.1.1
Semiconductors
292
4.1.2
Metals
357
4.1.3
Layered materials
387
4.1.4
Insulators
417
4.2
Magnetism
422
4.2.1
Micromagnetic configurations
423
4.2.2
Magnetic storage media
430
4.3
Superconductivity
431
4.3.1
Local energy gap
434
4.3.2
Spatially resolved energy gap
439
4.3.3
Phonon density of states
441
4.3.4
Abrikosov flux lattice
443
4.4
Charge density waves (CDW)
452
4.4.1
CDW in quasi-two-dimensional materials
454
4.4.2
CDW defects
457
4.4.3
CDW domains
461
4.4.4
CDW energy gap
464
4.4.5
CDW in quasi-one-dimensional materials and
CDW dynamics
464
5
Chemistry
468
5.1
Surface reactions
468
5.1.1
Chemical reactions at semiconductor surfaces
470
5.1.2
Chemical reactions at metal surfaces
478
5.2
Electrochemistry
481
5.2.1
Electrochemical oxidation and reduction of
surfaces
485
5.2.2
Potential-dependent reconstruction at
electrochemical surfaces
487
5.2.3
Electrochemical deposition under
potentiostatic control
488
6
Organic material
493
6.1
Thin molecular layers
495
6.1.1
Chemisorbed molecules on metal substrates
496
6.1.2
Liquid crystal molecules
501
6.1.3
Alkanes and alkane-derived molecules
511
6.1.4
Langmuir-Blodgett (LB) films
512
6.1.5
Polymers
518
xiv Contents
6.1.6
Fullerene
films
518
6.2
Molecular crystals
521
6.3
Biomacromolecules
525
6.3.1
Nucleic acids
528
6.3.2
Proteins
529
6.3.3
Membranes
534
7
Metrology and standards
537
7.1
Nanometrology
537
7.2
Quantum standards
539
8
Nanotechnology
542
8.1
Fabrication of nanometer-scale structures
543
8.1.1
Mechanical surface modifications
545
8.1.2
Chemical surface modifications
551
8.1.3
Electric-field-induced surface modifications
558
8.1.4
Thermally induced surface modifications
562
8.1.5
Electrostatic surface modifications
567
8.1.6
Magnetic surface modifications
569
8.2
Nanometer-scale electronic devices
571
8.3
Scanning probe methods combined with
microfabrication
574
8.3.1
Microfabrication
of SPM sensors
575
8.3.2
Microfabrication
of multiple sensor tips
575
8.3.3
Microfabrication
of SPM instruments
576
8.3.4
Field emission
microprobe
system
576
8.3.5
Microfabrication
of SPM-based sensors
579
8.4
Conclusion
580
References
581
Index
625
|
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| author | Wiesendanger, Roland 1961- |
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| author_facet | Wiesendanger, Roland 1961- |
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| id | DE-604.BV012034083 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:20:29Z |
| institution | BVB |
| isbn | 0521428475 0521418100 |
| language | English |
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| owner_facet | DE-1043 DE-210 DE-355 DE-BY-UBR |
| physical | XXII, 637 S. Ill., graph. Darst. 23 cm |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Cambridge Univ. Press |
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| spelling | Wiesendanger, Roland 1961- Verfasser (DE-588)115858059 aut Scanning probe microscopy and spectroscopy methods and applications Roland Wiesendanger 1. publ., repr. Cambridge [u.a.] Cambridge Univ. Press 1998 XXII, 637 S. Ill., graph. Darst. 23 cm txt rdacontent n rdamedia nc rdacarrier Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Rasterelektronenmikroskopie (DE-588)4048455-5 s 1\p DE-604 Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008143220&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wiesendanger, Roland 1961- Scanning probe microscopy and spectroscopy methods and applications Rastersondenmikroskopie (DE-588)4330328-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4330328-6 (DE-588)4048455-5 |
| title | Scanning probe microscopy and spectroscopy methods and applications |
| title_auth | Scanning probe microscopy and spectroscopy methods and applications |
| title_exact_search | Scanning probe microscopy and spectroscopy methods and applications |
| title_full | Scanning probe microscopy and spectroscopy methods and applications Roland Wiesendanger |
| title_fullStr | Scanning probe microscopy and spectroscopy methods and applications Roland Wiesendanger |
| title_full_unstemmed | Scanning probe microscopy and spectroscopy methods and applications Roland Wiesendanger |
| title_short | Scanning probe microscopy and spectroscopy |
| title_sort | scanning probe microscopy and spectroscopy methods and applications |
| title_sub | methods and applications |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Rastersondenmikroskopie Rasterelektronenmikroskopie |
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