In-situ microscopy in materials research: leading international research in electron and scanning probe microscopies
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Boston [u.a.]
Kluwer
1997
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| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XVIII, 336 S. Ill., graph. Darst. |
| ISBN: | 0792399897 |
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Record in the Search Index
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| adam_text | IN-SITU MICROSCOPY IN MATERIALS RESEARCH LEADING INTERNATIONAL RESEARCH
IN ELECTRON AND SCANNING PROBE MICROSCOPIES EDITED BY PRATIBHA L. GAI
CENTRAL RESEARCH AND DEVELOPMENT DUPONT WILMINGTON, DELEWARE, USA W
KLUWER ACADEMIC PUBLISHERS BOSTON/DORDRECHT/LONDON ** CONTENTS LIST OF
CONTRIBUTORS XI FOREWORD DAVID B. WILLIAMS XV PREFACE PRATIBHA L. GAI
XVII 1. IN-SITU APPLICATIONS OF LOW ENERGY ELECTRON MICROSCOPY (LEEM) :
1 BY E. BAUER 1. INTRODUCTION 1 2. PHASE TRANSITIONS ON CLEAN SURFACES 1
3. SEGREGATION 3 4. GAS-SURFACE INTERACTIONS 4 5. EPITAXY 6 6. SUMMARY
10 ACKNOWLEDGEMENTS AND REFERENCES 11 2. ENVIRONMENTAL SCANNING ELECTRON
MICROSCOPY 13 BY GERASIMOS DANIEL DANILATOS 1. 2. 3. 4. 5. 6. 7. 8. 9.
10. INTRODUCTION GAS DYNAMICS ELECTRON BEAM TRANSFER CONTRAST AND
RESOLUTION DETECTION CATHODOLUMINESCENCE X-RAYS BEAM IRRADIATION EFFECTS
OPERATION AND APPLICATIONS CONCLUSIONS ACKNOWLEDGEMENTS AND REFERENCES
14 15 19 23 25 29 29 31 33 41 42 VI 3. ESEM DEVELOPMENT AND APPLICATION
IN CULTURAL HERITAGE CONSERVATION 45 BY ERIC DOEHNE 1. INTRODUCTION 45
2. APPLICATIONS 47 2.1 SODIUM SULFATE DYNAMICS 47 2.2 FORMALDEHYDE
CORROSION 49 2.3 CLEANING THE SISTINE CHAPEL 53 2.4 DEAD SEA SCROLLS 53
3. ESEM AND SEM: OPERATIONAL DIFFERENCES 55 4. ESEM/EDS DEVELOPMENT
(1990-1997) 57 4.1 DYNAMIC IMAGING SYSTEM 57 4.2 STILL IMAGE SYSTEM 58
4.3 EDS ANALYSIS 59 5. FUTURE WORK 60 ACKNOWLEDGEMENTS AND REFERENCES 61
4. INTRINSIC POINT DEFECT CLUSTERING IN SI: A STUDY BY HVEM AND HREM
IN-SITU ELECTRON IRRADIATION 63 BY LUDMILA FEDINA, ANTON GUTAKOVSKII
ALEXANDER ASEEV, JOSEPH VAN LANDUYT AND JAN VANHELLEMONT 1. INTRODUCTION
63 2. EXPERIMENTAL DETAILS 65 3. RESULTS AND DISCUSSION 66 3.1 POINT
DEFECT CLUSTERING 66 3.2 POINT DEFECT CLUSTERING (500C-700C) BY HVEM
81 4. CONCLUSION 90 ACKNOWLEDGEMENTS AND REFERENCES 91 5. IN-SITU
OBSERVATION AND QUANTITATIVE ANALYSIS OF ELECTROMIGRATION VOID DYNAMICS
93 BY RICHARD FRANKOVIC AND GARY H. BERNSTEIN 1. INTRODUCTION 94 2.
SAMPLE FABRICATION AND IN-SITU TEST TECHNIQUE 96 3. SINGLE VOID BEHAVIOR
99 3.1 DIRECT VOID SHAPE CHANGES 99 3.2 SECONDARY, INDUCED VOIDS AND
HILLOCKS 103 /- VLL 4. VOID-VOID INTERACTIONS 108 4.1 QUAL ITATI VE
RESULTS 110 4.2 QUANTITATIVE RESULTS 110 5. VOID-HILLOCK INTERACTIONS
117 5.1 QUALITATIVE RESULTS 119 5.2 QUANTITATIVE RESULTS 120 6. SUMMARY
AND CONCLUSIONS 120 ACKNOWLEDGEMENTS AND REFERENCES 122 6. ENVIRONMENTAL
HIGH RESOLUTION ELECTRON MICROSCOPY (EHREM) IN MATERIALS SCIENCE 123 BY
PRATIBHA L. GAI AND EDWARD D. BOYES 1. INTRODUCTION 124 2. EXPERIMENTAL:
IN-SITU CONTROLLED ENVIRONMENTAL HIGH RESOLUTION TRANSMISSION EM (EHREM)
DEVELOPMENT FOR GAS-SOLID REACTIONS ON THE ATOMIC SCALE 126 3.
APPLICATIONS 128 3.1 GAS MOLECULE - SOLID SURFACE INTERACTIONS 128 3.2
SILICA BASED CERAMICS 131 CHEMICALLY STABILIZED CRISTOBALITE CERAMICS
131 3.3 EHREM OF COMPLEX CATALYSTS: 141 4. CONCLUSIONS 146
ACKNOWLEDGEMENTS AND REFERENCES 146 7. IN-SITU TRANSMISSION ELECTRON
MICROSCOPY OF THIN FILM GROWTH 149 BY J. MURRAY GIBSON 1. INTRODUCTION
149 2. ROLE OF *** IN STUDIES OF THIN FILM GROWTH 150 3. INSTRUMENTAL
APPROACHES 159 4. SOME RESULTS 165 5. CONCLUSIONS 169 ACKNOWLEDGEMENTS
AND REFERENCES 169 8. HREM IN-SITU EXPERIMENT AT VERY HIGH TEMPERATURES
173 BY TAKEO KAMINO AND HIROYASU SAKA 1. INTRODUCTION 173 2.
SPECIMEN-HEATING HOLDERS 174 VLLL 3. 4. 5. ELECTRON MICROSCOPE 177 HREM
OBSERVATION OF SI PARTICLE JUST BELOW THE MELTING POINT 179 FORMATION OF
SIC THROUGH SOLID STATE CHEMICAL REACTIONS BETWEEN SI AND GRAPHITE 181
5.1 SPECIMENS 181 5.2 RESULTS AND DISCUSSION 181 SINTERING OF SIC
CRYSTALS 186 SURFACE RECONSTRUCTION OF AU-DEPOSITED SI 191 7.1 SPECIMENS
191 7.2 RESULTS AND DISCUSSION 191 ACKNOWLEDGEMENTS AND REFERENCES 199
IN-SITU REM AND *** STUDIES OF HOMO AND HETERO-EPITAXY ON SI SURFACES
201 BY HIROKI MINODA AND KATSUMICHI YAGI 1. INTRODUCTION 2. EXPERIMENTAL
2.1 GENERAL REMARKS ON REM AND *** 2.2 SAMPLE PREPARATION 3. RESULTS AND
DISCUSSION 3.1 GROWTHS OF SI ON SI (111) SURFACES 3.2 GROWTHS OF GE ON
SI (111) SURFACES 3.3 GROWTHS OFGE ON SI (001) SURFACES 4. CONCLUSIONS
REFERENCES 10. ATOMIC-SCALE FABRICATION OF METAL SURFACES BY ADSORPTION
AND CHEMICAL REACTION 201 204 204 204 206 206 208 215 223 223 225 BY
KEN-ICHI TANAKA, YUJI MATSUMOTO, TAKAYA FUJITA AND YUJI OKAWA 1.
INTRODUCTION 2. FABRICATION OF METAL SURFACES BY PHYSICAL PROCESSES 3.
FABRICATION OF METAL SURFACES BY CHEMICAL REACTION 4. NANO-METER SCALE
PATTERNING BY CHEMICAL REACTIONS REFERENCES 226 228 240 251 259 11. HIGH
TEMPERATURE DYNAMIC BEHAVIOR OF SILICON SURFACES STUDIED BY SCANNING
TUNNELING MICROSCOPY (STM) 263 BY HIROSHI TOKUMOTO R** IX 1.
INTRODUCTION J 263 2. HIGH TEMPERATURE UHV-STM SYSTEM 264 3. HYDROGEN
DESORPTION PROCESS ON SI (111) SURFACE 264 4. (7X7) - (LXL) PHASE
TRANSITION ON SI (111) SURFACE 271 5. STEP SHIFTING UNDER DC ELECTRIC
FIELDS 275 6. CONCLUSIONS 280 ACKNOWLEDGEMENTS AND REFERENCES 281 12.
DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES
283 BY AKIRA TONOMURA 1. 2. 3. 4. INTRODUCTION EXPERIMENTAL METHOD 2.1
INTERFERENCE MICROSCOPY 2.2 LORENTZ MICROSCOPY OBSERVATION OF
SUPERCONDUCTING VORTICES 3.1 SUPERCONDUCTING VORTICES OBSERVED BY
INTERFERENCE MICROSCOPY 3.1.1 PROFILE MODE 3.1.2 TRANSMISSION MODE 3.2
SUPERCONDUCTING VORTICES OBSERVED BY LORENTZ MICROSCOPY 3.3 OBSERVATION
OF VORTEX INTERACTION WITH PINNING CENTERS 3.3.1 SURFACE STEPS 3.3.2
IRRADIATED POINT DEFECTS CONCLUSION REFERENCES 283 284 284 287 288 288
288 291 293 294 295 296 298 299 13. *** STUDIES OF SOME STRUCTURALLY
FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 BY RAY L.
WITHERS AND JOHN G. THOMPSON 1. INTRODUCTION 301 2. TETRAHEDRALLY
CORNER-CONNECTED FRAMEWORK STRUCTURES 302 3. TETRAGONAL A-PBO 311 4.
COMPOSITIONAL LY FLEXIBLE ANION-DEFICIENT FLUORITES AND THE DEFECT
FLUORITE TO C-TYPE SESQUIOXIDE TRANSITION 320 5. SUMMARY AND
CONCLUSIONS 327 ACKNOWLEDGEMENTS AND REFERENCES 327 AUTHOR INDEX 331
SUBJECT INDEX 333
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| spelling | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies ed. by Pratibha L. Gai Boston [u.a.] Kluwer 1997 XVIII, 336 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electron microscopy Materials Microscopy Scanning probe microscopy Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffprüfung (DE-588)4037934-6 s DE-604 Gai, Pratibha L. Sonstige oth GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008133760&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies Electron microscopy Materials Microscopy Scanning probe microscopy Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4014327-2 |
| title | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies |
| title_auth | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies |
| title_exact_search | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies |
| title_full | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies ed. by Pratibha L. Gai |
| title_fullStr | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies ed. by Pratibha L. Gai |
| title_full_unstemmed | In-situ microscopy in materials research leading international research in electron and scanning probe microscopies ed. by Pratibha L. Gai |
| title_short | In-situ microscopy in materials research |
| title_sort | in situ microscopy in materials research leading international research in electron and scanning probe microscopies |
| title_sub | leading international research in electron and scanning probe microscopies |
| topic | Electron microscopy Materials Microscopy Scanning probe microscopy Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Materials Microscopy Scanning probe microscopy Werkstoffprüfung Elektronenmikroskopie |
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