Procedures in scanning probe microscopies:
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Chichester [u.a.]
Wiley
1998
|
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XXXI, 639 S. Ill., graph. Darst. |
| ISBN: | 047195912X |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011945836 | ||
| 003 | DE-604 | ||
| 005 | 20210608 | ||
| 007 | t | ||
| 008 | 980515s1998 ad|| |||| 00||| eng d | ||
| 020 | |a 047195912X |9 0-471-95912-X | ||
| 035 | |a (OCoLC)39391694 | ||
| 035 | |a (DE-599)BVBBV011945836 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-384 |a DE-703 |a DE-91G |a DE-19 |a DE-83 |a DE-11 | ||
| 050 | 0 | |a QH212.S33 | |
| 082 | 0 | |a 502/.8/2 |2 21 | |
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a PHY 136f |2 stub | ||
| 245 | 1 | 0 | |a Procedures in scanning probe microscopies |c ed.: Richard J. Colton ... |
| 264 | 1 | |a Chichester [u.a.] |b Wiley |c 1998 | |
| 300 | |a XXXI, 639 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Scanning probe microscopy | |
| 650 | 0 | 7 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rastersondenmikroskopie |0 (DE-588)4330328-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Colton, Richard J. |4 edt | |
| 856 | 4 | 2 | |m HBZ Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008075853&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008075853 | ||
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| _version_ | 1804126532957896704 |
|---|---|
| adam_text | CONTENTS
Preface xvii
Editorial Board xix
List of Contributors xxi
Part 1: Instrumentation
(Part Editor: R. Guckenberger, W. Heckl) 1
Introduction 1
Chapter 1.1: Common Techniques and Problems in Scanning Probe Microscopies. 3
Module 1.1.1: Technical Tools 3
Procedure: Piezoelectric Actuators for Scanning Probe
Microscopy 3
Module 1.1.2: Test Structures and Calibration 9
Introduction 9
Procedure: Latex Projection Patterns 10
Procedure: Test Sample Structured by Metal Shadowing
using Salt Crystals as Mask 12
Procedure: Pt/C Coated Tobacco Mosaic Virus on Glass as a
Specimen for Testing SPM Tips 17
Module 1.1.3: Image Processing, Evaluation and Presentation. ... 22
Introduction 22
Procedure: Basics of Fourier Transformation, Convolution
and Correlation 24
Procedure: Correction of Specimen Tilt and Line Flattening . 32
Procedure: Real Space Filtering 34
Procedure: Fourier Filtering 37
Procedure: Averaging of SPM Images 40
Procedure: Resolution Assessment 44
Module 1.1.4: Well Known Artifacts Chapter 1.2: STM 50
Module 1.2.1: STM Designs Module 1.2.2: STM Signals and Imaging Modes (Including STM
Variants) 50
Introduction 50
Procedure: Conventional Imaging Modes 52
Procedure: Scanning Thermopower Microscopy: a Technique
for Organic and Biological Molecules Complementary to
STM 55
Procedure: Light Measurements 61
Module 1.2.3: Tips 65
Contents vi Introduction 65
Procedure: Overview of Electro Chemical Tip Etching
Methods 67
Procedure: Electro Chemical Etching of Au Tips 69
Procedure: Electro Chemical Etching of Ni Tips 73
Procedure: Manufacturing of W Tips 76
Procedure: Electro Chemical Etching of Au Coated W Tips . 78
Procedure: Electro Chemical Etching of Platinum Iridium
and Iridium Tips 81
Chapter 1.3: Atomic Force Microsocopy 85
(Chapter Editor: W. Heckl and O. Marti)
Introduction 85
Module 1.3.1: AFM Designs 86
Procedure: Ultrahigh Vacuum Scanning Force Microscopy
(UHV AFM) 86
Procedure: Design Principles of Fluid Cells 94
Procedure: AFM and Patch Clamp Technique 98
Module 1.3.2: AFM Signals and Imaging Modes 105
Procedure: Conventional Imaging 105
Procedure: Force Curves in Atomic Force Microscopy ... 110
Procedure: Tapping Mode in Liquids 113
Procedure: Friction and Lateral Forces 116
Module 1.3.3: Force Sensing Elements and Tips 122
Procedure: Bouncing Beam Detection 122
Procedure: Use of the High Linearity Position Sensing
Detector in Local AFM Force Measurements 129
Procedure: Force Calibration 133
Procedure: Laser Diode Detection 139
Module 1.3.4: Test Samples 146
Procedure: Preparation of a Compact Disk as a Calibration
Sample for AFM 146
Chapter 1.4: Scanning Near field Optical Microscopies Chapter 1.5: Scanning Electro Chemical Methods (Chapter Editor: A. Gewirth)
Part 2: Substrates (Part Editor: W. Heckl) 149
Chapter 2.1: General Requirements for Substrates 151
Introduction 151
Chapter 2.2: Conducting Substrates 153
Module 2.2.1: Graphite 153
Procedure: STM and AFM Imaging of Natural Graphite
Crystals and Highly Oriented Pyrolytic Graphite (HOPG) . 153
Contents vii
Module 2.2.2: Transition Metal Dichalcogenides 156
Introduction 156
Procedure: Molybdenite 158
Procedure: Tungstenite 160
Procedure: Hafnium Disulfide 161
Procedure: Tantalum Disulfide 162
Procedure: Lattice Resolution Imaging of the Layered
Dichalcogenide WSe2 by Atomic Force Microscopy and
Lateral Force Microscopy 164
Module 2.2.3: Thin Film Metal Layers 167
Procedure: Platinum Carbon, Pt C 167
Procedure: Silver Films 168
Module 2.2.4: Ultraflat Au Surfaces 169
Introduction 169
Procedure: Preparation of Template Stripped Gold (TSG) . . 170
Chapter 2.3: Insulating Substrates 176
Module 2.3.1: Mica 176
Module 2.3.2: Glass as a Substrate for Atomic Force Microscopy
Studies 180
Introduction 180
Module 2.3.3: Atomic Force Microscopy of Ionic Crystals 183
Procedure: AFM Imaging of Ionic Crystals 184
Chapter 2.4: Chemically Modified Substrates: Derivatized Surfaces 189
Module 2.4.1: Derivatized Silicon Oxide Surfaces 190
Procedure: Silanization, Imaging, and Patterning of
Derivatized Silicon Oxide Surfaces 190
Part 3: Inorganic Systems (Part Editor: B. Parkinson) 201
Introduction 202
Chapter 3.1: Elements 203
Module 3.1.1: Non metallic Elements Module 3.1.2: Coinage Metals 203
Module 3.1.3: Transition Metals Chapter 3.2: Oxides 204
Module 3.2.1: Binary Transition Metal Oxides 204
Procedure: STM Imaging of T O2 X( 110) 204
Procedure: STM Imaging of V2O5 (001) 207
Procedure: STM Imaging of Mo,8O52 (100) 210
Module 3.2.2: Binary Main Group Oxides 213
Procedure: STM Imaging of Conducting Metal Oxide
Superlattices 213
Module 3.2.3: Ternary Oxides 219
Contents viii
Procedure: STM Imaging of Conducting Molybdenum Oxide
Bronzes 219
Procedure: STM Imaging of Rbi/3WO3(0001) 222
Procedure: STM Imaging of Nao.82W03(001) 224
Procedure: STM Imaging of Transition Metal Oxides: SrTiO3 227
Module 3.2.4: Quaternary Oxides (HiTc supercon) Chapter 3.3: Chalcogenides 230
Module 3.3.1: Binary Main Group Chalcogenides InSePbS (Galena).
Module 3.3.2: Binary Transition Metal Chalcogenides 230
Procedure: STM Imaging of Layered Structure Metal
Dichalcogenides 230
Procedure: STM and AFM Imaging of Zinc Sulfide
Nanoclusters 239
Module 3.3.3: Ternary Chalcogenides 243
Procedure: AFM Imaging of Pure and Intercalated Lamellar
MPS3 Compounds (M = Mn, Cd, Fe, Ni) 243
Chapter 3.4: Pnictides Module 3.4.1: Main Group Pnictides Module 3.4.2: Transition Metal Pnictides Chapter 3.5: Halides Module 3.5.1: Main Group Halides Module 3.5.2: Transition Metal Halides Module 3.5.3: Alkali Metal and Alkali Earth Halides Module 3.5.4: Ternary Halides Chapter 3.6: Carbides, Silicides and Borides Module 3.6.1: Transition Metal Silicides Chapter 3.7: Intermetallics and Alloys Part 4: Electrochemistry
(Part Editor: A. Gewirth) 247
Introduction 248
Chapter 4.1: Electrochemical Surface Preparation Module 4.1.1: Au Surfaces Module 4.1.2: Ag Surfaces Module 4.1.3: Cu Surfaces Module 4.1.4: Pt Surfaces Module 4.1.5: Other Noble Metal Surfaces Module 4.1.6: Semiconductors Module 4.1.7: Other Materials
Contents ix
Chapter 4.2: Underpotential Deposition 251
Module 4.2.1: Cu Underpotential Deposition Module 4.2.2: Bismuth Underpotential Deposition 251
Procedure: AFM of Underpotentially Deposited Bi on Au(l 11) 251
Module 4.2.3: Pb Underpotential Deposition Module 4.2.4: Tl Underpotential Deposition Module 4.2.5: Cd Underpotential Deposition Module 4.2.6: Ag Underpotential Deposition Chapter 4.3: Halides Module 4.3.1: I on Au(ijk) Module 4.3.2: Br and Cl on Au(ijk) Module 4.3.2:1 on Pt(ijk) Module 4.3.4: Br and Cl on Pt(ijk) Module 4.3.5: I on Ag(ijk) Module 4.3.6: Br and Cl on Ag(ijk) Module 4.3.7: Halides on other Surfaces Chapter 4.4: Organics 257
Module 4.4.1: Oxygen Donors on Au 257
Procedure: Electropolymerization and STM Imaging of
Electrically Conductive Polymer Thin Films 257
Module 4.4.2: Sulfur Donors on Au Module 4.4.3: Nitrogen Donors on Au 262
Procedure: STM and AFM Imaging of DNA Bases in
Aqueous Solutions under Controlled Potential 262
Module 4.4.4: CO, CN, and SCN on Pt Module 4.4.4: Organic Molecules on Pt/I Surfaces Module 4.4.5: Organics on Cu Surfaces Module 4.4.6: Organics on Ag Surfaces Chapter 4.5: Oxides and Oxidation Module 4.5.1: Oxidation of Au(ijk) Module 4.5.2: Oxide Formation on Cu Module 4.5.3: Oxide Formation on Fe Module 4.5.4: Oxide Formation on Ni Chapter 4.6: Inorganic Overlayers Module 4.6.1: Silicotungstates Chapter 4.7: Semiconductors Module 4.7.1: Si Module 4.7.2: GaAs Module 4.7.3: Ge Module 4.7.4: High Band gap Semiconductors Chapter 4.8: Corrosion of Metals Module 4.8.1: Cu
Contents x
Module 4.8.2: Fe Module 4.8.3: Steel Module 4.8.4: Al Chapter 4.9: Bulk Deposition of Metals 267
Module 4.9.1: Cu 267
Procedure: In situ SPM Imaging of Bulk Copper
Electrodeposition 267
Module 4.9.2: Ni Module 4.9.3: Pb, Cd, Hg Module 4.9.4: Ag 273
Procedure: STM Directed Electro Chemical Deposition of
Metal Nanostructures 273
Part 5: Organic Systems (Part Editor: J. Frommer, W. Heckl) . 277
Chapter 5.1: General Considerations 279
Introduction 279
Chapter 5.2: Free Standing Crystals 281
Module 5.2.1: Atomic Force Microscopy of Organic Crystals. . . . 281
Procedure: AFM Imaging of Organic Crystals Materials
Selection 282
Procedure: Amino Acids, Nucleic Acids, Sucrose, Tetracene,
Lysozyme Procedure: Diacetylenes Chapter 5.3: Molecular Films and Assemblies 287
Module 5.3.1: Topography, Friction and Elasticity Measurements on
Organic Thin Films 287
Module 5.3.2: Langmuir Blodgett Films 297
Procedure: AFM of Langmuir Blodgett Films 297
Module 5.3.3: STM and AFM Imaging of Alkanethiolate Monolayers
at Gold Surfaces 303
Procedure: STM Imaging of Alkanethiolate Monolayers at
Gold Surfaces 303
Procedure: AFM Imaging of Alkanethiolate Monolayers at
Gold Surfaces 312
Procedure: STM Imaging and Etching of Alkanethiol
Multilayers on Gold Surfaces 320
Module 5.3.4: DNA Bases 324
Introduction 324
Procedure: STM Imaging of DNA Bases in Air and UHV. . 325
Module 5.3.5: Aromatics 332
Procedure: STM of Phthalocyanines and Perylene Derivatives 332
Module 5.3.6: Hydrocarbons and Alcohols 340
Introduction 340
Contents xi
Procedure: STM Imaging of Long Chain Alkanes 342
Procedure: STM Imaging of Long Chain Alcohols 344
Module 5.3.7: Liquid Crystals 346
Introduction 346
Procedure: STM Imaging of 8CB (n octylcyanobiphenyl) . . 347
Chapter 5.4: Molecular Mixtures Chapter 5.5: Organic Surface Treatments 352
Module 5.5.1: Silanization Part 6: Polymers (Part Editor: J. Rabe) 353
Chapter 6.1: General Considerations 355
Introduction 355
Chapter 6.2: Polymeric Materials 356
Module 6.2.1: Alkanes 356
Introduction 356
Procedure: AFM Imaging of the Lamellar Surface of n
Hexatriacontane C36H74 and n Tritriacontane C33H68
Crystals 357
Procedure: AFM Imaging of the Lamellar Surfaces of Cyclic
Alkanes (CH2)72, (CH2)48 358
Module 6.2.2: Semicrystalline Polymers 360
Introduction 360
Procedure: Spherulite Structure of Syndiotactic Polypropylene 361
Module 6.2.3: Epitaxially Crystallized Polymer Films 363
Introduction 363
Procedure: AFM Imaging of Epitaxially Crystallized Isotactic
Polypropylene 364
Procedure: AFM Imaging of Epitaxially Crystallized
Syndiotactic Polypropylene 366
Module 6.2.4: Rubbed Polymer Films 370
Procedure: Friction Transferred Polytetrafluoroethylene Thin
Films 370
Module 6.2.5: Spin Coated Polymer Films 373
Introduction 373
Procedure: STM Imaging of Spin Coated Liquid Crystalline
Polymer Films 375
Procedure: STM Imaging of Spin Coated Polystryene Films . 377
Module 6.2.6: Langmuir Blodgett Polymer Films Module 6.2.7: Drawn Polymer Fibres Module 6.2.8: Liquid Crystalline Polymers Module 6.2.9: Latex Film Surfaces 381
Procedure: Latex Film Surfaces Imaged by AFM 381
Module 6.2.10: Amorphous Polymers
Contents xii
Module 6.2.11: Block Copolymers Module 6.2.12: Polymer Blends Module 6.2.13: Conducting Polymers Chapter 6.3: Polymeric Composites Module 6.3.1: Carbon Fibre Composites Module 6.3.2: Other Composites Part 7: Biological Systems (Part Editor: A. Engel, H. Gaub) . . 385
Chapter 7.1: General Considerations 387
Chapter 7.2: DNA 389
Module 7.2.1: DNA by AFM 389
Procedure: Atomic Force Microscopy of DNA on Mica in
Air and Fluid 389
Procedure: Detergent Spreading of DNA on Mica Using
Nonionic and Cationic Detergents 394
Procedure: STM Imaging of DNA on a Chemically Modified
Au III Surface 398
Chapter 7.3: Proteins 402
Module 7.3.1: Myosin 402
Procedure: Myosin by AFM 402
Module 7.3.2: Lysozyme 405
Procedure: Imaging Lysozyme Adsorbed on Mica by Atomic
Force Microscopy 405
Module 7.3.3: Fibronectin 408
Procedure: Facile Procedure for Screening Nucleoproteins for
Imagibility 408
Module 7.3.4: Cytochrome 412
Procedure: STM Analysis of Cytochrome c Immobilized on
Self Assembled Monolayers on Gold 412
Module 7.3.5: Silanization (AFM) 418
Procedure: Simple Procedure for the Preparation of
Positively Charged Silanated Surfaces 418
Chapter 7.4: Supported Membranes 420
Module 7.4.1: Lipid Membranes 420
Procedure: Imaging Wet Phospholipid Membranes with the
AFM 420
Chapter 7.5: Protein Crystals 425
Module 7.5.1: Purple Membranes 425
Procedure: Preparation and Observation of Purple Membranes
by AFM 425
Contents xiii
Module 7.5.2: Porin Membranes 429
Procedure: Imaging of Reconstituted OmpF Porin in Solution
using AFM 429
Module 7.5.3: HPI 433
Procedure: AFM Imaging of HPI Layers in Buffer Solution . 433
Module 7.5.4: Catalase 440
Procedure: Imaging Pt/Ir/C and W Coated Freeze Dried
Catalase Crystals with STM 440
Module 7.5.5: Na+,K+ ATPase 445
Introduction 445
Procedure: Na+,K+ ATPase Imaging by AFM 446
Chapter 7.6: Filaments 452
Module 7.6.1: Microtubules 452
Procedure: Covalent Immobilization of Microtubules for
AFM Studies 452
Procedure: Preparation of Microtubules for Imaging in Buffer
Solution with the AFM Operated in Tapping Mode . . . 458
Module 7.6.2: Actin 460
Procedure: Preparation of Actin Filaments for Imaging in
Buffer Solution with the AFM Operated in Tapping Mode 460
Module 7.6.3: Intermediate Filaments 462
Procedure: AFM Imaging of Intermediate Filaments in Buffer
Solution 462
Chapter 7.7: Viruses 465
Module 7.7.1: Phage T4 Polyheads 465
Procedure: AFM Imaging of Bacteriophage T4 Polyheads in
Buffer Solution 465
Chapter 7.8: Bacteria 469
Module 7.8.1: Magnetotactic Bacteria 469
Procedure: Preparation of Magnetotactic Bacteria for Force
Modulation Atomic Force Microscopy 469
Chapter 7.9: Organelles 471
Module 7.9.1: Chromosomes 471
Procedure: Imaging Polytene Chromosomes 471
Module 7.9.2: Nematocysts 474
Procedure: AFM Imaging of Native Nematocysts
Immobilized in Nucleopore Filters 474
Chapter 7.10: Cells 478
Module 7.10.1: Platelets 478
Procedure: Preparation of Activated Platelets for AFM Imaging 478
Module 7.10.2: Monkey Kidney Chapter 7.11: Tissues, Organisms, Plants
Contents *iv
Module 7.11.1: Plant Cells Chapter 7.12: Immobilization Techniques 481
Module 7.12.1: General Method 481
Procedure: A General Method for Immobilizing
Biomolecules on Gold for SPM in Aqueous Buffers ... 481
Module 7.12.2: Chemical Fixation 488
Procedure: Light dependent Substrate Functionalization and
Biomacromolecule Immobilization 488
Module 7.12.3: Functionalized AP mica 493
Procedure: DNA, RNA and Nucleoprotein Complexes
Immobilized on AP mica and Imaged with AFM .... 493
Module 7.12.4: Tip Functionalization 497
Procedure: Functionalization of AFM Tips with Avidin. . . 497
Chapter 7.13: Intermolecular Forces 500
Module 7.13.1: DNA 500
Procedure: Quantitative Measurements of Molecular
Recognition Interaction Forces with the Scanning Force
Microscope 500
Part 8: Nanomanipulation Nanotechnology
(Part Editor: R. Colton) 507
Introduction 507
Chapter 8.1: Manipulation of Individual Atoms Chapter 8.2: Manipulation of Individual Molecules Chapter 8.3: Manipulation of Layered Materials Chapter 8.4: Manipulation of Thin Films Chapter 8.5: Manipulation of Charged Species Chapter 8.6: Manipulation of Magnetic Species Chapter 8.7: Nanolithography and Nanofabrication 511
Module 8.7.1: STM Low Voltage E Beam Lithography 511
Introduction 511
Procedure: STM Lithography in Resists 516
Procedure: STM Nanolithography with Microposit SAL 601™
Resist 519
Procedure: Nanofabrication of GaAs with STM Lithography
and Microposit SAL 601™ 524
Contents xv
Procedure: Nanofabrication with STM Lithography and Self
Assembling Organosilane Films 529
Module 8.7.2: Patterning on Passivated Semiconductor Surfaces. . . 535
Introduction 535
Procedure: Silicon Patterning via STM (NIST Procedure) . . 538
Procedure: Silicon Patterning via STM/AFM (NRL Procedure) 541
Procedure: Gallium Arsenide Patterning via STM 544
Module 8.7.3: STM Direct Writing of Nanostructures 546
Introduction 546
Procedure: Chemical Vapour Deposition with the STM . . . 548
Module 8.7.4: Surface Modification 553
Introduction 553
Procedure: Mechanical Surface Modification 555
Procedure: Thermal Surface Modification 558
Chapter 8.8: Application of SPM Technology Module 8.8.1: Nanoelectronics Module 8.8.2: Sensors Part 9: Materials Science on the Nanoscale
(Part Editor: R. Colton) 561
Introduction 561
Chapter 9.1: Tip Surface Interactions 565
Module 9.1.1: Surface Forces Module 9.1.2: Measuring Tip Surface Interactions 565
Introduction 565
Procedure: Measuring Tip Surface Interactions using
Displacement Control 568
Procedure: Measuring Tip Surface Interactions using Force
Control 575
Procedure: Materials Properties Measurements 582
Module 9.1.3: Theory and Simulation Chapter 9.2: Adhesion Chapter 9.3: Nanomechanics 585
Module 9.3.1: Nanoindentation 585
Introduction 585
Procedure: Selection of Cantilevers and Tips for
Nanoindentation 587
Procedure: Obtaining Raw Force Versus Separation Curve
Data 592
Procedure: Derivation of Quantitative Mechanical Properties 596
Module 9.3.2: Theory and Simulation Module 9.3.3: Friction Measurements
Contents xvi
Chapter 9.4: Nanotribology Chapter 9.5: Nanometrology 599
Module 9.5.1: Displacement Measurements Module 9.5.2: Tip Shape Measurement/Calibration Module 9.5.3: Pitch Measurements 599
Introduction 599
Procedure: SPM Pitch Measurement of a Diffraction Grating 601
Module 9.5.4: Line Profile Measurements 603
Introduction 603
Procedure: SPM Profile Measurement of a Photoresist Line . 605
Module 9.5.5: Surface Roughness Measurements 607
Introduction 607
Procedure: Procedure Obtaining Images for Surface Roughness
Measurements 608
Subject Index 619
Author Index 625
|
| any_adam_object | 1 |
| author2 | Colton, Richard J. |
| author2_role | edt |
| author2_variant | r j c rj rjc |
| author_facet | Colton, Richard J. |
| building | Verbundindex |
| bvnumber | BV011945836 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S33 |
| callnumber-search | QH212.S33 |
| callnumber-sort | QH 3212 S33 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6310 |
| classification_tum | PHY 136f |
| ctrlnum | (OCoLC)39391694 (DE-599)BVBBV011945836 |
| dewey-full | 502/.8/2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/2 |
| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01347nam a2200361 c 4500</leader><controlfield tag="001">BV011945836</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210608 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980515s1998 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">047195912X</subfield><subfield code="9">0-471-95912-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)39391694</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011945836</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S33</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/2</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 136f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Procedures in scanning probe microscopies</subfield><subfield code="c">ed.: Richard J. Colton ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester [u.a.]</subfield><subfield code="b">Wiley</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXXI, 639 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastersondenmikroskopie</subfield><subfield code="0">(DE-588)4330328-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Colton, Richard J.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HBZ Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008075853&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008075853</subfield></datafield></record></collection> |
| id | DE-604.BV011945836 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:18:57Z |
| institution | BVB |
| isbn | 047195912X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008075853 |
| oclc_num | 39391694 |
| open_access_boolean | |
| owner | DE-29T DE-384 DE-703 DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-83 DE-11 |
| owner_facet | DE-29T DE-384 DE-703 DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-83 DE-11 |
| physical | XXXI, 639 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Wiley |
| record_format | marc |
| spelling | Procedures in scanning probe microscopies ed.: Richard J. Colton ... Chichester [u.a.] Wiley 1998 XXXI, 639 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Colton, Richard J. edt HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008075853&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Procedures in scanning probe microscopies Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Procedures in scanning probe microscopies |
| title_auth | Procedures in scanning probe microscopies |
| title_exact_search | Procedures in scanning probe microscopies |
| title_full | Procedures in scanning probe microscopies ed.: Richard J. Colton ... |
| title_fullStr | Procedures in scanning probe microscopies ed.: Richard J. Colton ... |
| title_full_unstemmed | Procedures in scanning probe microscopies ed.: Richard J. Colton ... |
| title_short | Procedures in scanning probe microscopies |
| title_sort | procedures in scanning probe microscopies |
| topic | Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Scanning probe microscopy Rastersondenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008075853&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT coltonrichardj proceduresinscanningprobemicroscopies |