Proceedings:
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
1997
|
| Subjects: | |
| Item Description: | Nebent.: Records of the IEEE International Workshop on Memory Technology, Design and Testing |
| Physical Description: | IX, 103 S. Ill., graph. Darst. |
| ISBN: | 0818680997 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011811699 | ||
| 003 | DE-604 | ||
| 005 | 19980824 | ||
| 007 | t| | ||
| 008 | 980306s1997 xxuad|| |||| 10||| eng d | ||
| 020 | |a 0818680997 |9 0-8186-8099-7 | ||
| 035 | |a (OCoLC)245995124 | ||
| 035 | |a (DE-599)BVBBV011811699 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c US | ||
| 049 | |a DE-739 |a DE-83 | ||
| 084 | |a ST 175 |0 (DE-625)143603: |2 rvk | ||
| 111 | 2 | |a International Workshop on Memory Technology, Design and Testing |n 5 |d 1997 |c San José, Calif. |j Verfasser |0 (DE-588)5277770-4 |4 aut | |
| 245 | 1 | 0 | |a Proceedings |c International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ... |
| 246 | 1 | 3 | |a Records of the IEEE International Workshop on Memory Technology, Design and Testing |
| 246 | 1 | 3 | |a MTDT '97 |
| 246 | 1 | 3 | |a Memory technology, design and testing |
| 264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. |c 1997 | |
| 300 | |a IX, 103 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Nebent.: Records of the IEEE International Workshop on Memory Technology, Design and Testing | ||
| 650 | 0 | 7 | |a Mikroprogrammierung |0 (DE-588)4039231-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroprogrammierung |0 (DE-588)4039231-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Lombardi, Fabrizio |e Sonstige |4 oth | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-007976149 | |
Record in the Search Index
| _version_ | 1820882528862470144 |
|---|---|
| adam_text | |
| any_adam_object | |
| author_corporate | International Workshop on Memory Technology, Design and Testing San José, Calif |
| author_corporate_role | aut |
| author_facet | International Workshop on Memory Technology, Design and Testing San José, Calif |
| author_sort | International Workshop on Memory Technology, Design and Testing San José, Calif |
| building | Verbundindex |
| bvnumber | BV011811699 |
| classification_rvk | ST 175 |
| ctrlnum | (OCoLC)245995124 (DE-599)BVBBV011811699 |
| discipline | Informatik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV011811699</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19980824</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">980306s1997 xxuad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818680997</subfield><subfield code="9">0-8186-8099-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)245995124</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011811699</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 175</subfield><subfield code="0">(DE-625)143603:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Workshop on Memory Technology, Design and Testing</subfield><subfield code="n">5</subfield><subfield code="d">1997</subfield><subfield code="c">San José, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5277770-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="c">International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Records of the IEEE International Workshop on Memory Technology, Design and Testing</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">MTDT '97</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Memory technology, design and testing</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc.</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 103 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Nebent.: Records of the IEEE International Workshop on Memory Technology, Design and Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroprogrammierung</subfield><subfield code="0">(DE-588)4039231-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroprogrammierung</subfield><subfield code="0">(DE-588)4039231-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lombardi, Fabrizio</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007976149</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV011811699 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T17:08:20Z |
| institution | BVB |
| institution_GND | (DE-588)5277770-4 |
| isbn | 0818680997 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007976149 |
| oclc_num | 245995124 |
| open_access_boolean | |
| owner | DE-739 DE-83 |
| owner_facet | DE-739 DE-83 |
| physical | IX, 103 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | IEEE Computer Soc. |
| record_format | marc |
| spelling | International Workshop on Memory Technology, Design and Testing 5 1997 San José, Calif. Verfasser (DE-588)5277770-4 aut Proceedings International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ... Records of the IEEE International Workshop on Memory Technology, Design and Testing MTDT '97 Memory technology, design and testing Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 1997 IX, 103 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nebent.: Records of the IEEE International Workshop on Memory Technology, Design and Testing Mikroprogrammierung (DE-588)4039231-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Mikroprogrammierung (DE-588)4039231-4 s 1\p DE-604 Lombardi, Fabrizio Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings Mikroprogrammierung (DE-588)4039231-4 gnd |
| subject_GND | (DE-588)4039231-4 (DE-588)1071861417 |
| title | Proceedings |
| title_alt | Records of the IEEE International Workshop on Memory Technology, Design and Testing MTDT '97 Memory technology, design and testing |
| title_auth | Proceedings |
| title_exact_search | Proceedings |
| title_full | Proceedings International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ... |
| title_fullStr | Proceedings International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ... |
| title_full_unstemmed | Proceedings International Workshop on Memory Technology, Design and Testing ; ed. by F. Lombardi ... |
| title_short | Proceedings |
| title_sort | proceedings |
| topic | Mikroprogrammierung (DE-588)4039231-4 gnd |
| topic_facet | Mikroprogrammierung Konferenzschrift |
| work_keys_str_mv | AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif proceedings AT lombardifabrizio proceedings AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif recordsoftheieeeinternationalworkshoponmemorytechnologydesignandtesting AT lombardifabrizio recordsoftheieeeinternationalworkshoponmemorytechnologydesignandtesting AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif mtdt97 AT lombardifabrizio mtdt97 AT internationalworkshoponmemorytechnologydesignandtestingsanjosecalif memorytechnologydesignandtesting AT lombardifabrizio memorytechnologydesignandtesting |