Materials science applications of ion beam techniques: proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Uetikon-Zuerich
Trans Tech Publ.
1997
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| Schriftenreihe: | Materials science forum
248/249 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | 490 S. Ill., graph. Darst. |
| ISBN: | 0878497676 |
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| 245 | 1 | 0 | |a Materials science applications of ion beam techniques |b proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 |c ed.: A. G. Balogh ... |
| 264 | 1 | |a Uetikon-Zuerich |b Trans Tech Publ. |c 1997 | |
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| 490 | 1 | |a Materials science forum |v 248/249 | |
| 650 | 7 | |a Bombardement ionique - Applications industrielles - Congrès |2 ram | |
| 650 | 7 | |a Matériaux - Congrès |2 ram | |
| 650 | 4 | |a Ion bombardment |x Industrial applications |v Congresses | |
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Datensatz im Suchindex
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| adam_text | ATERIALS SCIENCE APPLICATIONS OF 9NBEAM PROCEEDINGS OF THE INTERNATIONAL
SYMPOSIUM ON MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES,
INCORPORATING THE 1ST GERMAN-AUSTRALIAN WORKSHOP ON ION BEAM ANALYSIS,
SEEHEIM, GERMANY, SEPTEMBER 9-12 1996, EDITORS: A.G. BALOGH AND G.
WALTER TRANS TECH PUBLICATIONS SWITZERLAND * GERMANY * UK * USA TABLE OF
CONTENTS CONFERENCE ORGANIZATION V SPONSORS AND EXHIBITORS VII PREFACE
IX TABLE OF CONTENTS XI CONFERENCE PHOTOS IXX BASIC PROCESSES ION BEAM
INDUCED AMORPHIZATION OF CRYSTALLINE SOLIDS: MECHANISMS AND MODELING H.
TRINKAUS 3 SURFACE EFFECT ON THE NATURE OF DAMAGE PRODUCTION IN
ION-IRRADIATED SOLIDS: A MOLECULAR DYNAMICS INVESTIGATION M. GHALY AND
R.S. AVERBACK 13 THE THERMAL SPIKE MODEL: A POSSIBLE WAY TO DESCRIBE THE
EFFECTS INDUCED IN Y 2 0 3 BY SWIFT HEAVY ION IRRADIATIONS CH. DUFOUR,
S. HEMON, F. GOURBILLEAU, E. PAUMIER AND E. DOORYHEE 21 STOPPING POWER
AND RANGE RELATIONS FOR LOW AND HIGH Z IONS IN SOLIDS: A CRITICAL
ANALYSIS H.S. VIRK AND G.S. RANDHAWA 33 MODELING OF ION IMPLANTATION AND
DIFFUSION IN SI M.-J. CATURLA, T. DIAZ DE LA RUBIA AND P.J. BEDROSSIAN
41 CRYSTAL-GRID INVESTIGATION OF ATOMIC COLLISION CASCADES IN IONIC
COMPOUNDS M. JENTSCHEL, K.H. HEINIG, H.G. BONIER AND * DOLL 49 THERMAL
SPIKE DESCRIPTION OF THE DAMAGE CREATION IN Y 3 AL 5 OI 2 INDUCED BY
SWIFT HEAVY IONS A. MEFTAH, M. DJEBARA, N. KHALFAOUI, J.P. STOQUERT, F.
STUDER AND M. TOULEMONDE 53 TRACK FORMATION IN METALS UNDER SWIFT HEAVY
ION BOMBARDMENT YU.N. YAVLINSKII 57 DIFFUSION IN ION IRRADIATED NICKEL:
DETERMINATION OF ATOMIC MIXING, SINK STRENGTH AND FRACTION OF FREELY
MIGRATING DEFECTS P. FIELITZ, M.-P. MACHT, V. NAUNDORF AND H.
WOLLENBERGER 61 ION BEAM MODIFICATIONS ION-BEAM MODIFICTION OF
SEMICONDUCTORS AND RELATED ELECTRONIC MATERIALS R.G. ELLIMAN 67 XII
MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES ION BEAM INDUCED
EPITAXIAL CRYSTALLIZATION OF BURIED SIC LAYERS IN SILICON J.K.N.
LINDNER, K. VOLZ AND B. STRITZKER 73 ION BEAM INDUCED EPITAXIAL REGROWTH
AND INTERFACIAL AMORPHIZATION OF COMPOUND SEMICONDUCTORS E. GLASER, *.
FEHLHABER, R. SCHULZ AND *. BACHMANN 79 EFFECTS OF ION IRRADIATION ON
FERROMAGNETIC THIN FILMS J.E.E. BAGLIN, M.H. TABACNIKS, R. FONTANA, A.J.
KELLOCK AND T.T. BARDIN 87 SPECIAL SURFACE STRUCTURES IN SURFACE ALLOY
GROWTH D.J. O CONNOR, J. YAO AND Y.G. SHEN 95 CHARGE CARRIER LIFETIME
MODIFICATION IN SILICON BY HIGH ENERGY H , HE + ION IMPLANTATION N.Q.
KHAENH, P. TUETTOE, E.N. JAEROLI, O. BUIU, L.P. BIRO, F. PAESZTI, T. MOHAECSY,
C. KOVACSICS, A. MANUABA AND J. GYULAI 101 RANGE PARAMETERS OF ALUMINIUM
IMPLANTED TARGETS M. HAYES, E. FRIEDLAND AND T. HAEUSER 107
IDENTIFICATION OF BANDGAP STATES IN SEMICONDUCTORS BY TRANSMUTATION OF
IMPLANTED RADIOACTIVE TRACERS N. ACHTZIGER 113 HALL EFFECT MEASUREMENTS
ON TRANSMUTATION DOPED SEMICONDUCTORS G. ROHRLACK, *. FREITAG, CH. VON
NATHUSIUS, R. VIANDEN, R. GWILLIAM AND B.J. SEALY 119 CHARACTERIZATION
OF CU/AL 2 0 3 INTERFACES AFTER HEAVY ION IRRADIATION K. NEUBECK, M.
RODEWALD, R. RIEMENSCHNEIDER, D.M. RUECK, H. BAUMANN, H. HAHN AND A.G.
BALOGH 125 IN-DEPTH CHARACTERIZATION OF DAMAGE PRODUCED BY SWIFT HEAVY
ION IRRADIATION USING A TAPPING MODE ATOMIC FORCE MICROSCOPE L.P. BIRO,
J. GYULAI AND K. HAVANCSAEK 129 HARDNESS ENHANCEMENT AND CROSSLINKING
MECHANISMS IN POLYSTYRENE IRRADIATED WITH HIGH ENERGY ION-BEAMS E.H.
LEE, G.R. RAO AND L.K. MANSUR 135 DIFFUSION STUDIES IN POLYMERS USING
MEV ION BEAMS A.S. CLOUGH, D.W. DREW, M. VAN DER GRINTEN, P.M. JENNESON
AND *.*. SHEARMUR 147 ION INDUCED PASSIVATION OF METAL SURFACES: THE
PHENOMENON AND ITS ORIGINS J.E.E. BAGLIN, M.H. TABACNIKS, A.J. KELLOCK,
N.S. SOMCIO AND T.T. BARDIN 155 CONTENTS XIII FLUX PINNING BY COLUMNAR
DEFECTS IN BI 2 SR 2 CACU 2 0 8 -THIN FILMS F. HILLMER, G. WIRTH, P.
HAIBACH, U. FREY, TH. KLUGE, G. JAKOB AND H.ADRIAN 159 DEPTH RESOLVED
OXYGEN ANALYSIS AT THE INTERFACES OF AU-AL LAYERS A. MARKWITZ AND G.
DEMORTIER 163 SUBSTRATE INFLUENCE ON TOPOGRAPHY AND CHEMICAL COMPOSITION
OF THIN METAL FILMS PRODUCED BY MEANS OF SELF-ION ASSISTED DEPOSITION
I.S. TASHLYKOV, V. VISHNYAKOV AND A. WIRTH 167 RADIATION DAMAGE AND
AMORPHIZATION MECHANISMS IN XE + IRRADIATED CUINSE 2 SINGLE CRYSTALS
M.V. YAKUSHEV, LS. TASHLYKOV, R.D. TOMLINSON, A.E. HILL AND R.D.
PILKINGTON 171 ION BEAM MIXING IN EPITAXIAL AG/FE/AG-(001)-LAYERS
INVESTIGATED WITH FERROMAGNETIC RESONANCE AND X-RAY-DIFFRACTION D.
KUROWSKI, J. PELZL, K. BRAND, P. SONNTAG AND P. GRUENBERG 177 THERMAL
DEPTH PROFILING OF NICKEL AFTER HE-ION IRRADIATION D. KUROWSKI, G.
KALUS, K. BRAND, B.K. BEIN AND J. PELZL 181 THE ROLE OF SURFACE CARBON
CONTAMINATION ON THE TRIBOLOGICAL PROPERTIES OF ION-IMPLANTED *****
BEARING STEEL A. FAUSSEMAGNE, A. BENYAGOUB, PH. KAPSA, H. JAFFREZIC AND
G. MAREST 185 ION IMPLANTATION INTO STAINLESS STEEL - DEPTH SELECTIVE
PHASE ANALYSIS WITH AN IMPROVED MOESSBAUER TECHNIQUE G. WALTER, B. STAHL,
R. GELIERT, R. NAGEL, D.M RUECK, G. KLINGELHOEFER AND E. KRANKELEIT 189
FORMATION OF ALUMINUM GRADIENT FILMS ON STAINLESS STEEL BY ION
IMPLANTATION R.M. HAUSNER, H. BAUMANN, *. BETHGE, F. NOLI AND P.
MISAELIDES 193 STUDIES ON ION BEAM MODIFICATION AND ANALYSIS USING THE
BUCHAREST CYCLOTRON B. CONSTANTINESCU, * SARBU, E. IVANOV, D. PLOSTINARU
AND R. BUGOI 197 MICROSTRUCTURE AND TRIBOLOGY OF CARBON IMPLANTED
HIGH-SPEED-STEEL F. JAEHRLING, G. WALTER, D.M. RUECK AND H. FUESS 201
INVESTIGATION OF HIGH FLUENCE CARBON ION IMPLANTED TITANIUM A. KOENIGER,
A. WENZEL, *. HAMMERL AND B. RAUSCHENBACH 205 DEPHT DISTRIBUTIONS AND
WEAR BEHAVIOUR OF ION IMPLANTED TI6A14V H. SCHMID, H. BAUMANN AND D.M.
RUECK 209 DEFECT FORMATION IN IRRADIATED NANOSTRUCTURED MATERIALS M.
ROSE, A.G. BALOGH AND H. HAHN 213 XIV MATERIALS SCIENCE APPLICATIONS OF
ION BEAM TECHNIQUES TIN COATINGS FORMED BY DUAL BEAM IBAD TECHNIQUE B.
RAJCHEL, J. STANEK, E. WANTUCH, T. BURAKOWSKI, J. FEDOTOVA AND A.
SELLMANN 217 CREATION OF THE DLC LAYER BY THE DUAL BEAM IBAD TECHNIQUE
B. RAJCHEL, J. STANEK, E. WANTUCH, T. BURAKOWSKI, J. FEDOTOVA, M.
DRWI^GA, E. LIPINSKA AND A. SELLMANN 221 APPLICATION OF HIGH ENERGY ION
BEAMS FOR LOCAL LIFETIME CONTROL IN SILICON P. HAZDRA AND J. VOBECKY 225
ION IMPLANTATION INDUCED DAMAGE ACCUMULATION STUDIED BY RUTHERFORD
BACKSCATTERING SPECTROMETRY AND SPECTROSCOPIC ELLIPSOMETRY T. LOHNER,
N.Q. KHAENH, P. PETRIK, M FRIED, E. KOTAI AND J. GYULAI 229 PLASMA
IMMERSION ION IMPLANTATION OF NITROGEN INTO POROUS SILICON LAYERS A.
MANUABA, I. PINTER, E. SZILAEGYI, G. BATTISTIG, C. ORTEGA, A. GROSMAN AND
G. AMSEL 233 FORMATION OF BURIED SIC LAYERS IN SILICON BY ION BEAM
SYNTHESIS K. VOLZ, J.K.N. LINDNER AND B. STRITZKER 237 LATTICE DAMAGE OF
RELAXED SI BX GE X ALLOYS OF VARIOUS COMPOSITION IMPLANTED WITH 2 MEV SI
IONS J.K.N. LINDNER 241 AUGER DEPTH PROFILING WITH GOOD DEPTH RESOLUTION
OF LOW ENERGY IMPLANTATION INDUCED ION MIXING A. SULYOK, A. GALISOVA AND
M. MENYHARD 245 DEFECT FORMATION BY LOW ENERGY IONS DURING SPUTTER
DEPOSITION OF TIW AND AU ON EPITAXIALLY GROWN N-SI AT DIFFERENT PLASMA
PRESSURES P.N.K. DEENAPANRAY, F.D. AURET, G. MYBURG, M. HAYES, W.E.
MEYER AND * SCHUTTE 249 PULSED ELECTRON BEAM ANNEALING OF GAAS AFTER
HIGH DOSE IMPLANTATION OF HYDROGEN T. HAEUSER, L. BREDELL, H. GAIGHER, H.
ALBERTS, A. BOTHA, M. HAYES AND E. FRIEDLAND 253 DOSE RATE AND
TEMPERATURE DEPENDENCE OF THE CRYSTALLIZATION RATE DURING IBIEC IN INAS
R. SCHULZ, *. FEHLHABER, E. GLASER AND F. SCHREMPEL 257 DAMAGE
PRODUCTION IN ION IMPLANTED HI-V COMPOUNDS: A COMPARATIVE STUDY E.
WENDLER 261 THE BEHAVIOUR OF 12 B IN CDTE STUDIED WITH SS-NMR TECHNIQUES
E. OLDEKOP, V. EYERT, F. NIEDERMEYER, M. WIENECKE AND W.-D. ZEITZ 267
CONTENTS XV ION BEAM AND ELECTRICAL CONDUCTIVITY ANALYSIS OF
NANOCRYSTALLINE A-BN AND *-*1 2 ** CERAMICS IMPLANTED WITH TI +N IONS
AND ANNEALED S.M. DUVANOV, A.V. KABYSHEV AND A.P. KOBZEV 271 NUCLEATION
AND GROWTH OF THE AMORPHOUS PHASE IN NA-IRRADIATED QUARTZ F. HARBSMEIER
AND W. BOISE 279 VACANCY TYPE DEFECTS IN PROTON IRRADIATED SIC W. PUFF,
A.G. BALOGH, P. MASCHER AND H.BAUMANN 285 ON THE AMORPHIZATION OF THE
SI/GE SUPERLATTICES UPON ION BOMBARDMENT N.A. SOBOLEV, K. GAERTNER, U.
KAISER, U. KOENIG, H. PRESTING, B. WEBER, E. WENDLER AND W. WESCH 289 ION
BEAM ANALYSIS APPLICATION OF HIERDA TO STRONTIUM BISMUTH TANTALATE
FERROELECTRIC FILMS P.N. JOHNSTON, W.B. STANNARD, J.F. SCOTT, I.F. BUBB,
M. EL BOUANANI, D.D. COHEN AND N. DYTLEWSKI 295 VOID FORMATION AND
SURFACE RIPPLING IN GE INDUCED BY HIGH ENERGETIC AU IRRADIATION H.
HUBER, W. ASSMANN, R. GROETZSCHEL, H.D. MIESKES, A. MUECKLICH, H. NOLTE
AND W. PRUSSEIT 301 MICRO-IBA AND MICRO-AMS FOR GEOLOGICAL MATERIALS
S.H. SIE, T.R. NIKLAUS AND G.F. SUTER 313 LONG AND SHORT RANGE ORDER IN
ION IRRADIATED CERAMICS STUDIED BY IBA, EXAFS AND RAMAN W. BOISE, J.
CONRAD, F. HARBSMEIER, M. BOROWSKI AND T. RODLE 319 PROGRESS IN
NON-STANDARD DEFECT ANALYSIS BY RBS K. GAERTNER 327 HEAVY ION RECOIL TIME
OF FLIGHT METHOD FOR MATERIALS ANALYSIS D. COHEN, N. DYTLEWSKI, J.
MARTIN AND R. SIEGELE 333 TRANSITION-METAL SUICIDE LAYER FORMATION, THE
PHASES OF MIXED SILICIDES I. DEZSI, CS. FETZER, LS. SZUECS, J. DEKOSTER
AND G. LANGOUCHE 339 COMPOSITION AND STRUCTURE OF CODEPOSITED LAYERS ON
PLASMA FACING COMPONENTS IN CONTROLLED FUSION DEVICES: ION BEAM AND
MICROSCOPY STUDIES M. RUBEL AND P. WIENHOLD 345 ION-BEAM ANALYSIS OF
SOLAR-CELL MATERIALS H. METZNER 351 XVI MATERIALS SCIENCE APPLICATIONS
OF ION BEAM TECHNIQUES EVALUATION OF COATINGS PRODUCED BY LOW-ENERGY ION
ASSISTED DEPOSITION OF CO ON SILICON LS. TASHLYKOV, G. CARTER AND J.S.
COLLIGON 357 APPLICATION OF THE COMBINED CHANNELING METHOD AT HIGHER ION
ENERGIES ON CYCLOTRON F. DITR6I,J.D. MEYER, R.W. MICHELMANN AND K.
BETHGE 361 CORROSION DEPTH PROFILES BY RUTHERFORD BACKSCATTERING
SPECTROMETRY AND SYNCHROTRON X-RAY REFLECTOMETRY E. SZILAEGYI, L.
BOTTYAEN, L. DEAEK, E. GERDAU, V.N. GITTSOVICH, A. GROF, E. KOETAI, O.
LEUPOLD, D.L. NAGY AND V.G. SEMENOV 365 HYDROGEN ELASTIC RECOIL
DETECTION DEPTH RESOLUTION AND SENSITIVITY AS A FUNCTION OF SAMPLE
COMPOSITION L.S. WIELUNSKI, G.L. HARDING AND A. BENDAVID 369
INVESTIGATION OF THE MORPHOLOGY OF POROUS SILICON BY RUTHERFORD
BACKSCATTERING SPECTROMETRY E. SZILAEGYI, Z. HAJNAL, F. PAESZTI, O. BUIU,
G. CRACIUN, C. COBIANU, C. SAVANIU AND *. VAEZSONY I 373 COMBINING RBS
AND FTIR SPECTROSCOPY FOR THE GE ANALYSIS IN SI^GE* SINGLE CRYSTALS A.
GERHARDT, J. DONECKER, B. SEILE AND J. WOLLWEBER 377 HYDROGEN AND
NITROGEN LOSS DURING ERD ANALYSIS OF SILICON (OXY)NITRIDES S.G. WALLACE,
A.C. KOCKELKOREN, M.G. BOUDREAU, P. MASCHER, J.S. FORSTER AND J.A.
DAVIES 381 COMPOSITION AND STRUCTURAL EVOLUTION OF AL-ME ALLOYS (ME =
FE, CU, SB) PREPARED BY MEANS OF ULTRARAPID QUENCHING FROM THE MELT
STUDIED BY RBS TECHNIQUE V. SHEPELEVICH AND I. TASHLYKOVA-BUSHKEVICH 385
DIFFUSION OF WATER INTO QUARTZ AND SILICA GLASS O. DERSCH, A. ZOUINE, F.
RAUCH AND E. ARAI 389 LATTICE LOCATION OF HF IN NEAR-STOICHIOMETRIC
LINB0 3 : RBS/CHANNELING AND *** STUDIES J.G. MARQUES, A. KLING, L.
REBOUTA, M.F. DA SILVA, A.A. MELO, J.C. SOARES, M.D. SERRANO, E. DIEGUEZ
AND F. AGULLOE-LOEPEZ 395 (1 - 3) MEV / AMU HEAVY ION IRRADIATION EFFECTS
ON OPTICAL PROPERTIES OFAL 2 0 3 V.A. SKURATOV, S.M. ABU-AL AZM AND V.A.
ALTYNOV 399 ION BEAM ANALYSIS AND APPLICATIONS IN ON-LINE MONITORING OF
ION INDUCED MODIFICATIONS OF MATERIALS D.K. AVASTHI 405 CONTENTS XVII
THIN-FILM MORPHOLOGY AND RUTHERFORD BACKSCATTERING SPECTROMETRY TH.
HAHN, H. METZNER, M. GOSSLA AND J. CONRAD 409 ELECTRONIC SPUTTERING AND
DESORPTION EFFECTS IN TOF-SIMS STUDIES USING SLOW HIGHLY CHARGED IONS
LIKE AU T. SCHENKEL, M.A. BRIERE, H. SCHMIDT-BOECKING, *. BETHGE AND D.
SCHNEIDER 413 ION CHANNELING STUDY OF GAN SINGLE CRYSTALS A. TUROS, L.
NOWICKI, A. STONERT, M. LESZCZYNSKI, I. GRZEGORY AND S.POROWSKI 419 NEW
TECHNICAL DEVELOPMENTS AND INDUSTRIAL APPLICATIONS HIGHLY FOCUSED ION
BEAMS IN INTEGRATED CIRCUIT TESTING K.M. HORN, P.E. DODD AND B.L. DOYLE
427 ATOMIC STRUCTURE AND ELECTRICAL PROPERTIES OF A SUPERTIP GAS
FIELD-ION SOURCE TH. MILLER, A. KNOBLAUCH AND S. KALBITZER 433 HIGH
ENERGY ION MICROPROBES: WHERE ARE WE GOING ? T. BUTZ AND R.-H. FLAGMEYER
439 APPLICATION OF HIGHLY FOCUSED ION BEAMS L. BISCHOFF AND J. TEICHERT
445 USE OF AN ULTRA-HIGH RESOLUTION MAGNETIC SPECTROGRAPH FOR MATERIALS
RESEARCH D.O. BOERMA, W.M. ARNOLDBIK AND W. WOLFSWINKEL 451 ION BEAM
ANALYSIS WITH MONOLAYER DEPTH RESOLUTION H.D. CARSTANJEN 459
APPLICATIONS OF ION TRACK FILTERS S. AMRITA KAUR, H.S. VIRK AND S.K.
CHAKARVARTI 467 THEORETICAL AND EXPERIMENTAL STUDY OF THE STATIONARY AND
KINETIC CHARACTERISTICS OF THE THERMO-FIELD ION SOURCES N.V. EGOROV AND
B.V. YAKOVLEV 471 STATUS OF A NEW ANALYTICAL FACILITY BASED ON THE 2 MEV
ELECTROSTATIC ACCELERATOR IN THE INSTITUTE OF APPLIED PHYSICS I.
KARNAUKHOV, O. EHICHEV, P. GLADKIKH, S. LEBED, V. MIROSHNICHENKO, A.
MYTSYKOV, A. SHCHERBAKOV AND V. STORIZHKO 477 AUTHOR INDEX 481 KEYWORD
INDEX 487
|
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| callnumber-raw | TA401.3 |
| callnumber-search | TA401.3 |
| callnumber-sort | TA 3401.3 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UP 9350 ZM 1900 |
| classification_tum | FER 786f |
| ctrlnum | (OCoLC)37365225 (DE-599)BVBBV011766450 |
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| discipline | Physik Fertigungstechnik Werkstoffwissenschaften / Fertigungstechnik |
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| genre | (DE-588)1071861417 Konferenzschrift 1996 Seeheim-Jugenheim gnd-content |
| genre_facet | Konferenzschrift 1996 Seeheim-Jugenheim |
| id | DE-604.BV011766450 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:15:24Z |
| institution | BVB |
| institution_GND | (DE-588)1901272-X (DE-588)1901271-8 |
| isbn | 0878497676 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007940085 |
| oclc_num | 37365225 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM DE-703 DE-83 |
| owner_facet | DE-91G DE-BY-TUM DE-703 DE-83 |
| physical | 490 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Trans Tech Publ. |
| record_format | marc |
| series | Materials science forum |
| series2 | Materials science forum |
| spelling | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 ed.: A. G. Balogh ... Uetikon-Zuerich Trans Tech Publ. 1997 490 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials science forum 248/249 Bombardement ionique - Applications industrielles - Congrès ram Matériaux - Congrès ram Ion bombardment Industrial applications Congresses Materials Research Congresses Ionenstrahlbearbeitung (DE-588)4277034-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 Seeheim-Jugenheim gnd-content Ionenstrahlbearbeitung (DE-588)4277034-8 s DE-604 Balogh, A. G. Sonstige oth International Symposium on Materials Science Applications of Ion Beam Techniques 1996 Seeheim Sonstige (DE-588)1901272-X oth German Australian Workshop on Ion Beam Analysis 1 1996 Seeheim Sonstige (DE-588)1901271-8 oth Materials science forum 248/249 (DE-604)BV001902147 248/249 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007940085&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 Materials science forum Bombardement ionique - Applications industrielles - Congrès ram Matériaux - Congrès ram Ion bombardment Industrial applications Congresses Materials Research Congresses Ionenstrahlbearbeitung (DE-588)4277034-8 gnd |
| subject_GND | (DE-588)4277034-8 (DE-588)1071861417 |
| title | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 |
| title_auth | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 |
| title_exact_search | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 |
| title_full | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 ed.: A. G. Balogh ... |
| title_fullStr | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 ed.: A. G. Balogh ... |
| title_full_unstemmed | Materials science applications of ion beam techniques proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 ed.: A. G. Balogh ... |
| title_short | Materials science applications of ion beam techniques |
| title_sort | materials science applications of ion beam techniques proceedings of the international symposium on materials science applications of ion beam techniques seeheim germany september 9 12 1996 |
| title_sub | proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, Seeheim, Germany, September 9 - 12 1996 |
| topic | Bombardement ionique - Applications industrielles - Congrès ram Matériaux - Congrès ram Ion bombardment Industrial applications Congresses Materials Research Congresses Ionenstrahlbearbeitung (DE-588)4277034-8 gnd |
| topic_facet | Bombardement ionique - Applications industrielles - Congrès Matériaux - Congrès Ion bombardment Industrial applications Congresses Materials Research Congresses Ionenstrahlbearbeitung Konferenzschrift 1996 Seeheim-Jugenheim |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007940085&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV001902147 |
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