Influence of temperature on microelectronics and system reliability:
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boca Raton [u.a.]
CRC Press
1997
|
| Series: | The electronic packaging series
|
| Subjects: | |
| Physical Description: | [20], 307 S. Ill., graph. Darst. |
| ISBN: | 0849394503 |
Staff View
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Record in the Search Index
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| author | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. |
| author_facet | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. |
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| id | DE-604.BV011485091 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:10:34Z |
| institution | BVB |
| isbn | 0849394503 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007727019 |
| oclc_num | 247520360 |
| open_access_boolean | |
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| owner_facet | DE-29T DE-703 DE-858 DE-83 |
| physical | [20], 307 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | CRC Press |
| record_format | marc |
| series2 | The electronic packaging series |
| spelling | Lall, Pradeep Verfasser aut Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim Boca Raton [u.a.] CRC Press 1997 [20], 307 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier The electronic packaging series Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Temperatur (DE-588)4059427-0 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s Temperatur (DE-588)4059427-0 s DE-604 Pecht, Michael G. Verfasser aut Hakim, Edward B. Verfasser aut |
| spellingShingle | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. Influence of temperature on microelectronics and system reliability Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Temperatur (DE-588)4059427-0 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4039207-7 (DE-588)4059427-0 |
| title | Influence of temperature on microelectronics and system reliability |
| title_auth | Influence of temperature on microelectronics and system reliability |
| title_exact_search | Influence of temperature on microelectronics and system reliability |
| title_full | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_fullStr | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_full_unstemmed | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_short | Influence of temperature on microelectronics and system reliability |
| title_sort | influence of temperature on microelectronics and system reliability |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Temperatur (DE-588)4059427-0 gnd |
| topic_facet | Zuverlässigkeit Mikroelektronik Temperatur |
| work_keys_str_mv | AT lallpradeep influenceoftemperatureonmicroelectronicsandsystemreliability AT pechtmichaelg influenceoftemperatureonmicroelectronicsandsystemreliability AT hakimedwardb influenceoftemperatureonmicroelectronicsandsystemreliability |