How to count patents and value intellectual property: uses of patent renewal and application data
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Cambridge, Mass.
1996
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| Series: | National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series
5741 |
| Subjects: | |
| Online Access: | Volltext |
| Physical Description: | 30, 1 S. graph. Darst. |
Staff View
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| indexdate | 2024-07-09T18:05:57Z |
| institution | BVB |
| language | English |
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| physical | 30, 1 S. graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
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| series | National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series |
| series2 | National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series |
| spelling | Lanjouw, Jean O. Verfasser aut How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam Cambridge, Mass. 1996 30, 1 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series 5741 Ökonometrisches Modell Intellectual property Valuation Patents Valuation Econometric models Pakes, Ariel Verfasser (DE-588)128970138 aut Putnam, Jonathan Verfasser aut Erscheint auch als Online-Ausgabe National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series 5741 (DE-604)BV002801238 5741 http://papers.nber.org/papers/w5741.pdf kostenfrei Volltext |
| spellingShingle | Lanjouw, Jean O. Pakes, Ariel Putnam, Jonathan How to count patents and value intellectual property uses of patent renewal and application data National Bureau of Economic Research <Cambridge, Mass.>: NBER working paper series Ökonometrisches Modell Intellectual property Valuation Patents Valuation Econometric models |
| title | How to count patents and value intellectual property uses of patent renewal and application data |
| title_auth | How to count patents and value intellectual property uses of patent renewal and application data |
| title_exact_search | How to count patents and value intellectual property uses of patent renewal and application data |
| title_full | How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam |
| title_fullStr | How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam |
| title_full_unstemmed | How to count patents and value intellectual property uses of patent renewal and application data Jean O. Lanjouw ; Ariel Pakes ; Jonathan Putnam |
| title_short | How to count patents and value intellectual property |
| title_sort | how to count patents and value intellectual property uses of patent renewal and application data |
| title_sub | uses of patent renewal and application data |
| topic | Ökonometrisches Modell Intellectual property Valuation Patents Valuation Econometric models |
| topic_facet | Ökonometrisches Modell Intellectual property Valuation Patents Valuation Econometric models |
| url | http://papers.nber.org/papers/w5741.pdf |
| volume_link | (DE-604)BV002801238 |
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