Hot carrier effects in MOS devices:
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
San Diego [u.a.]
Academic Press
1995
|
| Subjects: | |
| Item Description: | Literaturverz. S. 187 - 301 |
| Physical Description: | XII, 312 S.: graph. Darst. |
| ISBN: | 0126822409 |
Staff View
MARC
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| 245 | 1 | 0 | |a Hot carrier effects in MOS devices |c Eji Takeda; Cary Y. Yang; Akemi Miura-Hamada |
| 246 | 1 | 3 | |a Hot-carrier effects in MOS devices |
| 264 | 1 | |a San Diego [u.a.] |b Academic Press |c 1995 | |
| 300 | |a XII, 312 S.: graph. Darst. | ||
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| 337 | |b n |2 rdamedia | ||
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| 700 | 1 | |a Yang, Cary Y. |e Verfasser |4 aut | |
| 700 | 1 | |a Miura-Hamada, Akemi |e Verfasser |4 aut | |
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Record in the Search Index
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| author | Takeda, Eiji Yang, Cary Y. Miura-Hamada, Akemi |
| author_facet | Takeda, Eiji Yang, Cary Y. Miura-Hamada, Akemi |
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| author_sort | Takeda, Eiji |
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| building | Verbundindex |
| bvnumber | BV011058344 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.99.M44 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 358f |
| ctrlnum | (OCoLC)32738829 (DE-599)BVBBV011058344 |
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| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/225 |
| dewey-search | 537.6/225 |
| dewey-sort | 3537.6 3225 |
| dewey-tens | 530 - Physics |
| discipline | Physik Elektrotechnik |
| format | Book |
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| id | DE-604.BV011058344 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T18:03:17Z |
| institution | BVB |
| isbn | 0126822409 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007405906 |
| oclc_num | 32738829 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-1050 DE-706 |
| owner_facet | DE-91 DE-BY-TUM DE-1050 DE-706 |
| physical | XII, 312 S.: graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Academic Press |
| record_format | marc |
| spelling | Takeda, Eiji Verfasser aut Hot carrier effects in MOS devices Eji Takeda; Cary Y. Yang; Akemi Miura-Hamada Hot-carrier effects in MOS devices San Diego [u.a.] Academic Press 1995 XII, 312 S.: graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 187 - 301 Hot carriers Metal oxide semiconductors Heißes Elektron (DE-588)4159455-1 gnd rswk-swf MOS-Schaltung (DE-588)4135571-4 gnd rswk-swf MOS-Schaltung (DE-588)4135571-4 s Heißes Elektron (DE-588)4159455-1 s DE-604 Yang, Cary Y. Verfasser aut Miura-Hamada, Akemi Verfasser aut |
| spellingShingle | Takeda, Eiji Yang, Cary Y. Miura-Hamada, Akemi Hot carrier effects in MOS devices Hot carriers Metal oxide semiconductors Heißes Elektron (DE-588)4159455-1 gnd MOS-Schaltung (DE-588)4135571-4 gnd |
| subject_GND | (DE-588)4159455-1 (DE-588)4135571-4 |
| title | Hot carrier effects in MOS devices |
| title_alt | Hot-carrier effects in MOS devices |
| title_auth | Hot carrier effects in MOS devices |
| title_exact_search | Hot carrier effects in MOS devices |
| title_full | Hot carrier effects in MOS devices Eji Takeda; Cary Y. Yang; Akemi Miura-Hamada |
| title_fullStr | Hot carrier effects in MOS devices Eji Takeda; Cary Y. Yang; Akemi Miura-Hamada |
| title_full_unstemmed | Hot carrier effects in MOS devices Eji Takeda; Cary Y. Yang; Akemi Miura-Hamada |
| title_short | Hot carrier effects in MOS devices |
| title_sort | hot carrier effects in mos devices |
| topic | Hot carriers Metal oxide semiconductors Heißes Elektron (DE-588)4159455-1 gnd MOS-Schaltung (DE-588)4135571-4 gnd |
| topic_facet | Hot carriers Metal oxide semiconductors Heißes Elektron MOS-Schaltung |
| work_keys_str_mv | AT takedaeiji hotcarriereffectsinmosdevices AT yangcaryy hotcarriereffectsinmosdevices AT miurahamadaakemi hotcarriereffectsinmosdevices |