APA-Zitierstil (7. Ausg.)

Takeda, E., Yang, C. Y., & Miura-Hamada, A. (1995). Hot carrier effects in MOS devices. Academic Press.

Chicago-Zitierstil (17. Ausg.)

Takeda, Eiji, Cary Y. Yang, und Akemi Miura-Hamada. Hot Carrier Effects in MOS Devices. San Diego [u.a.]: Academic Press, 1995.

MLA-Zitierstil (9. Ausg.)

Takeda, Eiji, et al. Hot Carrier Effects in MOS Devices. Academic Press, 1995.