Holdings: Proceedings :: THWS Bibkatalog

Proceedings: [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]

Saved in:

Bibliographic Details
Corporate Author:	International Test Conference Washington, DC (Author)
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, Pa. ITC Office [1995]
Subjects:	Medizin Elektronik Test Entwurf Mikroelektronik Computersimulation Integrierte Schaltung Bildverstehen Testen Datenverarbeitungssystem Telekommunikation Prüftechnik Computerunterstütztes Verfahren VLSI Maschinelles Sehen Konferenzschrift > 1996 > Washington DC
Item Description:	Nebentitel: Driving down the cost of test
Physical Description:	XII, 1011 S. Ill., graph. Darst.
ISBN:	0780329910 0780329929 0780329937

Staff View

MARC


LEADER	00000nam a2200000 c 4500
001	BV011020806
003	DE-604
005	20211222
007	t
008	961024s1995 ad\|\| \|\|\|\| 10\|\|\| eng d
020			\|a 0780329910 \|9 0-7803-2991-0
020			\|a 0780329929 \|9 0-7803-2992-9
020			\|a 0780329937 \|9 0-7803-2993-7
035			\|a (OCoLC)633569912
035			\|a (DE-599)BVBBV011020806
040			\|a DE-604 \|b ger \|e rakddb
041	0		\|a eng
049			\|a DE-91 \|a DE-91G \|a DE-29T \|a DE-83 \|a DE-525 \|a DE-634
084			\|a ZN 4030 \|0 (DE-625)157339: \|2 rvk
084			\|a ELT 359f \|2 stub
111	2		\|a International Test Conference \|n 26 \|d 1995 \|c Washington, DC \|j Verfasser \|0 (DE-588)5175207-4 \|4 aut
245	1	0	\|a Proceedings \|b [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] \|c International Test Conference 1995
246	1	3	\|a Driving down the cost of test
264		1	\|a Altoona, Pa. \|b ITC Office \|c [1995]
300			\|a XII, 1011 S. \|b Ill., graph. Darst.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
500			\|a Nebentitel: Driving down the cost of test
650	0	7	\|a Medizin \|0 (DE-588)4038243-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronik \|0 (DE-588)4014346-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Test \|0 (DE-588)4059549-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Entwurf \|0 (DE-588)4121208-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computersimulation \|0 (DE-588)4148259-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Bildverstehen \|0 (DE-588)4202022-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Testen \|0 (DE-588)4367264-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Telekommunikation \|0 (DE-588)4059360-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Prüftechnik \|0 (DE-588)4047610-8 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a VLSI \|0 (DE-588)4117388-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|2 gnd \|9 rswk-swf
655		7	\|0 (DE-588)1071861417 \|a Konferenzschrift \|y 1996 \|z Washington DC \|2 gnd-content
689	0	0	\|a Test \|0 (DE-588)4059549-3 \|D s
689	0		\|5 DE-604
689	1	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	1	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	1		\|8 1\p \|5 DE-604
689	2	0	\|a Datenverarbeitungssystem \|0 (DE-588)4125229-9 \|D s
689	2	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	2		\|8 2\p \|5 DE-604
689	3	0	\|a Telekommunikation \|0 (DE-588)4059360-5 \|D s
689	3	1	\|a Computersimulation \|0 (DE-588)4148259-1 \|D s
689	3		\|8 3\p \|5 DE-604
689	4	0	\|a Mikroelektronik \|0 (DE-588)4039207-7 \|D s
689	4	1	\|a Prüftechnik \|0 (DE-588)4047610-8 \|D s
689	4		\|8 4\p \|5 DE-604
689	5	0	\|a Elektronik \|0 (DE-588)4014346-6 \|D s
689	5	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	5		\|8 5\p \|5 DE-604
689	6	0	\|a VLSI \|0 (DE-588)4117388-0 \|D s
689	6	1	\|a Entwurf \|0 (DE-588)4121208-3 \|D s
689	6		\|8 6\p \|5 DE-604
689	7	0	\|a Computerunterstütztes Verfahren \|0 (DE-588)4139030-1 \|D s
689	7	1	\|a Medizin \|0 (DE-588)4038243-6 \|D s
689	7		\|8 7\p \|5 DE-604
689	8	0	\|a Integrierte Schaltung \|0 (DE-588)4027242-4 \|D s
689	8	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	8		\|8 8\p \|5 DE-604
689	9	0	\|a Bildverstehen \|0 (DE-588)4202022-0 \|D s
689	9	1	\|a Maschinelles Sehen \|0 (DE-588)4129594-8 \|D s
689	9		\|8 9\p \|5 DE-604
999			\|a oai:aleph.bib-bvb.de:BVB01-007378055
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 5\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 6\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 7\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 8\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 9\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk

Record in the Search Index

_version_	1804125509890605056
any_adam_object
author_corporate	International Test Conference Washington, DC
author_corporate_role	aut
author_facet	International Test Conference Washington, DC
author_sort	International Test Conference Washington, DC
building	Verbundindex
bvnumber	BV011020806
classification_rvk	ZN 4030
classification_tum	ELT 359f
ctrlnum	(OCoLC)633569912 (DE-599)BVBBV011020806
discipline	Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik
format	Conference Proceeding Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04263nam a2200973 c 4500</leader><controlfield tag="001">BV011020806</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20211222 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">961024s1995 ad\|\| \|\|\|\| 10\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780329910</subfield><subfield code="9">0-7803-2991-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780329929</subfield><subfield code="9">0-7803-2992-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780329937</subfield><subfield code="9">0-7803-2993-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)633569912</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011020806</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-525</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">26</subfield><subfield code="d">1995</subfield><subfield code="c">Washington, DC</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5175207-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">[October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]</subfield><subfield code="c">International Test Conference 1995</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Driving down the cost of test</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Altoona, Pa.</subfield><subfield code="b">ITC Office</subfield><subfield code="c">[1995]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 1011 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Nebentitel: Driving down the cost of test</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1996</subfield><subfield code="z">Washington DC</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2="1"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="7" ind2="0"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2="1"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="8" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2=" "><subfield code="8">8\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="9" ind2="0"><subfield code="a">Bildverstehen</subfield><subfield code="0">(DE-588)4202022-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2="1"><subfield code="a">Maschinelles Sehen</subfield><subfield code="0">(DE-588)4129594-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2=" "><subfield code="8">9\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007378055</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">8\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">9\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection>
genre	(DE-588)1071861417 Konferenzschrift 1996 Washington DC gnd-content
genre_facet	Konferenzschrift 1996 Washington DC
id	DE-604.BV011020806
illustrated	Illustrated
indexdate	2024-07-09T18:02:42Z
institution	BVB
institution_GND	(DE-588)5175207-4
isbn	0780329910 0780329929 0780329937
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-007378055
oclc_num	633569912
open_access_boolean
owner	DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-29T DE-83 DE-525 DE-634
owner_facet	DE-91 DE-BY-TUM DE-91G DE-BY-TUM DE-29T DE-83 DE-525 DE-634
physical	XII, 1011 S. Ill., graph. Darst.
publishDate	1995
publishDateSearch	1995
publishDateSort	1995
publisher	ITC Office
record_format	marc
spelling	International Test Conference 26 1995 Washington, DC Verfasser (DE-588)5175207-4 aut Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] International Test Conference 1995 Driving down the cost of test Altoona, Pa. ITC Office [1995] XII, 1011 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nebentitel: Driving down the cost of test Medizin (DE-588)4038243-6 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Entwurf (DE-588)4121208-3 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Maschinelles Sehen (DE-588)4129594-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1996 Washington DC gnd-content Test (DE-588)4059549-3 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Bildverstehen (DE-588)4202022-0 s Maschinelles Sehen (DE-588)4129594-8 s 9\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 9\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] Medizin (DE-588)4038243-6 gnd Elektronik (DE-588)4014346-6 gnd Test (DE-588)4059549-3 gnd Entwurf (DE-588)4121208-3 gnd Mikroelektronik (DE-588)4039207-7 gnd Computersimulation (DE-588)4148259-1 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Telekommunikation (DE-588)4059360-5 gnd Prüftechnik (DE-588)4047610-8 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd VLSI (DE-588)4117388-0 gnd Maschinelles Sehen (DE-588)4129594-8 gnd
subject_GND	(DE-588)4038243-6 (DE-588)4014346-6 (DE-588)4059549-3 (DE-588)4121208-3 (DE-588)4039207-7 (DE-588)4148259-1 (DE-588)4027242-4 (DE-588)4202022-0 (DE-588)4367264-4 (DE-588)4125229-9 (DE-588)4059360-5 (DE-588)4047610-8 (DE-588)4139030-1 (DE-588)4117388-0 (DE-588)4129594-8 (DE-588)1071861417
title	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]
title_alt	Driving down the cost of test
title_auth	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]
title_exact_search	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]
title_full	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] International Test Conference 1995
title_fullStr	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] International Test Conference 1995
title_full_unstemmed	Proceedings [October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA] International Test Conference 1995
title_short	Proceedings
title_sort	proceedings october 21 25 1995 sheraton washington hotel washington dc usa
title_sub	[October 21 - 25, 1995, Sheraton Washington Hotel, Washington, DC, USA]
topic	Medizin (DE-588)4038243-6 gnd Elektronik (DE-588)4014346-6 gnd Test (DE-588)4059549-3 gnd Entwurf (DE-588)4121208-3 gnd Mikroelektronik (DE-588)4039207-7 gnd Computersimulation (DE-588)4148259-1 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Bildverstehen (DE-588)4202022-0 gnd Testen (DE-588)4367264-4 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Telekommunikation (DE-588)4059360-5 gnd Prüftechnik (DE-588)4047610-8 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd VLSI (DE-588)4117388-0 gnd Maschinelles Sehen (DE-588)4129594-8 gnd
topic_facet	Medizin Elektronik Test Entwurf Mikroelektronik Computersimulation Integrierte Schaltung Bildverstehen Testen Datenverarbeitungssystem Telekommunikation Prüftechnik Computerunterstütztes Verfahren VLSI Maschinelles Sehen Konferenzschrift 1996 Washington DC
work_keys_str_mv	AT internationaltestconferencewashingtondc proceedingsoctober21251995sheratonwashingtonhotelwashingtondcusa AT internationaltestconferencewashingtondc drivingdownthecostoftest

Holdings

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!

MARC

Record in the Search Index

There is no print copy available.

Similar Items