On minimizing the number of test points needed to achieve complete robust path delay fault testability:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Saarbrücken [u.a.]
Sonderforschungsbereich 124
1995
|
| Schriftenreihe: | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht
1995,8 |
| Beschreibung: | 18 Bl. graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV011020581 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 961024s1995 d||| |||| 00||| engod | ||
| 035 | |a (OCoLC)258534630 | ||
| 035 | |a (DE-599)BVBBV011020581 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 100 | 1 | |a Uppaluri, P. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a On minimizing the number of test points needed to achieve complete robust path delay fault testability |c P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| 264 | 1 | |a Saarbrücken [u.a.] |b Sonderforschungsbereich 124 |c 1995 | |
| 300 | |a 18 Bl. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |v 1995,8 | |
| 700 | 1 | |a Sparmann, U. |e Verfasser |4 aut | |
| 700 | 1 | |a Pomeranz, I. |e Verfasser |4 aut | |
| 830 | 0 | |a Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |v 1995,8 |w (DE-604)BV006185478 |9 1995,8 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007377849 | ||
Datensatz im Suchindex
| _version_ | 1804125509637898240 |
|---|---|
| any_adam_object | |
| author | Uppaluri, P. Sparmann, U. Pomeranz, I. |
| author_facet | Uppaluri, P. Sparmann, U. Pomeranz, I. |
| author_role | aut aut aut |
| author_sort | Uppaluri, P. |
| author_variant | p u pu u s us i p ip |
| building | Verbundindex |
| bvnumber | BV011020581 |
| ctrlnum | (OCoLC)258534630 (DE-599)BVBBV011020581 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01156nam a2200289 cb4500</leader><controlfield tag="001">BV011020581</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">961024s1995 d||| |||| 00||| engod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)258534630</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011020581</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Uppaluri, P.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">On minimizing the number of test points needed to achieve complete robust path delay fault testability</subfield><subfield code="c">P. Uppaluri ; U. Sparmann ; I. Pomeranz</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Saarbrücken [u.a.]</subfield><subfield code="b">Sonderforschungsbereich 124</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">18 Bl.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht</subfield><subfield code="v">1995,8</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sparmann, U.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pomeranz, I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht</subfield><subfield code="v">1995,8</subfield><subfield code="w">(DE-604)BV006185478</subfield><subfield code="9">1995,8</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007377849</subfield></datafield></record></collection> |
| id | DE-604.BV011020581 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:02:42Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007377849 |
| oclc_num | 258534630 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 18 Bl. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Sonderforschungsbereich 124 |
| record_format | marc |
| series | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| series2 | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| spelling | Uppaluri, P. Verfasser aut On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz Saarbrücken [u.a.] Sonderforschungsbereich 124 1995 18 Bl. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht 1995,8 Sparmann, U. Verfasser aut Pomeranz, I. Verfasser aut Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht 1995,8 (DE-604)BV006185478 1995,8 |
| spellingShingle | Uppaluri, P. Sparmann, U. Pomeranz, I. On minimizing the number of test points needed to achieve complete robust path delay fault testability Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| title | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_auth | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_exact_search | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_full | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_fullStr | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_full_unstemmed | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_short | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_sort | on minimizing the number of test points needed to achieve complete robust path delay fault testability |
| volume_link | (DE-604)BV006185478 |
| work_keys_str_mv | AT uppalurip onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability AT sparmannu onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability AT pomeranzi onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability |