Microbeam and nanobeam analysis:
Saved in:
| Format: | Book |
|---|---|
| Language: | German |
| Published: |
Wien u.a.
Springer
1996
|
| Series: | [Mikrochimica acta / Supplementum]
13 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XI, 643 S. Ill., graph. Darst. |
| ISBN: | 3211828745 |
Staff View
MARC
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Record in the Search Index
| _version_ | 1804125438655594496 |
|---|---|
| adam_text | INHALTSVERZEICHNIS
REIMER, L.
MONTE CARLO SIMULATION TECHNIQUES FOR QUANTITATIVE X-RAY MICROANALYSIS
S. 1-
WERNER, W. S. M.
TRANSPORT EQUATION APPROACH TO ELECTRON MICROBEAM ANALYSIS: FUNDAMENTALS
AND APPLICATIONS
S. 13-
POUCHOU, J.-L.
USE OF SOFT X-RAYS IN MICROANALYSIS
S. 39-
REMOND, G. / GILLES, C. / FIALIN, M. / ROUER, O. / MARINENKO, R. /
MYKLEBUST, R. / NEWBURY, D.
INTENSITY MEASUREMENT OF WAVELENGTH DISPERSIVE X-RAY EMISSION BANDS:
APPLICATIONS TO THE SOFT X-RAY REGION
S. 61-
JANSSENS, K. / VINCZE, L. / VEKEMANS, B. / AERTS, A. / ADAMS, F. /
JONES, K. W. / KNOECHEL, A.
SYNCHROTRON RADIATION INDUCED X-RAY MICROFLUORESCENCE ANALYSIS
S. 87-
MALMQVIST, K. G.
PARTICLE-INDUCED X-RAY EMISSION A QUANTITATIVE TECHNIQUE SUITABLE FOR
MICROANALYSIS
S. 117-
BRESSE, J. F. / REMOND, G. / AKAMATSU, B.
CATHODOLUMINESCENCE MICROSCOPY AND SPECTROSCOPY OF SEMICONDUCTORS AND
WIDE BANDGAP INSULATING MATERIALS
S. 135-
BERTRAND, P. / WENG, L.-T.
TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)
S. 167-
BLAVETTE, D. / BIGOT, A. / SCHMUCK, C. / DANOIX, F. / AUGER, P.
THREE-DIMENSIONAL NANOANALYSIS WITH THE TOMOGRAPHIC ATOM-PROBE
S. 183-
PENNYCOOK, S. J. / JESSON, D. E. / BROWNING, N. D. / CHISHOLM, M. F.
MICROANALYSIS AT ATOMIC RESOLUTION
S. 195-
ADNANE, L. / KESRI, R. / HAMAR-THIBAULT, S.
COMPOSITION OF VANADIUM CARBIDES FORMED BY SOLIDIFICATION IN FE-V-C-M
ALLOYS: INFLUENCE OF ADDITIONS (M = AL, CU, MO)
S. 209-
ANDRAE, M. / KLEIN, P. / ROEHRBACHER, K. / WERNISCH, J.
ELECTRON TRANSMISSION COEFFICIENT FOR OBLIQUE ANGLE OF INCIDENCE
S. 217-
ANDRAE, M. / ROEHRBACHER, K. / KLEIN, P. / WERNISCH, J.
DEPTH DISTRIBUTION FUNCTION FOR OBLIQUE ANGLE OF INCIDENCE
S. 225-
AOUINE, M. / ESNOUF, C. / EPICIER, T.
SIMULATION OF EDS SPECTRA USING X-RES SOFTWARE
S. 233-
ARMIGLIATO, A. / LEWS, T. / ROSA, R.
ON THE USE OF THE GEL LINE IN THIN FILM X-RAY MICROANALYSIS OF SI1-X
GEX/SI HETEROSTRUCTURES
S. 241-
BERNER, A. / LEVIN, I.
COMPUTER SIMULATIONS OF THE X-RAY INTENSITY DISTRIBUTION FROM SUBMICRON
PARTICLES EMBEDDED IN A MATRIX
S. 251-
CHENERY, S. / WILLIAMS, T. / ELLIOTT, T. A. / FOREY, P. L. / WERDELIN,
L.
DETERMINATION OF RARE EARTH ELEMENTS IN BIOLOGICAL AND MINERAL APATITE
BY EPMA AND LAMP-ICP-MS
S. 259-
DHAEN, J. / DOLIESLAEGER, M. / DE SCHEPPER, L. / STALS, L. M.
QUANTITATIVE ANALYSIS OF THE COMPOUND LAYER OF PLASMA NITRIDED PURE IRON
S. 271-
FRANK, L. / MATJKA, F.
CORRECTION OF THE EDGE EFFECT IN AUGER ELECTRON MICROSCOPY
S. 279-
FRANK, L. / ZADRAIL, M. / MUELLEROVA, I.
LOW ENERGY IMAGING OF NONCONDUCTIVE SURFACES IN SEM
S. 289-
FRIGGE, M. / VOELKSCH, G.
INVESTIGATION OF THE BONDING MECHANISM OF GLASS CERAMIC LAYERS ON METAL
ALLOYS
S. 299-
GEDEON, O. / HULINSKY, V. / JUREK, K. / IMEKOVA, M.
MONTE CARLO METHOD FOR QUANTITATIVE ANALYSIS OF BULK AND LAYERED SAMPLES
S. 307-
HSU, C.-M. / MCPHAIL, D. S.
SIMS LINESCAN PROFILING OF CHEMICALLY BEVELLED SEMICONDUCTORS: A METHOD
OF OVERCOMING ION BEAM INDUCED SEGREGATION IN DEPTH PROFILING
S. 317-
HULINSKY, V. / JUREK, K. / GEDEON, O.
EXPERIMENTAL VERIFICATION OF THEORETICAL MODELS SIMULATING THE
TEMPERATURE INCREASE IN EPMA OF GLASS
S. 325-
BUCSEK, M. J. / NYEKI, J. / SZABO, Z. / KADAR, A.
QUANTITATION OF MINERAL ELEMENTS OF DIFFERENT FRUIT POLLEN GRAINS
S. 333-
JUREK, K. / HULINSKY, V. / GEDEON, O.
ELECTRON BEAM INDUCED MIGRATION OF ALKALINE IONS IN SILICA GLASS
S. 339-
KALTSAS, G. / GLEZOS, N. / VALAMONTES, E. / NASSIOPOULOS, A. G.
APPLICATION OF THE BOLTZMANN TRANSPORT EQUATION IN THE THICKNESS
DETERMINATION OF THIN FILMS
S. 349-
KINDRATENKO, V. V. / VAN ESPEN, P. J. M. / TREIGER, B. A. / VAN GRIEKEN,
R. E.
CHARACTERISATION OF THE SHAPE OF MICROPARTICLES VIA FRACTAL AND FOURIER
ANALYSES OF SCANNING ELECTRON MICROSCOPE IMAGES
S. 355-
KLEIN, P. / ANDRAE, M. / ROEHRBACHER, K. / WERNISCH, J.
CALCULATION OF THE SURFACE IONISATION USING ANALYTICAL MODELS OF
ELECTRON BACKSCATTERING
S. 363-
KLEIN, P. / ROEHRBACHER, K. / ANDRAE, M. / WERNISCH, J.
THICKNESS DETERMINATION OF THIN INSULATING LAYERS
S. 377-
KOSYACHKOV, A. A.
HIGH ENERGY AND ANGULAR RESOLUTION DYNAMIC SECONDARY ION MASS
SPECTROMETRY
S. 391-
LEFEVRE, O. / BETTI, M. / KOCH, L. / WALKER, C. T.
EPMA AND MASS SPECTROMETRY OF SOIL AND GRASS CONTAINING RADIOACTIVITY
FROM THE NUCLEAR ACCIDENT AT CHERNOBYL
S. 399-
LLOVET, X. / RIVEROS, A. / SALVAT, F.
APPLICATION OF A NEW MONTE CARLO SIMULATION ALGORITHM TO ELECTRON PROBE
MICROANALYSIS
S. 409-
MONTGOMERY, N. J. / MCPHAIL, D. S.
TOPOGRAPHY DEVELOPMENT ON SINGLE CRYSTAL MGO UNDER ION BEAM BOMBARDMENT
S. 419-
NAGY, P. / MARK, G. I. / BALAZS, E.
DETERMINATION OF SPM TIP SHAPE USING POLYSTYRENE LATEX BALLS
S. 425-
OLESHKO, V. P. / GIJBELS, R. H. / JACOB, W. A. / ALFIMOV, M. V.
COMBINED CHARACTERIZATION OF NANOSTRUCTURES BY AEM AND STM
S. 435-
OLESHKO, V. P. / KINDRATENKO, V. V. / GIJBELS, R. H. / VAN ESPEN, P. J.
M. / JACOB, W. A.
STUDY OF QUASI-FRACTAL MANY-PARTICLE-SYSTEMS AND PERCOLATION NETWORKS BY
ZERO-LOSS SPECTROSCOPIC IMAGING, ELECTRON ENERGY-LOSS SPECTROSCOPY AND
DIGITAL IMAGE ANALYSIS
S. 443-
PFEIFFER, A. / SCHIEBL, C. / WERNISCH, J.
CALCULATION OF BREMSSTRAHLUNG SPECTRA FOR MULTILAYER SAMPLES
S. 453-
POELT, P. / STOECKL, B.
THICKNESS MEASUREMENT OF THIN FILMS BY EPMA INFLUENCE OF OE(0), MACS AND
SUBSTRATE
S. 463-
PROCOP, M.
A SIMPLE PROCEDURE TO CHECK THE SPECTRAL RESPONSE OF AN EDX DETECTOR
S. 473-
REED, S. J. B. / BUCKLEY, A.
VIRTUAL WDS
S. 479-
REIMER, L. / KAESSENS, M. / WIESE, L.
MONTE CARLO SIMULATION PROGRAM WITH A FREE CONFIGURATION OF SPECIMEN AND
DETECTOR GEOMETRIES
S. 485-
RICKERBY, D. G.
BARRIERS TO ENERGY DISPERSIVE SPECTROMETRY WITH LOW ENERGY X-RAYS
S. 493-
ROEHRBACHER, K. / KLEIN, P. / ANDRAE, M. / WERNISCH, J.
MEASUREMENTS OF GA1-XALXAS LAYERS ON GAAS WITH EDS
S. 501-
ROEHRBACHER, K. / ANDRAE, M. / KLEIN, P. / WERNISCH, J.
THE RELATIVE INTENSITY FACTOR FOR L RADIATION CONSIDERING THE DIFFERENT
MASS ABSORPTION OF L AND L RADIATION
S. 507-
SAMARDIJA, Z. / EH, M. / MAKOVEC, D. / KOLAR, D.
DETERMINATION OF THE SOLUBILITY OF CERIUM IN BATIO3 BY QUANTITATIVE WDS
ELECTRON PROBE MICROANALYSIS
S. 517-
SANZ-HERVAS, A. / ABRIL, E. J. / AGUILAR, M. / DE BENITO, G. / LLORENTE,
C. / LOPEZ, M.
SIMULATION OF X-RAY DIFFRACTION PROFILES OF GRADUALLY RELAXED EPILAYERS
S. 525-
SCHIEBL, C. O. / PFEIFFER, A. / WAGNER, H. W. / WERNER, W. S. M. /
STIPPEL, H.
MONTE CARLO SIMULATION OF ELECTRON SCATTERING FOR ARBITRARY 2D
STRUCTURES USING A MODIFIED QUADTREE GEOMETRY DISCRETIZATION
S. 533-
SCHNEIDER, R. / WOLTERSDORF, J. / ROEDER, A.
CHEMICAL-BOND CHARACTERIZATION OF NANOSTRUCTURES BY EELS
S. 545-
SENIN, V. G. / SHILOBREEVA, S. N.
LOCAL DETERMINATION OF CARBON BY COMBINING BETA-AUTORADIOGRAPHY AND
ELECTRON MICROPROBE ANALYSIS
S. 553-
STARY, V.
THE CHECK OF THE ELASTIC SCATTERING MODEL IN MONTE-CARLO SIMULATION
S. 559-
STATHAM, P. J.
TRUE COLOUR X-RAY VISION FOR ELECTRON MICROSCOPY AND MICROANALYSIS
S. 573-
TASS, Z. / HORVATH, G.
DETERMINATION OF THE OXIDATION STATES OF NB BY AUGER ELECTRON
SPECTROSCOPY
S. 581-
TSAI, S. C. / HUNTZ, A. M. / DOLIN, C. / MONTY, C.
STUDY BY SIMS OF THE 54CR AND 18O DIFFUSION IN CR2 O3 AND IN CR2O3
SCALES
S. 587-
VALAMONTES, E. / NASSIOPOULOS, A. G.
COMPARISON OF BACK-FOIL SCANNING X-RAY MICROFLUORESCENCE AND ELECTRON
PROBE X-RAY MICROANALYSIS FOR THE ELEMENTAL CHARACTERISATION OF THIN
COATINGS
S. 597-
VALAMONTES, E. / NASSIOPOULOS, A. G.
ELECTRON PROBE X-RAY MICROANALYSIS OF COATINGS
S. 605-
VIALE, D. / PETITGAND, G.
ANALYSIS OF LAYERS: X-RAY MAPS OF CHANGE IN THICKNESS OBTAINED BY
ELECTRON MACROPROBE
S. 611-
WAGNER, H. W. / SCHIEBL, C. O. / WERNER, W. S. M.
COMPARISON OF SIMULATED AND EXPERIMENTAL AUGER INTENSITIES OF AU, PT, NI
AND SI IN ABSOLUTE UNITS
S. 623-
WILLICH, P. / BETHKE, R.
PRACTICAL ASPECTS AND APPLICATIONS OF EPMA AT LOW ELECTRON ENERGIES
S. 631-
ZANEL, P. / HAMMER, H.
OXIDATION AND REDUCTION PROCESSES OF BE/BEO INDUCED BY ELECTRONS
S. 639-
INHALTSVERZEICHNIS ALS PDF
2000- OESTERR. BIBLIOTHEKENVERBUND & SERVICE GMBH [HTML 4.0 /
GENERATED: 2008.06.16]
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| id | DE-604.BV010951156 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:01:34Z |
| institution | BVB |
| isbn | 3211828745 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007324873 |
| oclc_num | 37602580 |
| open_access_boolean | |
| owner | DE-12 DE-M347 DE-703 |
| owner_facet | DE-12 DE-M347 DE-703 |
| physical | XI, 643 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Springer |
| record_format | marc |
| series2 | [Mikrochimica acta / Supplementum] |
| spelling | Microbeam and nanobeam analysis D. Benoit ... (ed.) Wien u.a. Springer 1996 XI, 643 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier [Mikrochimica acta / Supplementum] 13 Electron microscopy Congresses Electron probe microanalysis Congresses Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Nanoanalyse (DE-588)4461867-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1995 Saint-Malo gnd-content Mikroanalyse (DE-588)4169804-6 s DE-604 Nanoanalyse (DE-588)4461867-0 s Benoit, Daniele Sonstige oth Supplementum] [Mikrochimica acta 13 (DE-604)BV011053038 13 OEBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007324873&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Microbeam and nanobeam analysis Electron microscopy Congresses Electron probe microanalysis Congresses Mikroanalyse (DE-588)4169804-6 gnd Nanoanalyse (DE-588)4461867-0 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4461867-0 (DE-588)1071861417 |
| title | Microbeam and nanobeam analysis |
| title_auth | Microbeam and nanobeam analysis |
| title_exact_search | Microbeam and nanobeam analysis |
| title_full | Microbeam and nanobeam analysis D. Benoit ... (ed.) |
| title_fullStr | Microbeam and nanobeam analysis D. Benoit ... (ed.) |
| title_full_unstemmed | Microbeam and nanobeam analysis D. Benoit ... (ed.) |
| title_short | Microbeam and nanobeam analysis |
| title_sort | microbeam and nanobeam analysis |
| topic | Electron microscopy Congresses Electron probe microanalysis Congresses Mikroanalyse (DE-588)4169804-6 gnd Nanoanalyse (DE-588)4461867-0 gnd |
| topic_facet | Electron microscopy Congresses Electron probe microanalysis Congresses Mikroanalyse Nanoanalyse Konferenzschrift 1995 Saint-Malo |
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