Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | English |
| Veröffentlicht: |
1994
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| Ausgabe: | [Mikrofiche-Ausg.] |
| Schlagworte: | |
| Beschreibung: | Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 1 Mikrofiche : 24x |
| Beschreibung: | 67 S. Ill., graph. Darst. |
Internformat
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| 100 | 1 | |a Lutz, Martin A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films |c presented by Martin Albert Lutz |
| 250 | |a [Mikrofiche-Ausg.] | ||
| 264 | 1 | |c 1994 | |
| 300 | |a 67 S. |b Ill., graph. Darst. | ||
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| 337 | |b h |2 rdamedia | ||
| 338 | |b he |2 rdacarrier | ||
| 500 | |a Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 1 Mikrofiche : 24x | ||
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Datensatz im Suchindex
| _version_ | 1804125005631455232 |
|---|---|
| any_adam_object | |
| author | Lutz, Martin A. |
| author_facet | Lutz, Martin A. |
| author_role | aut |
| author_sort | Lutz, Martin A. |
| author_variant | m a l ma mal |
| building | Verbundindex |
| bvnumber | BV010536690 |
| classification_tum | PHY 690d ELT 280d PHY 136d |
| ctrlnum | (OCoLC)614110802 (DE-599)BVBBV010536690 |
| discipline | Physik Elektrotechnik |
| edition | [Mikrofiche-Ausg.] |
| format | Microfilm Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV010536690 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:54:41Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007023806 |
| oclc_num | 614110802 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-355 DE-BY-UBR |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-355 DE-BY-UBR |
| physical | 67 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| record_format | marc |
| spelling | Lutz, Martin A. Verfasser aut Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films presented by Martin Albert Lutz [Mikrofiche-Ausg.] 1994 67 S. Ill., graph. Darst. txt rdacontent h rdamedia he rdacarrier Zürich, Techn. Hochsch., Diss., 1994. - Mikrofiche-Ausg.: 1 Mikrofiche : 24x Epitaxieschicht (DE-588)4152546-2 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf Germanium (DE-588)4135644-5 gnd rswk-swf Mischkristall (DE-588)4170112-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Epitaxieschicht (DE-588)4152546-2 s Silicium (DE-588)4077445-4 s Germanium (DE-588)4135644-5 s Mischkristall (DE-588)4170112-4 s Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 |
| spellingShingle | Lutz, Martin A. Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films Epitaxieschicht (DE-588)4152546-2 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Silicium (DE-588)4077445-4 gnd Germanium (DE-588)4135644-5 gnd Mischkristall (DE-588)4170112-4 gnd |
| subject_GND | (DE-588)4152546-2 (DE-588)4330328-6 (DE-588)4077445-4 (DE-588)4135644-5 (DE-588)4170112-4 (DE-588)4113937-9 |
| title | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films |
| title_auth | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films |
| title_exact_search | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films |
| title_full | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films presented by Martin Albert Lutz |
| title_fullStr | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films presented by Martin Albert Lutz |
| title_full_unstemmed | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films presented by Martin Albert Lutz |
| title_short | Scanning tunneling microscopy and atomic force microscopy studies of epitaxial Si 1-x Ge x films |
| title_sort | scanning tunneling microscopy and atomic force microscopy studies of epitaxial si 1 x ge x films |
| topic | Epitaxieschicht (DE-588)4152546-2 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd Silicium (DE-588)4077445-4 gnd Germanium (DE-588)4135644-5 gnd Mischkristall (DE-588)4170112-4 gnd |
| topic_facet | Epitaxieschicht Rastersondenmikroskopie Silicium Germanium Mischkristall Hochschulschrift |
| work_keys_str_mv | AT lutzmartina scanningtunnelingmicroscopyandatomicforcemicroscopystudiesofepitaxialsi1xgexfilms |