Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93): 5 - 7 April 1993, Namur, Belgium
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| Format: | Book |
|---|---|
| Language: | Undetermined |
| Published: |
Oxford u.a.
Pergamon
1994
|
| Series: | Vacuum
45,4 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | Einzelaufnahme eines Zs.-Heftes |
| Physical Description: | S. 371 - 496 Ill., graph. Darst. |
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Record in the Search Index
| _version_ | 1804124979423346688 |
|---|---|
| adam_text | VACUUM
SURFACE ENGINEERING, SURFACE INSTRUMENTATION
&
VACUUM TECHNOLOGY
Volume 45/number 4/April
1994
Contents
Analysis by a Combination of Ion-beam (accelerator based) and
Surface Specific Techniques (IB-SA93)
5-7
April
1993,
Namur, Belgium
371
Publisher s note
AUTHORS
Ρ
Coad
373
G G Ross
375
W
De
Coster,
В
Brijs,
H
Bender,
389
J
Alay and
W
Vandervorst
J P
F Sellschop, S H Connell,
397
ССР
Madiba,
E Sideras-Haddad,
S Kalbitzer, S
Jans,
P
Oberschactsiek,
К
Bharuth-Ram, J Schneider
and R Kiefl
T
Petit, A Chevarier,
N
Chevarier,
403
L
Deshayes,
M Charbonnier
and
M Romand
L
Houssiau and P
Bertrand
409
P
Maugis and Y Serruys
413
L Popa-Simil,
A Ivan, M
Dumitru,
419
E Ivanov,
С
Górnie,
С
Benea
and
V
Dima
S
Tobbeche,
С
Benazzouz,
N
Boussaa,
421
M Zilabdi, A Benouatas,
A Bouabellou
and R
Halimi
M
Rubel,
R
Haasch,
P
Mrozek,
423
A Wieckowski,
С
De
Pauli
and
S
Trasatti
M
Rubel,
В
Emmoth,
P
Wienhold,
N
Almqvist and C
H Wu
J P Coad and B
Farmery
F C
Siedile,
F L
Freire
Jr,
W
H
Schreiner
and I
J R Baumvol
H Wang and
P
Van Espen
447
D
lia, G M
Jenkins,
L R
Holland,
451
L
Evelyn
and H
Jena
ARTICLES
Introduction
—
Analysis by a combination of ion-beam
(accelerator based) and surface specific techniques (IB-SA93)
Analysis of hydrogen isotopes in materials by secondary ion
mass spectrometry and nuclear microanalysis
RBS, AES and XPS analysis of ion beam induced nitridation
of Si and SiGe alloys
The nature of the state of hydrogen on the surface and in the
bulk of natural and synthetic diamond (using ion beam
techniques)
Energetic ion scattering analysis and glow discharge optical
spectrometry characterization of amorphous hydrogenated
carbon films elaborated by PACVD
Surface structure analysis by time-of-flight ISS: influence of
primary ion nature and energy for scattering on Cud
10)
ΑΙ
-Ti
reactive interdiffusion studied by
STIMS
and RBS
Machining influence on the surface of some roughness
samples
Formation of CrSi2 studied by Rutherford backscattering
spectrometry
Characterization of
lr02-Sn02
thin layers by electron and ¡on
spectroscopies
429
Deuterium interaction with silicon-graphite materials
exposed to the tokamak plasma
435 Redeposition
effects on the target plates of the JET tokamak
441
Characterization of titanium-aluminum nitride thin films by
ion beam techniques and X-ray diffraction
Resolution enhancement of secondary ion
microprobe
images using Fourier deconvolution
A study of the thermally induced carbonization of
phenolformaldehyde by combined ion beam and surface
specific analyses
455
Author Index
REGULAR
PAPERS
N
A Hegab.
M
Fadei and
К
Sedeek
S Lugomer and M
Stipančić
C D
Tsiogas
and J N Avar rtsiotis
A B Marty, D Bhattacharyya,
S Chaudhuri and A K
Pal
459
Memory
switching phenomena in thin films of chalcogenide
semiconductors
463
Nucleation and growth of
Ta
oxide in nonstationary thermal
field
—
III. Self-organized structures controlled by convection
473
Simulation of reactive sputtering from a concentric dual-
source magnetron in roll-to-roll coating processes
483
Inhomogeneity in semiconductor films: an analysis from
optical studies
LETTER TO THE EDITOR
CONFERENCE REPORT
VACUUM DIARY
ANNOUNCEMENTS
487
489
491
495
ISSN 0042-207X
VACUAV
45(4) 371-496 (1994)
PERGAMON
|
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| indexdate | 2024-07-09T17:54:16Z |
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| physical | S. 371 - 496 Ill., graph. Darst. |
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| spelling | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium guest ed.: J. P. Coad ... Analysis by a combination of ion-beam (accelerator based) and surface specific techniques (IB-SA93) Oxford u.a. Pergamon 1994 S. 371 - 496 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Vacuum 45,4 Einzelaufnahme eines Zs.-Heftes Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1994 Namur gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Coad, J. P. Sonstige oth Digitalisierung TU Muenchen application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007007106&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium |
| title_alt | Analysis by a combination of ion-beam (accelerator based) and surface specific techniques (IB-SA93) |
| title_auth | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium |
| title_exact_search | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium |
| title_full | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium guest ed.: J. P. Coad ... |
| title_fullStr | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium guest ed.: J. P. Coad ... |
| title_full_unstemmed | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) 5 - 7 April 1993, Namur, Belgium guest ed.: J. P. Coad ... |
| title_short | Analysis by a combination of ion beam (accelerator based) and surface specific techniques (IB-SA93) |
| title_sort | analysis by a combination of ion beam accelerator based and surface specific techniques ib sa93 5 7 april 1993 namur belgium |
| title_sub | 5 - 7 April 1993, Namur, Belgium |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift 1994 Namur |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007007106&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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