Proceedings:
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Los Alamitos, Calif. u.a.
IEEE Computer Soc. Press
1992
|
| Subjects: | |
| Physical Description: | X, 259 S. Ill., graph. Darst. |
| ISBN: | 0818629851 081862986X 0818629878 |
Staff View
MARC
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| 245 | 1 | 0 | |a Proceedings |c First Asian Test Symposium (ATS '92), November 26 - 27, 1992, Hiroshima, Japan |
| 264 | 1 | |a Los Alamitos, Calif. u.a. |b IEEE Computer Soc. Press |c 1992 | |
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Record in the Search Index
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| dewey-full | 621.39/5/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift |
| id | DE-604.BV010354668 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:51:04Z |
| institution | BVB |
| institution_GND | (DE-588)5138237-4 |
| isbn | 0818629851 081862986X 0818629878 |
| language | English |
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| physical | X, 259 S. Ill., graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | Asian Test Symposium 1 1992 Hiroshima Verfasser (DE-588)5138237-4 aut Proceedings First Asian Test Symposium (ATS '92), November 26 - 27, 1992, Hiroshima, Japan Los Alamitos, Calif. u.a. IEEE Computer Soc. Press 1992 X, 259 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings |
| title_auth | Proceedings |
| title_exact_search | Proceedings |
| title_full | Proceedings First Asian Test Symposium (ATS '92), November 26 - 27, 1992, Hiroshima, Japan |
| title_fullStr | Proceedings First Asian Test Symposium (ATS '92), November 26 - 27, 1992, Hiroshima, Japan |
| title_full_unstemmed | Proceedings First Asian Test Symposium (ATS '92), November 26 - 27, 1992, Hiroshima, Japan |
| title_short | Proceedings |
| title_sort | proceedings |
| topic | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| topic_facet | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses Konferenzschrift |
| work_keys_str_mv | AT asiantestsymposiumhiroshima proceedings |