Energy filtering transmission electron microscopy:
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin u.a.
Springer
1995
|
| Series: | Springer series in optical sciences
71 |
| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | XI, 424 S. Ill., graph. Darst. |
| ISBN: | 354058479X |
Staff View
MARC
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| 020 | |a 354058479X |9 3-540-58479-X | ||
| 035 | |a (OCoLC)320302945 | ||
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| 041 | 0 | |a eng | |
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| 084 | |a PHY 135f |2 stub | ||
| 245 | 1 | 0 | |a Energy filtering transmission electron microscopy |c Ludwig Reimer (ed.). With contributions by C. Deininger ... |
| 246 | 1 | 3 | |a Energy-filtering transmission electron microscopy |
| 264 | 1 | |a Berlin u.a. |b Springer |c 1995 | |
| 300 | |a XI, 424 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in optical sciences |v 71 | |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektrale Filterung |0 (DE-588)4273436-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | 1 | |a Spektrale Filterung |0 (DE-588)4273436-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Reimer, Ludwig |d 1928- |0 (DE-588)13230130X |4 edt | |
| 700 | 1 | |a Deininger, Christine |4 ctb | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-540-48995-5 |
| 830 | 0 | |a Springer series in optical sciences |v 71 |w (DE-604)BV000000237 |9 71 | |
| 856 | 4 | 2 | |m DNB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006672299&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
Record in the Search Index
| _version_ | 1805067200044728320 |
|---|---|
| adam_text |
CONTENTS
1.
INTRODUCTION
BY
L.
REIMER
(WITH
23
FIGURES)
.
1
1.1
ELECTRON-SPECIMEN
INTERACTIONS
.
1
1.1.1
ELASTIC
SCATTERING
AND
CROSS-SECTIONS
.
1
1.1.2
INELASTIC
SCATTERING
AND
ELECTRON
ENERGY-LOSS
SPECTRUM
7
1.1.3
INELASTIC
CROSS-SECTIONS
.
9
1.2
CONVENTIONAL
TRANSMISSION
ELECTRON
MICROSCOPY
.
12
1.2.1
ELECTRON
GUNS
AND
SPECIMEN
ILLUMINATION
.
12
1.2.2
IMAGING
MODES
.
17
1.2.3
ELECTRON
DIFFRACTION
MODES
.
19
1.2.4
ANALYTICAL
ELECTRON
MICROSCOPY
.
19
1.2.5
SCANNING
TRANSMISSION
ELECTRON
MICROSCOPY
(STEM)
.
21
1.2.6
IMAGE
RECORDING
.
22
1.3
THE
DEVELOPMENT
OF
EELS
AND
EFTEM
.
23
1.3.1
EELS
.
23
1.3.2
EFTEM
.
25
1.4
MODES
OF
OPERATION
OF
EFTEM
.
26
1.4.1
DISPERSIVE
COORDINATES
AND
SELECTIVE
WINDOWS
.
26
1.4.2
ELECTRON
SPECTROSCOPIC
IMAGING
.
29
1.4.3
ELECTRON
SPECTROSCOPIC
DIFFRACTION
.
30
1.5
EELS
MODES
IN
EFTEM
.
31
1.5.1
EELS
SPECTRUM
MODE
.
31
1.5.2
EELS
IMAGE
MODE
.
34
1.5.3
IMAGE-EELS
MODE
.
34
1.5.4
EELS
DIFFRACTION
MODE
.
35
1.5.5
ANGULARLY
AND
SPATIALLY
DISPERSIVE
EELS
.
37
REFERENCES
.
37
2.
ELECTRON
OPTICS
OF
IMAGING
ENERGY
FILTERS
BY
H.
ROSE
AND
D.
KRAHL
(WITH
48
FIGURES)
.
43
2.1
SCATTERING
AND
FILTERING
.
43
2.2
TYPES
OF
IMAGING
ENERGY
FILTERS
.
47
2.2.1
CASTAING-HENRY
FILTER
.
48
2.2.2
MAGNETIC
FILTERS
.
49
2.2.3
RETARDING
WIEN
FILTER
.
52
VIII
CONTENTS
2.2.4
POST-COLUMN
FILTER
.
54
2.3
CALCULATION
PROCEDURES
.
55
2.3.1
RAY
TRACING
.
55
2.3.2
MATRIX
METHOD
.
56
2.3.3
EIKONAL
METHOD
.
58
2.4
SCALAR
AND
VECTOR
POTENTIAL
OF
MAGNETIC
DEFLECTION
SYSTEMS
WITH
MIDSECTION
SYMMETRY
.
59
2.4.1
MAGNETIC
SCALAR
POTENTIAL
.
60
2.4.2
SERIES
EXPANSION
OF
THE
MAGNETIC
VECTOR
POTENTIAL
.
64
2.4.3
FRINGING
FIELDS
OF
HOMOGENOUS
MAGNETIC
DEFLECTION
SYSTEMS
.
65
2.5
GAUSSIAN
OPTICS
.
73
2.5.1
PARAXIAL
RAYS
AND
DISPERSION
.
73
2.5.2
SCOFF
APPROXIMATION
.
77
2.5.3
EXTENDED
FRINGING
FIELDS
.
79
2.6
ABERRATIONS
.
86
2.6.1
PRIMARY
DEVIATIONS
.
89
2.6.2
SECOND-RANK
ABERRATIONS
.
92
2.6.3
SECONDARY
(THIRD-RANK)
ABERRATIONS
.
100
2.7
CORRECTION
OF
ABERRATIONS
.
101
2.7.1
ABERRATION
CORRECTION
BY
IMPOSING
SYMMETRY
CONDITIONS
.
102
2.7.2
CORRECTION
OF
ABERRATIONS
BY
MEANS
OF
SEXTUPOLES
.
104
2.7.3
CORRECTION
OF
THIRD-ORDER
ABERRATIONS
.
108
2.8
DESIGN
OF
A
CORRECTED
MAGNETIC
OMEGA
FILTER
.
110
2.8.1
CALCULATION
OF
THE
FILTER
AXIS
.
112
2.8.2
CALCULATION
OF
THE
FUNDAMENTAL
PARAXIAL
RAYS
.
112
2.8.3
ACTUAL
FILTER
DESIGN
.
114
2.9
FIRST-ORDER
ALIGNMENT
.
116
2.9.1
ADJUSTMENT
OF
THE
FILTER
AXIS
.
117
2.9.2
INTERNAL
PARAXIAL
ALIGNMENT
.
120
2.10
EXPERIMENTAL
CORRECTION
OF
ABERRATIONS
.
121
2.10.1
ABERRATIONS
AND
SYMMETRY
.
122
2.10.2
MEASUREMENT
OF
THE
SECOND-RANK
ABERRATIONS
.
123
2.10.3
ACHROMATIC
IMAGE
PLANE
.
123
2.10.4
ENERGY-SELECTION
PLANE
.
126
2.10.5
SEXTUPOLE
ALIGNMENT
.
129
2.10.6
CORRECTION
BY
SEXTUPOLES
.
130
2.11
CONCLUSION
.
143
REFERENCES
.
146
CONTENTS
IX
3.
PLASMONS
AND
RELATED
EXCITATIONS
BY
P.
SCHATTSCHNEIDER
AND
B.
JOUFFREY
(WITH
27
FIGURES)
.
151
3.1
BASIC
THEORY
.
151
3.1.1
THE
CONTINUUM
THEORY
OF
LOW-ENERGY
LOSSES
.
151
3.1.2
PLASMON
SPECTROMETRY
.
169
3.1.3
PLASMON
DISPERSION
.
173
3.2
BEYOND
THE
CONTINUUM
.
174
3.2.1
REFINEMENTS
OF
THE
BASIC
MODEL
.
174
3.2.2
RECENT
DEVELOPMENTS
.
183
3.2.3
ACOUSTIC-LIKE
PLASMONS
AND
LAYERED
STRUCTURES
.
189
3.3
STANDARD
INTERPRETATION
OF
LOW-ENERGY
LOSSES
.
197
3.4
BAND-GAP
ANALYSIS
.
199
3.5
MOMENTUM
DEPENDENCE
.
202
3.6
ZONE
BOUNDARY
COLLECTIVE
STATES
.
204
3.7
PLASMONS
IN
SMALL
PARTICLES
.
207
3.8
FINGERPRINTING
METHODS
.
210
3.9
COUPLING
OF
PLASMONS
TO
LIGHT
.
211
3.10
REFLECTION
EELS
.
212
REFERENCES
.
213
4.
INNER-SHELL
IONIZATION
BY
F.
HOFER
(WITH
20
FIGURES)
.
225
4.1
THEORY
OF
INNER-SHELL
EXCITATIONS
.
225
4.2
DETERMINATION
OF
IONIZATION
CROSS-SECTIONS
.
230
4.2.1
CALCULATION
OF
CROSS-SECTIONS
.
230
4.2.2
EXPERIMENTAL
DETERMINATION
OF
CROSS-SECTIONS
.
232
4.2.3
PARAMETRIZATION
OF
CROSS-SECTIONS
.
233
4.3
THE
SHAPE
OF
THE
IONIZATION
EDGES
.
233
4.3.1
THE
BACKGROUND
TO
THE
INNER-SHELL
IONIZATIONS
.
234
4.3.2
K
IONIZATIONS
.
235
4.3.3
L
2
3
IONIZATIONS
.
237
4.3.4
M45
IONIZATIONS
.
239
4.3.5
M23
IONIZATIONS
.
242
4.3.6
N45
IONIZATIONS
.
244
4.3.7
O45
IONIZATIONS
.
246
4.4
EDGE
FINE
STRUCTURES
.
246
4.4.1
NEAR-EDGE
FINE
STRUCTURES
.
246
4.4.2
EXTENDED
ENERGY-LOSS
FINE
STRUCTURES
.
256
REFERENCES
.
259
5.
QUANTITATIVE
ELECTRON
ENERGY-LOSS
SPECTROSCOPY
BY
R.F.
EGERTON
AND
R.D.
LEAPMAN
(WITH
9
FIGURES)
.
269
5.1
INSTRUMENTATION
FOR
ENERGY-LOSS
SPECTROSCOPY
.
269
5.1.1
SERIAL
RECORDING
.
269
5.1.2
PARALLEL
RECORDING
.
271
X
CONTENTS
5.2
ELEMENTAL
ANALYSIS
BY
EELS
.
274
5.2.1
ESTIMATION
OF
THE
NON-CHARACTERISTIC
BACKGROUND
.
274
5.2.2
QUANTIFICATION
FROM
CORE-LOSS
INTEGRALS
.
276
5.2.3
FITTING
TO
SPECTRAL
STANDARDS
.
277
5.2.4
SENSITIVITY
OF
EELS
ELEMENTAL
ANALYSIS
.
281
5.2.5
COMPARISON
WITH
EDX
SPECTROSCOPY
.
282
5.3
MEASUREMENT
OF
SPECIMEN
THICKNESS
.
285
5.4
SPECTRUM
DECONVOLUTION
.
286
REFERENCES
.
288
6.
ELECTRON
SPECTROSCOPIC
DIFFRACTION
BY
J.
MAYER,
C.
DEININGER,
AND
L.
REIMER
(WITH
34
FIGURES)
.
291
6.1
ADVANTAGES
OF
ELECTRON
SPECTROSCOPIC
DIFLFRACTION
.
291
6.2
DIFFRACTION
AT
AMORPHOUS
AND
POLYCRYSTALLINE
SPECIMENS
.
293
6.2.1
AMORPHOUS
DIFFRACTION
PATTERNS
.
293
6.2.2
DETERMINATION
OF
PAIR
CORRELATION
.
295
6.2.3
DEBYE-SCHERRER
PATTERNS
OF
POLYCRYSTALLINE
SPECIMENS
.
296
6.2.4
SMALL-ANGLE
ELECTRON
DIFFRACTION
.
301
6.3
DIFFRACTION
AT
SINGLE-CRYSTALLINE
SPECIMENS
.
302
6.3.1
DYNAMICAL
THEORY
OF
ELECTRON
DIFFRACTION
.
302
6.3.2
ENERGY-FILTERED
DIFFRACTION
AT
SINGLE
CRYSTALS
.
310
6.3.3
CHANNELLING
EFFECTS
AND
ALCHEMI
.
314
6.4
CONVERGENT-BEAM
ELECTRON
DIFFRACTION
(CBED)
.
315
6.4.1
BASIC
PRINCIPLES
OF
CBED
.
315
6.4.2
LARGE-ANGLE
PATTERNS
(LACBED)
AND
CONVERGENT-BEAM
IMAGING
(CBIM)
.
318
6.4.3
QUANTITATIVE
INFORMATION
FROM
HOLZ
LINES
.
322
6.4.4
REFINEMENT
OF
LOW-ORDER
STRUCTURE
FACTORS
.
328
6.4.5
DETERMINATION
OF
CHARGE
DENSITY
DISTRIBUTIONS
.
334
6.5
IMAGING
OF
THE
DISPERSION
OF
PLASMON
AND
COMPTON
SCATTERING
.
336
6.5.1
COMPTON
SCATTERING
.
336
6.5.2
PLASMON-LOSS
SCATTERING
.
337
REFERENCES
.
340
7.
ELECTRON
SPECTROSCOPIC
IMAGING
BY
L.
REIMER
(WITH
31
FIGURES)
.
347
7.1
ZERO-LOSS
IMAGING
.
347
7.1.1
TYPES
OF
CONTRAST
IN
TEM
.
348
7.1.2
SCATTERING
CONTRAST
OF
AMORPHOUS
SPECIMENS
.
351
7.1.3
Z-RATIO
CONTRAST
.
358
7.1.4
LORENTZ
MICROSCOPY
AND
ELECTRON
HOLOGRAPHY
.
358
7.1.5
INFLUENCE
OF
ZERO-LOSS
FILTERING
ON
BRAGG
CONTRAST
.
359
7.2
PLASMON-LOSS
IMAGING
.
363
XI
7.2.1
SCATTERING
CONTRAST
IN
THE
PRESENCE
OF
INELASTICALLY
SCATTERED
ELECTRONS
.
364
7.2.2
PHASE
CONTRAST
BY
INELASTICALLY
SCATTERED
ELECTRONS
.
364
7.2.3
CRYSTAL-LATTICE
IMAGING
AND
INELASTICALLY
SCATTERED
ELECTRONS
.
366
7.2.4
BRAGG
CONTRAST
OF
INELASTICALLY
SCATTERED
ELECTRONS
.
366
7.2.5
SELECTIVE
PLASMON-LOSS
IMAGING
.
370
7.3
HIGH
ENERGY-LOSS
IMAGING
.
373
7.3.1
STRUCTURE-SENSITIVE
IMAGING
.
373
7.3.2
CONTRAST
TUNING
.
377
7.3.3
MOST-PROBABLE-LOSS
IMAGING
.
378
7.4
ELEMENT
DISTRIBUTION
IMAGES
.
382
7.4.1
X-RAY
ELEMENTAL
MAPPING
.
382
7.4.2
ELEMENT
DISTRIBUTION
IMAGES
BY
ESI
.
383
7.4.3
METHODS
OF
BACKGROUND
SUBTRACTION
.
384
7.4.4
LIMITATIONS
FOR
ELEMENT
DISTRIBUTION
IMAGES
.
388
7.4.5
SPATIAL
RESOLUTION
.
391
7.4.6
METHODS
OF
MEASURING
THE
SPECIMEN
THICKNESS
.
392
REFERENCES
.
393
8.
ENERGY-FILTERED
REFLECTION
ELECTRON
MICROSCOPY
BY
J.C.H.
SPENCE
(WITH
7
FIGURES)
.
401
8.1
DEVELOPMENT
OF
REM
.
401
8.2
THE
GEOMETRY
OF
REM
IMAGING
.
403
8.3
SAMPLES,
TECHNIQUES
AND
INSTRUMENTATION
.
405
8.4
IMAGE
INTERPRETATION
FOR
REM
.
407
8.5
ENERGY-FILTERED
REM
.
412
8.6
FUTURE
TRENDS
.
415
REFERENCES
.
415
INDEX
.
419 |
| any_adam_object | 1 |
| author2 | Reimer, Ludwig 1928- Deininger, Christine |
| author2_role | edt ctb |
| author2_variant | l r lr c d cd |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- Deininger, Christine |
| building | Verbundindex |
| bvnumber | BV010056725 |
| classification_rvk | UH 6300 |
| classification_tum | PHY 135f |
| ctrlnum | (OCoLC)320302945 (DE-599)BVBBV010056725 |
| discipline | Physik |
| format | Book |
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| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV010056725 |
| illustrated | Illustrated |
| indexdate | 2024-07-20T03:30:27Z |
| institution | BVB |
| isbn | 354058479X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006672299 |
| oclc_num | 320302945 |
| open_access_boolean | |
| owner | DE-384 DE-29T DE-20 DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-703 DE-634 DE-83 |
| owner_facet | DE-384 DE-29T DE-20 DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-703 DE-634 DE-83 |
| physical | XI, 424 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in optical sciences |
| series2 | Springer series in optical sciences |
| spelling | Energy filtering transmission electron microscopy Ludwig Reimer (ed.). With contributions by C. Deininger ... Energy-filtering transmission electron microscopy Berlin u.a. Springer 1995 XI, 424 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 71 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Spektrale Filterung (DE-588)4273436-8 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Spektrale Filterung (DE-588)4273436-8 s DE-604 Reimer, Ludwig 1928- (DE-588)13230130X edt Deininger, Christine ctb Erscheint auch als Online-Ausgabe 978-3-540-48995-5 Springer series in optical sciences 71 (DE-604)BV000000237 71 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006672299&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Energy filtering transmission electron microscopy Springer series in optical sciences Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Spektrale Filterung (DE-588)4273436-8 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4273436-8 (DE-588)4143413-4 |
| title | Energy filtering transmission electron microscopy |
| title_alt | Energy-filtering transmission electron microscopy |
| title_auth | Energy filtering transmission electron microscopy |
| title_exact_search | Energy filtering transmission electron microscopy |
| title_full | Energy filtering transmission electron microscopy Ludwig Reimer (ed.). With contributions by C. Deininger ... |
| title_fullStr | Energy filtering transmission electron microscopy Ludwig Reimer (ed.). With contributions by C. Deininger ... |
| title_full_unstemmed | Energy filtering transmission electron microscopy Ludwig Reimer (ed.). With contributions by C. Deininger ... |
| title_short | Energy filtering transmission electron microscopy |
| title_sort | energy filtering transmission electron microscopy |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Spektrale Filterung (DE-588)4273436-8 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Spektrale Filterung Aufsatzsammlung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006672299&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig energyfilteringtransmissionelectronmicroscopy AT deiningerchristine energyfilteringtransmissionelectronmicroscopy |