Proceedings of the second Asian Test Symposium: November 16 - 18, 1993, Beijing, China
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. u.a.
IEEE Computer Soc. Press
1993
|
| Schlagworte: | |
| Beschreibung: | XII, 341 S. Ill., graph. Darst. |
| ISBN: | 081863930X 0818639318 |
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Datensatz im Suchindex
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| indexdate | 2024-07-09T17:44:52Z |
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| isbn | 081863930X 0818639318 |
| language | English |
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| physical | XII, 341 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | IEEE Computer Soc. Press |
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| spelling | Asian Test Symposium 2 1993 Peking Verfasser (DE-588)5142412-5 aut Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China Los Alamitos, Calif. u.a. IEEE Computer Soc. Press 1993 XII, 341 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_auth | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_exact_search | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_full | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_fullStr | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_full_unstemmed | Proceedings of the second Asian Test Symposium November 16 - 18, 1993, Beijing, China |
| title_short | Proceedings of the second Asian Test Symposium |
| title_sort | proceedings of the second asian test symposium november 16 18 1993 beijing china |
| title_sub | November 16 - 18, 1993, Beijing, China |
| topic | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses |
| topic_facet | Electronic circuits Testing Congresses Electronic digital computers Circuits Testing Congresses Fault-tolerant computing Congresses Konferenzschrift |
| work_keys_str_mv | AT asiantestsymposiumpeking proceedingsofthesecondasiantestsymposiumnovember16181993beijingchina |