Applying a new search space partitioning method to parallel test generation for sequential circuits:
Abstract: "In this paper, we propose a new strategy to partition the search space when performing parallel search to generate test patterns for hard-to-detect faults. Testability measures are used to rate all decisions and to guide the search to most promising regions. Our method performs test...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
München
1994
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| Schriftenreihe: | Technische Universität <München>: TUM-I
9415 |
| Schlagworte: | |
| Zusammenfassung: | Abstract: "In this paper, we propose a new strategy to partition the search space when performing parallel search to generate test patterns for hard-to-detect faults. Testability measures are used to rate all decisions and to guide the search to most promising regions. Our method performs test pattern generation and fault simulation in parallel without global synchronization. It achieves dynamic partitioning, dynamic load balancing, and necessary fault tolerance. High fault coverage and superlinear speedup employing up to 40 processors working in parallel demonstrate the efficiency of our approach for different hard-to-detect fault sets." |
| Beschreibung: | 14 S. graph. Darst. |
Internformat
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| 100 | 1 | |a Krauss, Peter A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Applying a new search space partitioning method to parallel test generation for sequential circuits |c Peter A. Krauss |
| 264 | 1 | |a München |c 1994 | |
| 300 | |a 14 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 490 | 1 | |a Technische Universität <München>: TUM-I |v 9415 | |
| 490 | 1 | |a Sonderforschungsbereich Methoden und Werkzeuge für die Nutzung paralleler Rechnerarchitekturen: SFB-Bericht / A |v 1994,9 | |
| 520 | 3 | |a Abstract: "In this paper, we propose a new strategy to partition the search space when performing parallel search to generate test patterns for hard-to-detect faults. Testability measures are used to rate all decisions and to guide the search to most promising regions. Our method performs test pattern generation and fault simulation in parallel without global synchronization. It achieves dynamic partitioning, dynamic load balancing, and necessary fault tolerance. High fault coverage and superlinear speedup employing up to 40 processors working in parallel demonstrate the efficiency of our approach for different hard-to-detect fault sets." | |
| 650 | 4 | |a Digital electronics |x Testing | |
| 650 | 4 | |a Mathematical optimization | |
| 650 | 4 | |a Sequential machine theory | |
| 810 | 2 | |a A |t Sonderforschungsbereich Methoden und Werkzeuge für die Nutzung paralleler Rechnerarchitekturen: SFB-Bericht |v 1994,9 |w (DE-604)BV004627888 |9 1994,9 | |
| 830 | 0 | |a Technische Universität <München>: TUM-I |v 9415 |w (DE-604)BV006185376 |9 9415 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006605749 | ||
Datensatz im Suchindex
| _version_ | 1804124339917815808 |
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| author | Krauss, Peter A. |
| author_facet | Krauss, Peter A. |
| author_role | aut |
| author_sort | Krauss, Peter A. |
| author_variant | p a k pa pak |
| building | Verbundindex |
| bvnumber | BV009967263 |
| ctrlnum | (OCoLC)35123042 (DE-599)BVBBV009967263 |
| format | Book |
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| id | DE-604.BV009967263 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:44:06Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006605749 |
| oclc_num | 35123042 |
| open_access_boolean | |
| owner | DE-12 DE-91G DE-BY-TUM |
| owner_facet | DE-12 DE-91G DE-BY-TUM |
| physical | 14 S. graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| record_format | marc |
| series | Technische Universität <München>: TUM-I |
| series2 | Technische Universität <München>: TUM-I Sonderforschungsbereich Methoden und Werkzeuge für die Nutzung paralleler Rechnerarchitekturen: SFB-Bericht / A |
| spelling | Krauss, Peter A. Verfasser aut Applying a new search space partitioning method to parallel test generation for sequential circuits Peter A. Krauss München 1994 14 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Technische Universität <München>: TUM-I 9415 Sonderforschungsbereich Methoden und Werkzeuge für die Nutzung paralleler Rechnerarchitekturen: SFB-Bericht / A 1994,9 Abstract: "In this paper, we propose a new strategy to partition the search space when performing parallel search to generate test patterns for hard-to-detect faults. Testability measures are used to rate all decisions and to guide the search to most promising regions. Our method performs test pattern generation and fault simulation in parallel without global synchronization. It achieves dynamic partitioning, dynamic load balancing, and necessary fault tolerance. High fault coverage and superlinear speedup employing up to 40 processors working in parallel demonstrate the efficiency of our approach for different hard-to-detect fault sets." Digital electronics Testing Mathematical optimization Sequential machine theory A Sonderforschungsbereich Methoden und Werkzeuge für die Nutzung paralleler Rechnerarchitekturen: SFB-Bericht 1994,9 (DE-604)BV004627888 1994,9 Technische Universität <München>: TUM-I 9415 (DE-604)BV006185376 9415 |
| spellingShingle | Krauss, Peter A. Applying a new search space partitioning method to parallel test generation for sequential circuits Technische Universität <München>: TUM-I Digital electronics Testing Mathematical optimization Sequential machine theory |
| title | Applying a new search space partitioning method to parallel test generation for sequential circuits |
| title_auth | Applying a new search space partitioning method to parallel test generation for sequential circuits |
| title_exact_search | Applying a new search space partitioning method to parallel test generation for sequential circuits |
| title_full | Applying a new search space partitioning method to parallel test generation for sequential circuits Peter A. Krauss |
| title_fullStr | Applying a new search space partitioning method to parallel test generation for sequential circuits Peter A. Krauss |
| title_full_unstemmed | Applying a new search space partitioning method to parallel test generation for sequential circuits Peter A. Krauss |
| title_short | Applying a new search space partitioning method to parallel test generation for sequential circuits |
| title_sort | applying a new search space partitioning method to parallel test generation for sequential circuits |
| topic | Digital electronics Testing Mathematical optimization Sequential machine theory |
| topic_facet | Digital electronics Testing Mathematical optimization Sequential machine theory |
| volume_link | (DE-604)BV004627888 (DE-604)BV006185376 |
| work_keys_str_mv | AT krausspetera applyinganewsearchspacepartitioningmethodtoparalleltestgenerationforsequentialcircuits |