Scanning tunneling microscopy: special issue ; [the International Colloquium on Scanning Tunneling Microscopy was held at Green Pia Yasuura, Hiroshima, from December 9 to 11, 1993]
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Bibliographic Details
Corporate Author: International Colloquium on Scanning Tunneling Microscopy Hiroshima (Author)
Format: Conference Proceeding Book
Language:Undetermined
Published: Tokyo Japanese Journal of Applied Physics 1994
Series:Japanese journal of applied physics / A 33
Subjects:
Item Description:Stücktitelaufnahme zu e. Zeitschriftenh.
Physical Description:S. 3657 - 3790 graph. Darst.

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