Spektroskopische Ellipsometrie an Halbleitergrenzflächen:
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Bibliographic Details
Main Author: Rossow, Uwe (Author)
Format: Thesis Microfilm Book
Language:German
Published: 1993
Subjects:
Item Description:Mikroreprod. e. Ms. 136 S.
Physical Description:2 Mikrofiches 24x

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!