Six sigma producibility analysis and process characterization:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | Undetermined |
| Published: |
Reading, MA
Addison-Wesley
1992
|
| Online Access: | Inhaltsverzeichnis |
| Physical Description: | Getr. Zählung zahlr. graph. Darst. |
| ISBN: | 0201634120 |
Staff View
MARC
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| 100 | 1 | |a Harry, Mikel J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Six sigma producibility analysis and process characterization |c Mikel J. Harry ; J. Ronald Lawson |
| 264 | 1 | |a Reading, MA |b Addison-Wesley |c 1992 | |
| 300 | |a Getr. Zählung |b zahlr. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 700 | 1 | |a Lawson, J. Ronald |e Verfasser |4 aut | |
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Record in the Search Index
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| adam_text | TABLE OF CONTENTS
SECTION 1 Page
Introduction and Overview 1 1
1.1 The Motivating Force for Change 1 1
1.2 The Issue of Producibility 1 2
1.3 The Issue of Measurement 1 2
1.4 The Issue of Manufacturing Viability 1 3
1.5 The Issue of Reliability 1 4
1.6 Synopsis of the Issues 1 5
PART I: PRODUCIBILITY ANALYSIS
SECTION 2
The Basis for Producibility Metrics 2 1
2.1 The Producibility Game 2 1
2.2 Extending the Producibility Game 2 3
2.3 Translating Probability Theory to Producibility Metrics 2 4
2.4 Application of the Basic Metrics 2 8
SECTION 3
The Model for Producibility Analysis 3 1
3.1 Estimating Long Term Producibility 3 1
3.2 The Role of Parameter Capability Data 3 1
3.3 The Role of Mechanical Engineering 3 3
3.4 The Role of Electrical Engineering 3 3
3.5 The Role of Manufacturing and Quality Engineering 3 4
3.6 Estimating Long Term Design Producibility 3 4
3.7 Estimating Short Term Design Producibility 3 4
3.8 Analysis of Design Robustness 3 5
3.9 Producibility Optimization Alternatives 3 6
3.10 Synopsis of the Producibility Assessment Model 3 6
PART II: PROCESS CHARACTERIZATION
SECTION 4
The Model For Process Characterization 4 1
4.1 Toward a Definition of Process Characterization 4 1
4.2 The Four Phases of Process Characterization 4 2
4.3 Focusing the Output from Characterization Studies 4 3
4.4 Planning Process Characterization Studies 4 4
SECTION 5
The Statistical Basis for Characterization Metrics 5 1
5.1 The Example Product for Illustration 5 1
5.2 Measures of Central Tendency 5 1
5.3 Measures of Variability 5 2
5.4 Graphical Display of Variation 5 4
5.5 Probability and the Normal Curve 5 6
5.6 The Standard Transform 5 9
v
TABLE OF CONTENTS (CONT)
SECTION 5 (CONT) Page
5.7 Application of the Z Transform 5 10
5.8 Measures of Capability for Continuous Data 5 11
5.9 Measures of Capability for Discrete Data 5 13
SECTION 6
The Theoretical Basis for Characterization Metrics 6 1
6.1 The Concept of Instantaneous Reproducibility 6 1
6.2 The Concept of Dynamic Mean Variation 6 7
6.3 The Concept of Static Mean Variation 6 13
6.4 The Simultaneous Occurrence of Dynamic and Static Mean Behavior 6 15
6.5 Example Application to Design Analysis 6 16
6.6 The Basis for Establishing k 6 18
6.7 Basic Metrics for Discrete Data 6 19
PART III: EXAMPLES AND APPLICATIONS
SECTION 7
Application of the Characterization Methodology 7 1
7.1 Part A: Preparing for a Capability Study 7 1
7.2 Part B: Progression for Estimating Capability 7 3
7.3 Mechanics Related to Response Parameter Yi Continuous Data 7 4
7.4 Mechanics Related to Response Parameter Y2 Continuous Data 7 7
7.5 Mechanics Related to Response Parameter Y3 Discrete Data 7 8
7.6 Mechanics Related to Response Parameter Y4 Discrete Data 7 9
7.7 Mechanics for Pooling Characteristics 7 10
7.8 Reporting Capability Metrics 7 11
SECTION 8
Process Characterization Case Study 8 1
8.1 Introduction 8 1
8.2 Case Study Background Information 8 1
8.3 Phase I: Parameter Definition 8 3
8.4 Phase II: Parameter Analysis 8 8
8.5 Phase III: Parameter Optimization 8 17
8.6 Phase IV: Parameter Control 8 18
ABOUTTHE AUTHORS Authors 1
ACKNOWLEDGEMENTS Acknowledgements 1
REFERENCES References 1
BIBLIOGRAPHY Bibliography 1
Page
APPENDIX A General Checklist Related to Each of the Generic Problem Solving Activities A l
APPENDIX B Table of d2 and d2* Values B l
APPENDIX C Table of Unilateral Tail Area Under the Normal Curve Beyond Selected Z Values C l
APPENDIX D Statistical Estimates of Parts Per Million Defective for Various Defect Counts and Units D l
APPENDIX E Percentiles of the t Distributions E l
APPENDIX F Table of Chi Square Values F l
APPENDIX G Simulation of the Effect of Mean Perturbations on the Standard Deviation G l
GLOSSARY OF TERMS Glossary 1
INDEX Index 1
LIST OF ILLUSTRATIONS
Number Page
1 1 Illustration Relating Motorola s Financial Performance to Quality 1 1
1 2 The Malcolm Baldrige National Quality Award 1 1
1 3 Individual Definitions Relating to Customer Satisfaction 1 2
1 4 Relationship Between the Three Primary Sources of Variation 1 3
1 5 The Classical Bathtub Curve of Product Reliability and its Underlying Components 1 4
1 6 The Window of Opportunity Related to Customer Satisfaction 1 5
i 1 7 The Six Sigma Initiatives that Underlie the Optimization of Producibility and Customer Satisfaction .... 1 6
I 1 8 How the 6 T Initiatives Blend Together to Achieve Total Customer Satisfaction 1 6
] 2 1 Exhaustive Combinations Given by a Pair of Dice 2 1
2 2 Bar Chart of the Probabilities Associated with a Pair of Dice 2 2
2 3 Abstract Unit of Product Consisting of 10 Equal Areas of Opportunity for Nonconformance 2 4
2 4 Probability of Zero Defects for the Abstract Product Example Under the Constraint m =10 and dpu =1.0 2 5
2 5 A Comparison of the Poisson and Binomial Models 2 8
3 1 Photo of the AN/PRC 112(V) Radio Set 3 1
3 2 Selected Engineering Drawings of the AN/PRC 112(V) Radio Set 3 1
3 3 Selected PCB Contained within the AN/PRC 112(V) Radio Set 3 2
3 4 The Effect of Capability and Complexity on Rolled Throughput Yield 3 5
4 1 The Potential Scope (Columns) and Extent (Rows) of a Process Characterization Study 4 2
4 2 Parameter Characterization Strategy 4 3
4 3 The Basic Conceptual Structure for Translating the Critical Planning
Questions into Application Terminology 4 6
4 4 Selected Planning Considerations Related to a Process Characterization Study 4 7
4 5 The Fundamental Elements Which Constitute the Chain of Analytical Success 4 8
4 6 General Planning Matrix Used to Sequence the Generic Problem Solving Activities in the
Context of Process Characterization 4 10
4 7 Action Plan and Time Line Related to the Characterization of a Plasma Cleaning Process 4 11
4 8 Resource Allocation Plan Related to the Characterization of a Plasma Cleaning Process 4 12
4 9 Resource Tracking Profile Related to the Characterization of a Plasma Cleaning Process 4 13
5 1 Illustration of the Widget Product 5 1
5 2 Progressive Development of the Normal Distribution 5 5
5 3 Typical Areas Under the Normal Curve 5 6
5 4 The Graphic Concept of Mean Centered Six Sigma Performance 5 7
5 5 The Graphic Concept of Mean Shifted Six Sigma Performance 5 8
5 6 Z Scale Contrasted to Raw Units of Measure in Relation to the Normal Distribution 5 10
5 7 Concepts Underlying Cp and Cpk* 5 13
6 1 Graphic Depiction of the Pareto Principle 6 4
6 2 The 95 Percent Confidence Interval of l for a Selected Range of Sample Size (n) 6 6
6 3 The 95 Percent Confidence Interval of O for a Selected Range of Sample Size (n) 6 6
6 4 The Effect of Drift as a Function of Tool Wear Over Time 6 8
6 5 The Effect of Dynamic Mean Variation on Production Yield 6 9
LIST OF ILLUSTRATIONS (CONT) ;
Number Pa«e |
6 6 Tail Area Comparison Between Dynamic and Static Mean Variation Under
the Constraint of a Unilateral Tolerance 6 10
6 7 Tail Area Comparison Between Dynamic and Static Mean Variation Under
the Constraint of a Symmetrical Bilateral Tolerance 6 10
6 8 The Relationship Between Soeq and c for Selected Values of Short Term Unilateral Capability 6 11 j
6 9 Dynamic State 6a Distribution: the Influence of Long Term Dynamic Mean Variation j
(parameters: CP = 2.0, c = 1.333, and Cp» = 1.5) 6 14 I
6 10 Static State 6a Distribution: the Influence of a Long Term, Sustained Mean Offset j
(parameters: CP = 2.0, k = .250,5a = 1.5, and C,** = 1.5) 6 15 j
6 11 Best Estimate of the Population ppm for Various Values of N 6 21 |
7 1 Standard Benchmarking Chart for the Presentation of Characterization Data 7 13
8 1 Basic Configuration for the XYZ Family of Printed Circuit Boards 8 1
8 2 Factory Yield for the XYZ Family of Printed Circuit Boards 8 2
8 3 Comparison of Factory and XYZ Scrap Costs 8 2
8 4 Scatter Diagram Relating Yield to Production Volume 8 2
8 5 Illustration of Fixed Location Y Grind Micro Section 8 3
8 6 Breakdown of the Random Location Z Grind Method 8 5
8 7 Histogram Associated with the Fixed Location Y Grind Method 8 5
8 8 Histogram Associated with the Random Location Z Grind Method 8 5
8 9 Experimental Outcomes of the Inspector (Rater) Error Analysis 8 6
8 10 Scatter Diagram Depicting Coupon to Board Correlation (Minimum Measurements) 8 6
8 11 Comparison of Coupon and Intelligent Area Distributions 8 7
8 12 Breakdown of the Plating Tank Rack Positions (Multi Vari Study) 8 10
8 13 Breakdown of XYZ Intelligent Board Area (Multi Vari Study) 8 10
8 14 Expanded View of XYZ Quadrant Area (Multi Vari Study) 8 11
8 15 Breakdownof XYZ Coupon Area (Multi Vari Study) 8 11
8 16 Multi Vari Chart of Quadrant and Coupon Averages 8 12
8 17 Multi Vari Chart of Subquadrant and Coupon Averages 8 12
8 18 Multi Vari Chart of Quadrant and Coupon Standard Deviations 8 13
8 19 Multi Vari Chart of Subquadrant and Coupon Standard Deviations 8 13
8 20 Comparison of Brainstorming Categories 8 14
8 21 Experimental Factors and Test Levels Identified During the Brainstorming Process 8 15
8 22 Control Variables and Test Levels Identified During the Brainstorming Process 8 15
8 23 Fractional Factorial Design Matrix 8 16
8 24 Display of Relative Effects Related to the Experimental Factors and Interactions 8 16
8 25 Example of Systematic Sorting for Data Analysis 8 17
8 26 Sequential Plot of Experimental Standard Deviations After Sorting on Factor G 8 18
8 27 Sequential Plot of Experimental Standard Deviations After Sorting on Factor H 8 18
8 28 Post Study Comparison of the Histograms Related to the Intelligent Board Area and Test Coupon 8 18
LIST OF TABLES
Number Page
2 1 Probability of Zero Defects as m Increases Under the Constraint dpu =1.0 2 5
2 2 Poisson Distribution of Defects Under the Constraint that m is Large and dpu = 1.0 2 6
4 1 General Step Wise Progression Associated with the Process Characterization Strategy 4 4
4 2 Analytical Tools Commonly Applied During the Course of Process Characterization
Broken Down by Phase and Likelihood of Use 4 5
4 3 Generic Planning Activities for Problem Solving Presented in the Context of the
Process Characterization Strategy Coded by Relative Frequency of Use 4 9
5 1 Tabulated Values of d2* for a Selected Number of Subgroups (N) of Size n = 5 5 4
6 1 Components of Error Related to the Given Product Example 6 3
6 2 Display of the Outcomes Related to the Three Error Reduction Strategies 6 3
7 1 Background Information Related to the ABC Process Example 7 4
7 2 Raw Data and Summary Statistics for Parameter Yi 7 4
7 3 Raw Data Associated with Parameter Y2 7 7
7 4 Short Term Performance Information Related to Parameters Yi... Y4 7 10
7 5 Long Term Performance Information Related to Parameters Yi... Y4 7 11
7 6 Standardized Reporting Table for Process Characterization Metrics (Example Data Provided) 7 12
8 1 Summary Capability Information Related to the XYZ Circuit Board Family 8 9
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| spelling | Harry, Mikel J. Verfasser aut Six sigma producibility analysis and process characterization Mikel J. Harry ; J. Ronald Lawson Reading, MA Addison-Wesley 1992 Getr. Zählung zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Lawson, J. Ronald Verfasser aut HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=006296125&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Harry, Mikel J. Lawson, J. Ronald Six sigma producibility analysis and process characterization |
| title | Six sigma producibility analysis and process characterization |
| title_auth | Six sigma producibility analysis and process characterization |
| title_exact_search | Six sigma producibility analysis and process characterization |
| title_full | Six sigma producibility analysis and process characterization Mikel J. Harry ; J. Ronald Lawson |
| title_fullStr | Six sigma producibility analysis and process characterization Mikel J. Harry ; J. Ronald Lawson |
| title_full_unstemmed | Six sigma producibility analysis and process characterization Mikel J. Harry ; J. Ronald Lawson |
| title_short | Six sigma producibility analysis and process characterization |
| title_sort | six sigma producibility analysis and process characterization |
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