Scanning electron microscopy: Proceedings of the Annual Scanning Electron Microscopy Symposium 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Chicago, Ill.
1979
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Internformat
MARC
| LEADER | 00000nam a2200000 cc4500 | ||
|---|---|---|---|
| 001 | BV009381848 | ||
| 003 | DE-604 | ||
| 005 | 19960325 | ||
| 007 | t | ||
| 008 | 940401s1979 |||| 10||| und d | ||
| 035 | |a (OCoLC)634371574 | ||
| 035 | |a (DE-599)BVBBV009381848 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 245 | 1 | 0 | |a Scanning electron microscopy |b Proceedings of the Annual Scanning Electron Microscopy Symposium |n 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979 |c Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| 264 | 1 | |c 1979 | |
| 264 | 1 | |a Chicago, Ill. | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 700 | 1 | |a Johari, Om |e Sonstige |4 oth | |
| 711 | 2 | |a Scanning Electron Microscope Symposium |j Sonstige |0 (DE-588)2880-0 |4 oth | |
| 773 | 0 | 8 | |w (DE-604)BV009381834 |g 1979,1 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006225743 | ||
Datensatz im Suchindex
| _version_ | 1804123788591235072 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV009381848 |
| ctrlnum | (OCoLC)634371574 (DE-599)BVBBV009381848 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01025nam a2200253 cc4500</leader><controlfield tag="001">BV009381848</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19960325 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940401s1979 |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634371574</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009381848</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning electron microscopy</subfield><subfield code="b">Proceedings of the Annual Scanning Electron Microscopy Symposium</subfield><subfield code="n">1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979</subfield><subfield code="c">Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1979</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chicago, Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Johari, Om</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Scanning Electron Microscope Symposium</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)2880-0</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV009381834</subfield><subfield code="g">1979,1</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006225743</subfield></datafield></record></collection> |
| id | DE-604.BV009381848 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:35:20Z |
| institution | BVB |
| institution_GND | (DE-588)2880-0 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006225743 |
| oclc_num | 634371574 |
| open_access_boolean | |
| publishDate | 1979 |
| publishDateSearch | 1979 |
| publishDateSort | 1979 |
| record_format | marc |
| spelling | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* 1979 Chicago, Ill. txt rdacontent n rdamedia nc rdacarrier Johari, Om Sonstige oth Scanning Electron Microscope Symposium Sonstige (DE-588)2880-0 oth (DE-604)BV009381834 1979,1 |
| spellingShingle | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_auth | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_exact_search | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium |
| title_full | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_fullStr | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_full_unstemmed | Scanning electron microscopy Proceedings of the Annual Scanning Electron Microscopy Symposium 1979,1. An international review of advances in techniques and applications of the scanning microscope. - 1979 Urheber: Scanning Electron Microscope Symposium ; Illinois Institute of Technology <Chicago, Ill.> / Research Institute. Hrsg. von Om Johari* |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy proceedings of the annual scanning electron microscopy symposium |
| title_sub | Proceedings of the Annual Scanning Electron Microscopy Symposium |
| volume_link | (DE-604)BV009381834 |
| work_keys_str_mv | AT johariom scanningelectronmicroscopyproceedingsoftheannualscanningelectronmicroscopysymposium19791aninternationalreviewofadvancesintechniquesandapplicationsofthescanningmicroscope1979 AT scanningelectronmicroscopesymposium scanningelectronmicroscopyproceedingsoftheannualscanningelectronmicroscopysymposium19791aninternationalreviewofadvancesintechniquesandapplicationsofthescanningmicroscope1979 |