Thin films: the relationship of structure to properties ; symposium held April 15 - 17, 1985, San Francisco, Calif., USA
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Bibliographic Details
Format: Book
Language:English
Published: Pittsburgh Materials Research Soc. 1985
Series:Materials Research Society: Materials Research Society symposia proceedings 47
Subjects:
Physical Description:XIII, 292 S. Ill., graph. Darst.
ISBN:093183712X

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