X-ray diffraction by disordered lamellar structures: theory and applications to microdivided silicates and carbons
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| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin u.a.
Springer
1990
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| Subjects: | |
| Online Access: | Inhaltsverzeichnis |
| Item Description: | Aus dem Franz. übers. |
| Physical Description: | XVII, 371 S. graph. Darst. |
| ISBN: | 3540512225 0387512225 |
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| 100 | 1 | |a Dric, Viktor A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a X-ray diffraction by disordered lamellar structures |b theory and applications to microdivided silicates and carbons |c Victor A. Drits ; Cyril Tchoubar |
| 264 | 1 | |a Berlin u.a. |b Springer |c 1990 | |
| 300 | |a XVII, 371 S. |b graph. Darst. | ||
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Record in the Search Index
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| adam_text | VICTOR A. DRITS CYRIL TCHOUBAR X-RAY DIFFRACTION BY DISORDERED LAMELLAR
STRUCTURES THEORY AND APPLICATIONS TO MICRODIVIDED SILICATES AND CARBONS
WITH THE COLLABORATION OF G. BESSON, A. S. BOOKIN, F. ROUSSEAUX B. A.
SAKHAROV AND D. TCHOUBAR FOREWORD BY ANDRE GUINIER FACHBEREICH
MAIERIALWISSENSCHAFT DER TECHN. HOCHSCHULE DARMSTADT INV.-NR.;
SPRINGER-VERLAG BERLIN HEIDELBERG NEW YORK LONDON PARIS TOKYO HONG KONG
BARCELONA CONTENTS FOREWORD V PREFACE VII CHAPTER 1 OVERALL DESCRIPTION
OF IMPERFECT LAMELLAR CRYSTALS 1 1.1 SOME REMINDERS ON THE SPECIFIC
CHARACTERISTICS OF CRYSTALS WITH A TRIPERIODIC STRUCTURE 1 1.2 RANGE OF
VALIDITY OF THE DIRECT METHODS OF STRUCTURAL ANALYSIS .. 1 1.2.1
CRYSTALS WITH POINT DEFECTS 2 1.2.2 CRYSTALS WITH PLANAR DEFECTS * 3 1.3
INDIRECT STRUCTURAL ANALYSIS OF PARTIALLY DISORDERED LAMELLAR SYSTEMS.
PRINCIPLES OF THEIR MODELIZATION 4 1.4 DETERMINATION OF THE STRUCTURAL
CHARACTERISTICS OF THE LAYERS .... 5 1.5 GENERAL CHARACTERISTICS OF
TRIPERIODIC LAYER STACKINGS 8 1.5.1 CHARACTERISTIC TRANSLATIONS OF LAYER
STACKINGS 8 1.5.2 POLYTYPIC MODIFICATIONS 9 1.5.3 TRIPERIODIC LAMELLAR
STRUCTURES WITH LAYERS CONTAINING ISOMORPHIC SUBSTITUTIONS OR WITH
DIFFERENT TYPES OF LAYERS 10 1.6 PRINCIPAL CHARACTERISTICS OF LAMELLAR
STRUCTURES WITH STACKING FAULTS 10 1.6.1 TRANSLATION STACKING FAULTS 11
1.6.2 ROTATION STACKING FAULTS 13 1.6.3 STACKING FAULTS DUE TO
ENANTIOMORPHISM 13 1.6.4 WELL-DEFINED STACKING FAULTS 17 1.6.5 RANDOM
STACKING FAULTS 18 1.6.6 STACKING FAULTS DUE TO FLUCTUATIONS IN THE
POSITION OF THE LAYERS. DISORDERS OF THE FIRST AND SECOND TYPES 18 1.6.7
PARTICLES, CRYSTALLITES AND INTERFERENTIAL COHERENCE DOMAINS 21 1.7
PRINCIPAL CHARACTERISTICS OF INTERSTRATIFIED MINERALS 22 1.7.1
INTERSTRATIFIED SYSTEM CHARACTERIZATION BY THE STACKING MODE OF THE
LAYERS 23 1.7.2 ORDER-DISORDER IN THE SEQUENCE OF LAYERS OF DIFFERENT
TYPES .... 24 1.8 COMMENSURATE AND INCOMMENSURATE STRUCTURES IN
INTERSTRATIFIED SYSTEMS 27 REFERENCES 31 XII CONTENTS CHAPTER 2 THEORY
OF THE DIFFRACTION PHENOMENON PRODUCED BY POWDERS OF MICROCRYSTALS WITH
A LAMELLAR STRUCTURE 33 2.1 DIFFRACTION FROM AN ISOLATED LAYER OF FINITE
EXTENT 33 2.2 DIFFRACTION FROM A DEFECT-FREE STACK OF IDENTICAL LAYERS
37 2.2.1 GENERAL DESCRIPTION OF THE DIFFRACTION 37 2.2.2 EFFECT OF THE
THINNESS OF THE INTERFERENTIAL COHERENCE DOMAINS ON THE INTENSITY
DISTRIBUTION. APPARENT IRRATIONALITY OF THE 00/ REFLECTIONS .,. 40 2.3
DIFFRACTION BY A POWDER OF PARTICLES WITH TOTALLY RANDOM ORIENTATION 43
2.3.1 GENERAL EXPRESSION FOR THE INTENSITY OF THE WAVE DIFFRACTED BY AN
ISOTROPIC POWDER 43 2.3.2 THE TANGENT CYLINDER APPROXIMATION 46 2.3.3
PHYSICAL SIGNIFICANCE OF AND GENERAL EXPRESSION FOR T(U) 47 2.3.4
COMPUTATION OF T(U) FOR RECTANGULAR INTERFERENTIAL COHERENCE DOMAINS 52
2.4 DIFFRACTION FROM A POWDER OF PARTIALLY ORIENTED PARTICLES 54 2.4.1
DEFINITION OF THE SPATIAL DISTRIBUTION OF THE PARTICLES IN A POWDER 55
2.4.2 DIFFRACTION FROM A PARTIALLY ORIENTED POWDER IN A SYMMETRICAL 9*29
TRANSMISSION MOUNTING 57 2.4.3 DIFFRACTION FROM A PARTIALLY ORIENTED
POWDER IN AN ASYMMETRICAL TRANSMISSION MOUNTING OR IN A REFLECTION
ARRANGEMENT 62 2.4.4 DIFFRACTION FROM A PARTIALLY ORIENTED POWDER IN THE
PARTICULAR CASE OF THE (00) ROD 64 REFERENCES 66 CHAPTER 3 DIFFRACTION
FROM LAMELLAR CRYSTALS WITH STACKING FAULTS 69 3.1 GENERAL EXPRESSION
FOR THE DIFFRACTION PRODUCED BY STACKS OF LAYERS WITH POSITION DEFECTS
70 3.1.1 MATHEMATICAL DESCRIPTION OF THE DIFFRACTION 70 3.1.2 THE MATRIX
FORMALISM 71 3.2 DIFFRACTION PRODUCED BY STACKS CONTAINING ROTATION OR
TRANSLATION FAULTS WITHOUT MUTUAL INTERACTION 77 3.2.1 EFFECTS OF RANDOM
ROTATION OR TRANSLATION STACKING DEFECTS ON THE DIFFRACTION 77 3.2.2
EFFECT OF WELL-DEFINED TRANSLATION DEFECTS ON THE DIFFRACTION ... 81
3.2.3 EFFECT OF WEIL-DEFINED ROTATION DEFECTS ON THE DIFFRACTION 83 3.3
DIFFRACTION PRODUCED BY STACKS WITH DEFECTS DUE TO FLUCTUATIONS IN THE
POSITIONS OF THE LAYERS 87 3.3.1 POSITION FLUCTUATIONS LEADING TO A
DISORDER OF THE FIRST TYPE ... 89 3.3.2 POSITION FLUCTUATIONS LEADING TO
A DISORDER OF THE SECOND TYPE . 90 CONTENTS XIII 3.3.3 DETERMINATION OF
THE MEAN STANDARD DEVIATION OF THE FLUCTUATIONS AFFECTING THE INTERLAYER
DISTANCES BY DIRECT PROFILE ANALYSIS OF THE 00/ REFLECTIONS 94 3.3.4
COMPARISON OF THE EFFECTS OF RANDOM DEFECTS AND OF POSITION FLUCTUATIONS
ON THE DIFFRACTION 96 3.3.5 COMPARISON OF THE PHYSICAL SIGNIFICANCES
ATTACHED TO THE CONCEPTS OF RANDOM DEFECTS AND OF POSITION FLUCTUATION
DEFECTS 98 REFERENCES 101 CHAPTER 4 STATISTICAL MODELS AND PARAMETERS
USED TO DESCRIBE INTERSTRATIFIED LAMELLAR SYSTEMS 103 4.1 GENERAL
PARAMETERS CHARACTERIZING THE STACKING OF DIFFERENT LAYERS IN
INTERSTRATIFIED STRUCTURES 103 4.2 INTERSTRATIFIED STRUCTURES WITH S = 0
106 4.3 INTERSTRATIFIED STRUCTURES WITH S = 1 107 4.3.1 DETERMINATION OF
THE INDEPENDENT PARAMETERS CHARACTERIZING TWO-COMPONENT STRUCTURES 107
4.3.2 CLASSIFICATION OF TWO-COMPONENT STRUCTURES AS A FUNCTION OF THE
DEGREE OF ORDER IN THE SEQUENCE OF LAYERS 109 4.3.3 INTERSTRATIFIED
STRUCTURES WITH THREE TYPES OF LAYERS -. 112 4.4 INTERSTRATIFIED
STRUCTURES WITH S = 2 * 114 4.4.1 RELATIONSHIPS BETWEEN THE PROPORTIONS
OF DIFFERENT TYPES OF LAYERS AND THE CONDITIONAL PROBABILITIES 114 4.4.2
CHOICE OF THE INDEPENDENT PARAMETERS 116 4.4.3 CLASSIFICATION OF
STRUCTURES WITH S = 2 AS A FUNCTION OF THE DEGREE OF ORDER IN THE
SEQUENCE OF LAYERS 118 4.4.4 INTERSTRATIFIED STRUCTURES WITH S = 2 AND G
TYPES OF LAYERS 122 4.5 INTERSTRATIFIED STRUCTURES WITH S = 3 122 4.6
DEGREE OF HOMOGENEITY FOR POWDERS OF THIN PARTICLES WITH MARKOVIAN
INTERSTRATIFICATION (QUASI-HOMOGENEOUS SYSTEM) 124 4.7 PARAMETERS FOR
THE CHARACTERIZATION OF HOMOGENEOUS INTERSTRATIFIED SYSTEMS 127 4.7.1
HOMOGENEOUS TWO-COMPONENT (A AND B) SYSTEMS WITH S = 0 ... 129 4.7.2
HOMOGENEOUS TWO-COMPONENT SYSTEMS WITH S = 0 AND RESTRICTIVE CONDITIONS
FOR THE SEQUENCE OF LAYERS 131 REFERENCES 132 CHAPTER 5 DIFFRACTION
METHODS ADAPTED TO THE STRUCTURAL ANALYSIS OF INTERSTRATIFIED SYSTEMS
135 5.1 DIRECT METHODS OF STRUCTURAL ANALYSIS 136 5.1.1 THE METHOD OF
D YAKONOV 136 XIV CONTENTS 5.1.2 COMPUTATION OF THE FUNCTION (P (Z) 138
5.1.3 COMPARISON OF THE MAC EWAN AND D YAKONOV DIRECT METHODS OF
STRUCTURAL ANALYSIS 139 5.2 INDIRECT METHODS OF STRUCTURAL ANALYSIS
BASED ON THE COMPUTATION OF THE INTENSITIES OF BASAL REFLECTIONS 140
5.2.1 CALCULATION OF AN INTERFERENCE FUNCTION USING A SINGLE STRUCTURE
FACTOR 140 5.2.2 METHODS OF INTENSITY CALCULATION USING DIFFERENT
STRUCTURE FACTORS 142 5.3 DIFFRACTION BY SYSTEMS WITH G TYPES OF LAYERS,
WITH A SPECIFIC TRANSLATION R BETWEEN THE ADJACENT I-TYPE AND J-TYPE
LAYERS, FOR ANY GIVEN VALUE OF S 148 5.3.1 EXPRESSIONS FOR THE MATRICES
[W], [O], AND [Q], WHEN S = 0 OR 1 150 5.3.2 EXPRESSIONS FOR [W], [O],
AND [Q] WHEN S = 2 150 5.3.3 EXPRESSIONS FOR [W], [ &], AND [Q] WHEN S =
3 153 5.3.4 THE MATRICES [W], [O] AND [Q] IN THE CASE OF INTERSTRATIFIED
SYSTEMS WITH G COMPONENTS, FOR ANY GIVEN VALUE OF S 155 5.4 INTENSITY OF
THE WAVE DIFFRACTED BY SYSTEMS WITH G TYPES OF LAYERS, FOR ANY VALUE OF
S AND R 156 5.4.1 MATRIX FORMALISM FOR SYSTEMS WITH IDENTICAL LAYERS IN
THE SAME AZIMUTHAL ORIENTATION, WITH TRANSLATIONAL DEFECTS AND AN
INTERACTION PARAMETER R 1 156 5.4.2 MATRIX FORMALISM FOR
INTERSTRATIFIED STRUCTURES WITH ANY NUMBER OF TRANSLATIONS WITHOUT
MUTUAL INTERACTION (R = 0) 157 5.4.3 MATRIX FORMALISM IN THE GENERAL
CASE OF INTERSTRATIFIED SYSTEMS . 159 5.5 GENERAL REMARKS 163 REFERENCES
163 CHAPTER 6 EXPERIMENTAL TECHNIQUES ADAPTED TO THE STUDY OF
MICRODIVIDED LAMELLAR SYSTEMS 165 6.1 SURVEY OF THE TECHNIQUES MOST
FREQUENTLY USED IN POWDER DIFFRACTOMETRY 165 6.1.1 THE POWDER DIAGRAM
165 6.1.2 THE DEBYE-SCHERRER-HULL MOUNTINGS 166 6.1.3 USE OF A RECORDING
COUNTER AND OF A MONOCHROMATOR 168 6.1.4 ADVANTAGES AND DRAWBACKS OF THE
REFLECTION AND TRANSMISSION MOUNTINGS 170 6.2 ADAPTATION OF TRANSMISSION
TECHNIQUES TO THE STUDY OF MICRODIVIDED LAMELLAR SYSTEMS 171 6.2.1 THE
X-RAY SOURCE 171 6.2.2 THE MONOCHROMATOR 172 6.2.3 PARTICULAR FEATURES
OF THE SPECIMEN 174 6.2.4 THE GONIOMETER 174 CONTENTS XV 6.2.5 THE
DETECTOR AND COUNTING EQUIPMENT 175 6.3 PERTURBING FACTORS WHICH CAN BE
MINIMIZED 177 6.3.1 CHOICE OF THE SLIT-WIDTHS IN THE PATH OF THE X-RAY
BEAM 177 6.3.2 OPTIMAL SLIT HEIGHT 178 6.3.3 CHOICE OF SAMPLE THICKNESS
179 6.4 PRINCIPAL CORRECTIONS ON THE DIFFRACTION PATTERNS 181 6.4.1
CORRECTION OF EFFECTS DUE TO POLARIZATION OF THE X-RAY BEAMS ... 181
6.4.2 CORRECTION OF EFFECTS DUE TO SAMPLE ABSORPTION 181 6.4.3
CORRECTION FOR THE NONLINEAR RESPONSE OF THE LOCALIZATION DETECTOR 185
6.5 PERTURBING FACTORS INTRODUCED IN THE COMPUTATION OF THE THEORETICAL
DIFFRACTOGRAMS 187 6.5.1 LORENTZ FACTOR 187 6.5.2 ORIENTATION FUNCTION
FOR THE PARTICLES IN A POWDER -. 190 6.6 DETERMINATION OF THE ABSOLUTE
INTENSITY SCALE 194 6.6.1 DEFINITION OF THE ABSOLUTE SCALE 194 6.6.2
DETERMINATION OF THE ABSOLUTE SCALE 195 6.6.3 EXAMPLES AND APPLICATIONS
195 REFERENCES 198 CHAPTER 7 STRUCTURAL CHARACTERISTICS OF CARBONS 199
7.1 GENERAL CHARACTERISTICS OF CARBON MATERIALS 199 7.1.1 GENERAL
DESCRIPTION 199 7.1.2 BASIC FEATURES OF THE GRAPHITIZATION PROCESS 200
7.2 STRUCTURAL CHARACTERISTICS OF THE GRAPHITIZATION PROCESS 201 7.2.1
STRUCTURAL STUDY OF THE CARBON LAYERS 202 7.2.2 EXAMPLES OF STRUCTURAL
EVOLUTION IN THE CARBON LAYER AS A FUNCTION OF THE THERMAL TREATMENT 207
7.3 ORGANIZATION OF THE STACKS 220 7.3.1 STRUCTURE OF THE STACKS IN THE
TWO GRAPHITE POLYTYPES 220 7.3.2 STRUCTURE OF THE STACKS IN A CARBON
UNDERGOING GRAPHITIZATION .. ,221 REFERENCES 230 CHAPTER 8 THE
MODELIZATION METHOD IN THE DETERMINATION OF THE STRUCTURAL CHAR-
ACTERISTICS OF SOME LAYER SILICATES: INTERNAL STRUCTURE OF THE LAYERS,
NATURE AND DISTRIBUTION OF THE STACKING FAULTS 233 8.1 STRUCTURAL
DEFECTS IN KAOLINITE 233 8.1.1 COMMON FEATURES OF THE LAYERS IN KAOLIN
MINERALS 235 8.1.2 COMMON FEATURES OF THE 1:1 LAYERS IN DICKITE AND
NACRITE 235 8.1.3 CHARACTERISTICS OF THE 1:1 LAYER IN KAOLINITE 237
8.1.4 COMPARISON OF THE KAOLINITE AND DICKITE UNIT CELLS 238 XVI
CONTENTS 8.1.5 MODELS FOR THE STACKING FAULTS IN KAOLINITE 240 8.1.6
COMPARISON BETWEEN CALCULATED AND EXPERIMENTAL XRD PATTERNS 249 8.2
DISTRIBUTION OF THE CATIONS IN THE CIS AND TRANS OCTAHEDRAL SITES OF
DIOCTAHEDRAL SMECTITES 254 8.2.1 PREPARATION TECHNIQUES FOR SMECTITE
SAMPLES USED IN THE DIFFRACTOMETRIC DETERMINATION OF THE DISTRIBUTION OF
CATIONS IN OCTAHEDRAL SITES 255 8.2.2 DETERMINATION OF THE OCTAHEDRAL
CATION DISTRIBUTION IN K-SMECTITES BY OBLIQUE TEXTURE ELECTRON
DIFFRACTION 256 8.2.3 DETERMINATION OF THE DISTRIBUTION OF OCTAHEDRAL
CATIONS IN K + -NONTRONITES BY XRD 262 8.2.4 ANALYSIS OF THE XRD POWDER
PATTERNS FROM DIOCTAHEDRAL CS-SMECTITES 267 8.3 DETERMINATION OF THE
DISTRIBUTION OF CATIONS AND WATER MOLECULES IN THE INTERLAMELLAR SPACES
OF DIOCTAHEDRAL SMECTITES . 272 8.3.1 EXPERIMENTAL CONDITIONS 272 8.3.2
ANALYSIS OF THE PROFILE OF THE 00/ REFLECTIONS FROM A TWO-WATER-LAYER
NA-BEIDELLITE (SAMPLE EJ .: 273 8.3.3 QUALITATIVE DESCRIPTION OF THE
(02, 11), (20, 13) AND (04, 22) BANDS GIVEN BY TWO-WATER-LAYER NA +
-BEIDELLITE 275 8.3.4 DETERMINATION OF THE X,Y COORDINATES OF THE SITES
OCCUPIED BY WATER MOLECULES 277 8.3.5 THE DIFFERENT POSSIBLE STACKINGS
OF LAYERS IN TWO-WATER-LAYER NA-BEIDELLITE 280 8.3.6 DETERMINATION OF
THE STRUCTURAL CHARACTERISTICS OF THE TWO-WATER-LAYER NA + -BEIDELLITE
BY FITTING THE CALCULATED PATTERN TO THE EXPERIMENTAL XRD DATA 280 8.3.7
STRUCTURAL CHARACTERISTICS OF ONE-WATER-LAYER NA + -BEIDELLITE.
COMPARISON WITH THE TWO-WATER-LAYER HYDRATE 281 8.4 STRUCTURAL DEFECTS
IN GLAUCONITES 284 8.4.1 STRUCTURE OF THE GLAUCONITES 284 8.4.2 CHOICE
OF THE SAMPLES, EXPERIMENTAL CONDITIONS AND DESCRIPTION OF THE
EXPERIMENTAL DIFFRACTOGRAMS 285 8.4.3 DETERMINATION OF THE UNIT CELL
PARAMETERS AND OF THE ATOMIC COORDINATES 286 8.4.4 STRUCTURAL MODELS FOR
GLAUCONITES DEVOID OF STACKING DEFECTS ... 289 8.4.5 MODELS WITH
WELL-DEFINED 120 ROTATIONAL STACKING FAULTS 293 8.4.6 STRUCTURAL
MODELS WITH ENANTIOMORPHIC LAYERS 294 8.4.7 STRUCTURAL MODEL WITH N 60
ROTATIONAL STACKING FAULTS AND R = 0 296 8.4.8 STRUCTURAL MODEL WITH N
60 ROTATIONAL STACKING FAULTS AND R = 1 298 8.4.9 DETERMINATION OF THE
STRUCTURAL PARAMETERS CHARACTERISTIC OF GLAUCONITES 298 REFERENCES 300
CONTENTS XVII CHAPTER 9 DETERMINATION OF THE STRUCTURAL CHARACTERISTICS
OF MIXED-LAYER MINERALS 305 9.1 THE METHOD OF D YAKONOV 305 9.1.1
PRACTICAL EXAMPLE OF THE USE OF THE D YAKONOV METHOD 306 9.1.2 APPRAISAL
OF THE D YAKONOV METHOD 310 9.2 GENERAL GUIDELINES FOR THE USE OF
MODELIZATION OF X-RAY DIFFRACTOGRAMS IN THE STUDY OF MIXED-LAYER
MINERALS 315 9.2.1 DETERMINATION OF THE NATURE OF THE LAYER TYPES 316
9.2.2 CHEMICAL COMPOSITION AND STRUCTURE OF THE LAYERS AND OF THE
INTERLAYER SPACES 318 9.2.3 CHOICE OF THE ORIGIN FOR THE Z ORDINATES OF
ATOMS IN THE SCATTERING UNITS 318 9.3 CALCULATION OF THE REFERENCE X-RAY
DIFFRACTOGRAM FOR QUASI-HOMOGENEOUS INTERSTRATIFIED MINERALS 320 9.3.1
SPECIFIC FEATURES OF THE X-RAY DIFFRACTOGRAMS GIVEN BY INTERSTRATIFIED
I-M SYSTEMS WITH S = 0 OR 1 322 9.3.2 CHARACTERISTICS OF THE X-RAY
DIFFRACTOGRAMS GIVEN BY I-M SYSTEMS WITH S = 2 AND W; W M 325 9.3.3
SPECIFIC FEATURES OF THE X-RAY DIFFRACTOGRAMS FROM INTERSTRATIFIED I-M
STRUCTURES WITH S = 3 330 9.3.4 COMPARISON OF THE SPECIFIC FEATURES OF
THE DIAGRAMS GIVEN BY SYSTEMS WITH S = 0, 1, 2, 3 331 9.4 PARAMETERS
OTHER THAN W AND S WHICH INFLUENCE THE PROFILE OF THE CALCULATED X-RAY
DIAGRAMS OF TWO-COMPONENT INTERSTRATIFIED SYSTEMS 332 9.4.1 INFLUENCE OF
THE THICKNESS OF THE SCATTERING UNITS 332 9.4.2 INFLUENCE OF THE
THICKNESS OF THE INTERFERENTIAL COHERENCE DOMAINS 333 9.4.3 PHYSICAL
MIXTURES OF QUASI-HOMOGENEOUS MIXED-LAYER SYSTEMS . 335 9.4.4
HOMOGENEOUS MIXED-LAYER MODELS 341 9.5 QUANTITATIVE DETERMINATION OF THE
STRUCTURAL CHARACTERISTICS OF INTERSTRATIFIED DIOCTAHEDRAL MICA-SMECTITE
MINERALS .. 341 9.5.1 TWO-COMPONENT INTERSTRATIFIED MINERALS:
CELADONITE-NONTRONITE .. 343 9.5.2 THREE-COMPONENT INTERSTRATIFIED
MINERALS: LEUCOPHYLLITE-MONTMORILLONITE- VERMICULITE WITH S=L 344 9.5.3
TWO-COMPONENT INTERSTRATIFIED MINERALS: LEUCOPHYLLITE-MONTMORILLONITE,
WITH S = 3 346 9.6 SEMI-QUANTITATIVE DETERMINATIONS OF THE STRUCTURAL
CHARACTERISTICS OF INTERSTRATIFIED MINERALS 346 9.6.1 TWO-COMPONENT
INTERSTRATIFIED MINERALS: ILLITE-MONTMORILLONITE .. 347 9.6.2
INTERSTRATIFIED MINERALS WITH KAOLINITE 1:1 LAYERS 348 9.6.3 STUDY OF
HYDRATED TALCS 355 REFERENCES 358 AUTHOR INDEX 361 SUBJECT INDEX 365
|
| any_adam_object | 1 |
| author | Dric, Viktor A. Tchoubar, Cyril |
| author_facet | Dric, Viktor A. Tchoubar, Cyril |
| author_role | aut aut |
| author_sort | Dric, Viktor A. |
| author_variant | v a d va vad c t ct |
| building | Verbundindex |
| bvnumber | BV009001082 |
| classification_rvk | UQ 5600 |
| classification_tum | PHY 614f PHY 606f |
| ctrlnum | (OCoLC)246771079 (DE-599)BVBBV009001082 |
| dewey-full | 548/.83 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548/.83 |
| dewey-search | 548/.83 |
| dewey-sort | 3548 283 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV009001082 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:28:19Z |
| institution | BVB |
| isbn | 3540512225 0387512225 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005949143 |
| oclc_num | 246771079 |
| open_access_boolean | |
| owner | DE-29 DE-91 DE-BY-TUM DE-384 DE-703 DE-83 DE-188 |
| owner_facet | DE-29 DE-91 DE-BY-TUM DE-384 DE-703 DE-83 DE-188 |
| physical | XVII, 371 S. graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Springer |
| record_format | marc |
| spelling | Dric, Viktor A. Verfasser aut X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Victor A. Drits ; Cyril Tchoubar Berlin u.a. Springer 1990 XVII, 371 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Aus dem Franz. übers. Mikrokristall - Schichtgitter - Gitterbaufehler - Röntgenstrukturanalyse Schichtgitter (DE-588)4124130-7 gnd rswk-swf Geschichtetes Medium (DE-588)4232784-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Röntgenbeugung (DE-588)4178306-2 gnd rswk-swf Mikrokristall (DE-588)4169828-9 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Mikrokristall (DE-588)4169828-9 s Schichtgitter (DE-588)4124130-7 s Gitterbaufehler (DE-588)4125030-8 s Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Geschichtetes Medium (DE-588)4232784-2 s Röntgenbeugung (DE-588)4178306-2 s Tchoubar, Cyril Verfasser aut HEBIS Datenaustausch Darmstadt application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005949143&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Dric, Viktor A. Tchoubar, Cyril X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Mikrokristall - Schichtgitter - Gitterbaufehler - Röntgenstrukturanalyse Schichtgitter (DE-588)4124130-7 gnd Geschichtetes Medium (DE-588)4232784-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd Röntgenbeugung (DE-588)4178306-2 gnd Mikrokristall (DE-588)4169828-9 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd |
| subject_GND | (DE-588)4124130-7 (DE-588)4232784-2 (DE-588)4125030-8 (DE-588)4178306-2 (DE-588)4169828-9 (DE-588)4137203-7 |
| title | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons |
| title_auth | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons |
| title_exact_search | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons |
| title_full | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Victor A. Drits ; Cyril Tchoubar |
| title_fullStr | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Victor A. Drits ; Cyril Tchoubar |
| title_full_unstemmed | X-ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons Victor A. Drits ; Cyril Tchoubar |
| title_short | X-ray diffraction by disordered lamellar structures |
| title_sort | x ray diffraction by disordered lamellar structures theory and applications to microdivided silicates and carbons |
| title_sub | theory and applications to microdivided silicates and carbons |
| topic | Mikrokristall - Schichtgitter - Gitterbaufehler - Röntgenstrukturanalyse Schichtgitter (DE-588)4124130-7 gnd Geschichtetes Medium (DE-588)4232784-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd Röntgenbeugung (DE-588)4178306-2 gnd Mikrokristall (DE-588)4169828-9 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd |
| topic_facet | Mikrokristall - Schichtgitter - Gitterbaufehler - Röntgenstrukturanalyse Schichtgitter Geschichtetes Medium Gitterbaufehler Röntgenbeugung Mikrokristall Röntgenstrukturanalyse |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005949143&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT dricviktora xraydiffractionbydisorderedlamellarstructurestheoryandapplicationstomicrodividedsilicatesandcarbons AT tchoubarcyril xraydiffractionbydisorderedlamellarstructurestheoryandapplicationstomicrodividedsilicatesandcarbons |