Test generation techniques for sequential circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Essen
1991
|
| Schriftenreihe: | Forschungsverbund Anwendungen der KI in NRW: KI NRW
91,28 |
| Beschreibung: | 6 S. |
Internformat
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| 100 | 1 | |a Gouders, Nikolaus |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Test generation techniques for sequential circuits |c Nikolaus Gouders ; Reinhard Kaibel |
| 264 | 1 | |a Essen |c 1991 | |
| 300 | |a 6 S. | ||
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| 490 | 1 | |a Forschungsverbund Anwendungen der KI in NRW: KI NRW |v 91,28 | |
| 700 | 1 | |a Kaibel, Reinhard |e Verfasser |4 aut | |
| 830 | 0 | |a Forschungsverbund Anwendungen der KI in NRW: KI NRW |v 91,28 |w (DE-604)BV008906635 |9 91,28 | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Gouders, Nikolaus Kaibel, Reinhard |
| author_facet | Gouders, Nikolaus Kaibel, Reinhard |
| author_role | aut aut |
| author_sort | Gouders, Nikolaus |
| author_variant | n g ng r k rk |
| building | Verbundindex |
| bvnumber | BV008980052 |
| ctrlnum | (OCoLC)632859920 (DE-599)BVBBV008980052 |
| format | Book |
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| id | DE-604.BV008980052 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:27:52Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005930667 |
| oclc_num | 632859920 |
| open_access_boolean | |
| physical | 6 S. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| record_format | marc |
| series | Forschungsverbund Anwendungen der KI in NRW: KI NRW |
| series2 | Forschungsverbund Anwendungen der KI in NRW: KI NRW |
| spelling | Gouders, Nikolaus Verfasser aut Test generation techniques for sequential circuits Nikolaus Gouders ; Reinhard Kaibel Essen 1991 6 S. txt rdacontent n rdamedia nc rdacarrier Forschungsverbund Anwendungen der KI in NRW: KI NRW 91,28 Kaibel, Reinhard Verfasser aut Forschungsverbund Anwendungen der KI in NRW: KI NRW 91,28 (DE-604)BV008906635 91,28 |
| spellingShingle | Gouders, Nikolaus Kaibel, Reinhard Test generation techniques for sequential circuits Forschungsverbund Anwendungen der KI in NRW: KI NRW |
| title | Test generation techniques for sequential circuits |
| title_auth | Test generation techniques for sequential circuits |
| title_exact_search | Test generation techniques for sequential circuits |
| title_full | Test generation techniques for sequential circuits Nikolaus Gouders ; Reinhard Kaibel |
| title_fullStr | Test generation techniques for sequential circuits Nikolaus Gouders ; Reinhard Kaibel |
| title_full_unstemmed | Test generation techniques for sequential circuits Nikolaus Gouders ; Reinhard Kaibel |
| title_short | Test generation techniques for sequential circuits |
| title_sort | test generation techniques for sequential circuits |
| volume_link | (DE-604)BV008906635 |
| work_keys_str_mv | AT goudersnikolaus testgenerationtechniquesforsequentialcircuits AT kaibelreinhard testgenerationtechniquesforsequentialcircuits |